Jeffrey C. Kalb Jr.

Person

Phoenix, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Termination circuits and methods for bused and networked devices
- Patent number 6,307,395
- Issue date Oct 23, 2001
- California Micro Devices Corporation
- Jeffrey C. Kalb
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated circuit structures and methods to facilitate accurate me...
- Patent number 6,262,434
- Issue date Jul 17, 2001
- California Micro Devices Corporation
- Jeffrey C. Kalb
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Background leakage zeroing by temperature and voltage dependence fo...
- Patent number 6,242,934
- Issue date Jun 5, 2001
- Intel Corporation
- Jeffrey C. Kalb
- G01 - MEASURING TESTING
Information Patent Grant
Integrated RC filters
- Patent number 6,121,669
- Issue date Sep 19, 2000
- California Micro Devices Corporation
- Jeffrey Clifford Kalb
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
UV methods for screening open circuit defects in CMOS integrated ci...
- Patent number 6,107,817
- Issue date Aug 22, 2000
- Intel Corporation
- Jeffrey C. Kalb
- G11 - INFORMATION STORAGE
Information Patent Grant
Termination circuits and methods for memory buses and devices
- Patent number 6,100,713
- Issue date Aug 8, 2000
- California Micro Devices Corporation
- Jeffrey C. Kalb
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Termination circuits and methods therefor
- Patent number 6,008,665
- Issue date Dec 28, 1999
- California Micro Devices Corporation
- Jeffrey C. Kalb
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
UV methods for screening open circuit defects in CMOS integrated ci...
- Patent number 5,986,461
- Issue date Nov 16, 1999
- Intel Corporation
- Jeffrey C. Kalb
- G11 - INFORMATION STORAGE
Information Patent Grant
Leakage tracking device sample for IDDQ measurement and defect reso...
- Patent number 5,889,409
- Issue date Mar 30, 1999
- Intel Corporation
- Jeffrey C. Kalb
- G01 - MEASURING TESTING
Information Patent Grant
Defect insertion testability mode for IDDQ testing methods
- Patent number 5,869,977
- Issue date Feb 9, 1999
- Intel Corporation
- Jeffrey C. Kalb
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus with cascode biasing magneto field effect tran...
- Patent number 5,801,533
- Issue date Sep 1, 1998
- Intel Corporation
- Jeffrey C. Kalb
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus coupling together magneto field effect transis...
- Patent number 5,760,581
- Issue date Jun 2, 1998
- Intel Corporation
- Jeffrey C. Kalb
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for improving frequency response of integrate...
- Patent number 5,760,662
- Issue date Jun 2, 1998
- California Micro Devices Corporation
- Jeffrey Clifford Kalb
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Triple drain magneto field effect transistor with high conductivity...
- Patent number 5,757,055
- Issue date May 26, 1998
- Intel Corporation
- Jeffrey C. Kalb
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a semiconductor device by measuring quiescent cu...
- Patent number 5,742,177
- Issue date Apr 21, 1998
- Intel Corporation
- Jeffrey C. Kalb
- G01 - MEASURING TESTING
Information Patent Grant
ESD-protected thin film capacitor structures
- Patent number 5,706,163
- Issue date Jan 6, 1998
- California Micro Devices Corporation
- Jeffrey Clifford Kalb
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated resistor networks having reduced cross talk
- Patent number 5,652,460
- Issue date Jul 29, 1997
- California Micro Devices Corporation
- Jeffrey Clifford Kalb
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sense amplifier circuitry for differential semiconductor memories
- Patent number 5,627,789
- Issue date May 6, 1997
- Intel Corporation
- Jeffrey C. Kalb
- G11 - INFORMATION STORAGE

Jeffrey C. Kalb Jr.

Person

Patents Grantslast 30 patents

Termination circuits and methods for bused and networked devices

Integrated circuit structures and methods to facilitate accurate me...

Background leakage zeroing by temperature and voltage dependence fo...

Integrated RC filters

UV methods for screening open circuit defects in CMOS integrated ci...

Termination circuits and methods for memory buses and devices

Termination circuits and methods therefor

UV methods for screening open circuit defects in CMOS integrated ci...

Leakage tracking device sample for IDDQ measurement and defect reso...

Defect insertion testability mode for IDDQ testing methods

Method and apparatus with cascode biasing magneto field effect tran...

Method and apparatus coupling together magneto field effect transis...

Methods and apparatus for improving frequency response of integrate...

Triple drain magneto field effect transistor with high conductivity...

Method for testing a semiconductor device by measuring quiescent cu...

ESD-protected thin film capacitor structures

Integrated resistor networks having reduced cross talk

Sense amplifier circuitry for differential semiconductor memories