Jerome B. Lasky

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Prevention of backside cracks in semiconductor chips or wafers usin...
- Patent number 7,989,358
- Issue date Aug 2, 2011
- International Business Machines Corporation
- Timothy H. Daubenspeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cobal disilicide structure
- Patent number 7,696,586
- Issue date Apr 13, 2010
- International Business Machines Corporation
- David Paul Agnello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deep trench contact and isolation of buried photodetectors
- Patent number 7,652,313
- Issue date Jan 26, 2010
- International Business Machines Corporation
- John J. Ellis-Monaghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Recessed gate for a CMOS image sensor
- Patent number 7,572,701
- Issue date Aug 11, 2009
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure and method for detecting and studying crystal lattic...
- Patent number 7,495,254
- Issue date Feb 24, 2009
- International Business Machines Corporation
- Jonathan R. Fales
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS sensors having charge pushing regions
- Patent number 7,492,048
- Issue date Feb 17, 2009
- International Business Machines Corporation
- James William Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming pixel sensor cell having reduced pinning layer ba...
- Patent number 7,459,360
- Issue date Dec 2, 2008
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cobalt disilicide structure
- Patent number 7,411,258
- Issue date Aug 12, 2008
- International Business Machines Corporation
- David Paul Agnello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Prevention of backside cracks in semiconductor chips or wafers usin...
- Patent number 7,405,139
- Issue date Jul 29, 2008
- International Business Machines Corporation
- Timothy H. Daubenspeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Recessed gate for an image sensor
- Patent number 7,217,968
- Issue date May 15, 2007
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pixel sensor cell having reduced pinning layer barrier potential an...
- Patent number 7,205,591
- Issue date Apr 17, 2007
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Disposable spacer for symmetric and asymmetric Schottky contact to...
- Patent number 7,183,573
- Issue date Feb 27, 2007
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FIN field effect transistor with self-aligned gate
- Patent number 7,173,303
- Issue date Feb 6, 2007
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated cobalt silicide process for semiconductor devices
- Patent number 6,793,735
- Issue date Sep 21, 2004
- International Business Machines Corporation
- Marc W. Cantell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power distribution design method for stacked flip-chip packages
- Patent number 6,727,118
- Issue date Apr 27, 2004
- International Business Machines Corporation
- Jerome B. Lasky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistor with self-aligned gate
- Patent number 6,689,650
- Issue date Feb 10, 2004
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double planar gated SOI MOSFET structure
- Patent number 6,660,596
- Issue date Dec 9, 2003
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor temperature monitor
- Patent number 6,638,629
- Issue date Oct 28, 2003
- International Business Machines Corporation
- Donna K. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power distribution design method for stacked flip-chip packages
- Patent number 6,635,970
- Issue date Oct 21, 2003
- International Business Machines Corporation
- Jerome B. Lasky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for limiting divot formation in post shallow trench isolatio...
- Patent number 6,541,351
- Issue date Apr 1, 2003
- International Business Machines Corporation
- Peter H. Bartlau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double planar gated SOI MOSFET structure
- Patent number 6,483,156
- Issue date Nov 19, 2002
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor temperature monitor
- Patent number 6,472,232
- Issue date Oct 29, 2002
- International Business Machines Corporation
- Donna K. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for creating high density buried contact for u...
- Patent number 6,436,744
- Issue date Aug 20, 2002
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Disposable spacer for symmetric and asymmetric Schottky contact to...
- Patent number 6,339,005
- Issue date Jan 15, 2002
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wet cleans for cobalt disilicide processing
- Patent number 6,335,294
- Issue date Jan 1, 2002
- International Business Machines Corporation
- David Paul Agnello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buried butted contact and method for fabricating
- Patent number 6,335,272
- Issue date Jan 1, 2002
- International Business Machines Corporation
- Archibald Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of controlling stress in a film
- Patent number 6,328,794
- Issue date Dec 11, 2001
- International Business Machines Corporation
- Donald Walter Brouillette
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Plasma etch pre-silicide clean
- Patent number 6,255,179
- Issue date Jul 3, 2001
- International Business Machines Corporation
- Marc W. Cantell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming planar isolation and substrate contacts in SIMOX-...
- Patent number 6,197,656
- Issue date Mar 6, 2001
