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Jeffrey M. Denker
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Woburn, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and systems for synchronizing backscatter signals and wirel...
Patent number
11,726,218
Issue date
Aug 15, 2023
American Science arid Engineering, Inc.
Aaron Judy Couture
G01 - MEASURING TESTING
Information
Patent Grant
Handheld backscatter imaging systems with primary and secondary det...
Patent number
11,579,327
Issue date
Feb 14, 2023
American Science and Engineering, Inc.
Aaron J. Couture
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wavelength-shifting sheet-coupled scintillation detectors
Patent number
11,525,930
Issue date
Dec 13, 2022
American Science and Engineering, Inc.
Aaron J. Couture
G01 - MEASURING TESTING
Information
Patent Grant
Wireless transmission detector panel for an X-ray scanner
Patent number
11,340,361
Issue date
May 24, 2022
American Science and Engineering, Inc.
Aaron Judy Couture
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength-shifting sheet-coupled scintillation detectors
Patent number
10,830,911
Issue date
Nov 10, 2020
American Science and Engineering, Inc.
Aaron J. Couture
G01 - MEASURING TESTING
Information
Patent Grant
Spectral discrimination using wavelength-shifting fiber-coupled sci...
Patent number
10,670,740
Issue date
Jun 2, 2020
American Science and Engineering, Inc.
Aaron J. Couture
G01 - MEASURING TESTING
Information
Patent Grant
Hand-held X-ray detection system using wavelength-shifting fiber-co...
Patent number
10,209,372
Issue date
Feb 19, 2019
American Science and Engineering, Inc.
Anatoli Arodzero
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Convertible scan panel for x-ray inspection
Patent number
9,146,201
Issue date
Sep 29, 2015
American Science and Engineering, Inc.
Jeffrey Schubert
G01 - MEASURING TESTING
Information
Patent Grant
Methods for high energy X-ray imaging using remotely-aligned arcuat...
Patent number
8,690,427
Issue date
Apr 8, 2014
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Grant
Remotely-aligned arcuate detector array for high energy X-ray imaging
Patent number
8,439,565
Issue date
May 14, 2013
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Grant
Reticle storage and retrieval system
Patent number
6,562,094
Issue date
May 13, 2003
PRI Automation, Inc.
Jeffrey M. Denker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated door assembly for use in semiconductor wafer manufacturing
Patent number
6,447,233
Issue date
Sep 10, 2002
PRI Automation, Inc.
Jeffrey M. Denker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated door assembly for use in semiconductor wafer manufacturing
Patent number
6,106,213
Issue date
Aug 22, 2000
PRI Automation, Inc.
Jeffrey M. Denker
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Handheld Backscatter Scanning Systems With Different Detector Panel...
Publication number
20230221457
Publication date
Jul 13, 2023
American Science and Engineering, Inc.
Aaron J. Couture
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Wavelength-Shifting Sheet-Coupled Scintillation Detectors
Publication number
20230152475
Publication date
May 18, 2023
American Science and Engineering, Inc.
Aaron J. Couture
G01 - MEASURING TESTING
Information
Patent Application
Wireless Transmission Detector Panel for an X-Ray Scanner
Publication number
20220334270
Publication date
Oct 20, 2022
American Science and Engineering, Inc.
Aaron Judy Couture
G01 - MEASURING TESTING
Information
Patent Application
WIRELESS TRANSMISSION DETECTOR PANEL FOR AN X-RAY SCANNER
Publication number
20220163683
Publication date
May 26, 2022
American Science and Engineering, Inc.
Aaron Judy Couture
G01 - MEASURING TESTING
Information
Patent Application
Handheld Backscatter Scanning Systems With Different Detector Panel...
Publication number
20210132239
Publication date
May 6, 2021
American Science and Engineering, Inc.
Aaron J. Couture
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Wavelength-Shifting Sheet-Coupled Scintillation Detectors
Publication number
20210124063
Publication date
Apr 29, 2021
American Science and Engineering, Inc.
Aaron J. Couture
G01 - MEASURING TESTING
Information
Patent Application
Spectral Discrimination Using Wavelength-Shifting Fiber-Coupled Sci...
Publication number
20200326436
Publication date
Oct 15, 2020
American Science and Engineering, Inc.
Aaron J. Couture
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Wavelength-Shifting Sheet-Coupled Scintillation Detectors
Publication number
20190391280
Publication date
Dec 26, 2019
American Science and Engineering, Inc.
Aaron J. Couture
G01 - MEASURING TESTING
Information
Patent Application
Spectral Discrimination using Wavelength-Shifting Fiber-Coupled Sci...
Publication number
20190383953
Publication date
Dec 19, 2019
American Science and Engineering, Inc.
Anatoli Arodzero
G01 - MEASURING TESTING
Information
Patent Application
Spectral Discrimination Using Wavelength-Shifting Fiber-Coupled Sci...
Publication number
20190293810
Publication date
Sep 26, 2019
American Science and Engineering, Inc.
Aaron J. Couture
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods for High Energy X-ray Imaging Using Remotely-Aligned Arcuat...
Publication number
20130230140
Publication date
Sep 5, 2013
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Application
Convertible Scan Panel for X-Ray Inspection
Publication number
20130202089
Publication date
Aug 8, 2013
American Science and Engineering, Inc.
Jeffrey Schubert
G01 - MEASURING TESTING
Information
Patent Application
Remotely-Aligned Arcuate Detector Array for High Energy X-ray Imaging
Publication number
20120093288
Publication date
Apr 19, 2012
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Application
Reticle storage and retrieval system
Publication number
20020062633
Publication date
May 30, 2002
PRI AUTOMATION, INC.
Jeffrey M. Denker
H01 - BASIC ELECTRIC ELEMENTS