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated cobalt silicide process for semiconductor devices
- Patent number 6,184,132
- Issue date Feb 6, 2001
- International Business Machines Corporation
- Marc W. Cantell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
COBALT DISILICIDE STRUCTURE
- Publication number 20080296706
- Publication date Dec 4, 2008
- David Paul Agnello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREVENTION OF BACKSIDE CRACKS IN SEMICONDUCTOR CHIPS OR WAFERS USIN...
- Publication number 20080191322
- Publication date Aug 14, 2008
- International Business Machines Corporation
- Timothy H. Daubenspeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREVENTION OF BACKSIDE CRACKS IN SEMICONDUCTOR CHIPS OR WAFERS USIN...
- Publication number 20080122037
- Publication date May 29, 2008
- Timothy H. Daubenspeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECESSED GATE FOR A CMOS IMAGE SENSOR
- Publication number 20070184614
- Publication date Aug 9, 2007
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS SENSORS HAVING CHARGE PUSHING REGIONS
- Publication number 20070158711
- Publication date Jul 12, 2007
- James William Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIXEL SENSOR CELL HAVING REDUCED PINNING LAYER BARRIER POTENTIAL AN...
- Publication number 20070145438
- Publication date Jun 28, 2007
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEEP TRENCH CONTACT AND ISOLATION OF BURIED PHOTODETECTORS
- Publication number 20070102740
- Publication date May 10, 2007
- International Business Machines Corporation
- John J. Ellis-Monaghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE AND METHOD FOR DETECTING AND STUDYING CRYSTAL LATTIC...
- Publication number 20070051948
- Publication date Mar 8, 2007
- International Business Machines Corporation
- Jonathan R. Fales
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIXEL SENSOR CELL HAVING REDUCED PINNING LAYER BARRIER POTENTIAL AN...
- Publication number 20060226456
- Publication date Oct 12, 2006
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECESSED GATE FOR AN IMAGE SENSOR
- Publication number 20060124976
- Publication date Jun 15, 2006
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN field effect transistor with self-aligned gate
- Publication number 20040092060
- Publication date May 13, 2004
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Power distribution design method for stacked flip-chip packages
- Publication number 20030209809
- Publication date Nov 13, 2003
- Jerome B. Lasky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER DISTRIBUTION DESIGN METHOD FOR STACKED FLIP-CHIP PACKAGES
- Publication number 20030146517
- Publication date Aug 7, 2003
- International Business Machines Corporation
- Jerome B. Lasky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Silicon-on-insulator SRAM cells with increased stability and yield
- Publication number 20030058675
- Publication date Mar 27, 2003
- International Business Machines Corporation
- Anthony Gus Aipperspach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fin field effect transistor with self-aligned gate
- Publication number 20030057486
- Publication date Mar 27, 2003
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor temperature monitor
- Publication number 20020176998
- Publication date Nov 28, 2002
- Donna K. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Double planar gated SOI MOSFET structure
- Publication number 20020153587
- Publication date Oct 24, 2002
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI devices with integrated gettering structure
- Publication number 20020140030
- Publication date Oct 3, 2002
- Jack A. Mandelman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Disposable spacer for symmetric and asymmetric schottky contact to...
- Publication number 20020048841
- Publication date Apr 25, 2002
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wet cleans for cobalt disilicide processing
- Publication number 20020004303
- Publication date Jan 10, 2002
- David Paul Agnello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated cobalt silicide process for semiconductor devices
- Publication number 20010001298
- Publication date May 17, 2001
- International Business Machines Corporation
- Marc W. Cantell
- H01 - BASIC ELECTRIC ELEMENTS

Jerome B. Lasky

Person

Patents Grantslast 30 patents

Prevention of backside cracks in semiconductor chips or wafers usin...

Cobal disilicide structure

Deep trench contact and isolation of buried photodetectors

Recessed gate for a CMOS image sensor

Test structure and method for detecting and studying crystal lattic...

CMOS sensors having charge pushing regions

Method of forming pixel sensor cell having reduced pinning layer ba...

Cobalt disilicide structure

Prevention of backside cracks in semiconductor chips or wafers usin...

Recessed gate for an image sensor

Pixel sensor cell having reduced pinning layer barrier potential an...

Disposable spacer for symmetric and asymmetric Schottky contact to...

FIN field effect transistor with self-aligned gate

Integrated cobalt silicide process for semiconductor devices

Power distribution design method for stacked flip-chip packages

Fin field effect transistor with self-aligned gate

Double planar gated SOI MOSFET structure

Semiconductor temperature monitor

Power distribution design method for stacked flip-chip packages

Method for limiting divot formation in post shallow trench isolatio...

Double planar gated SOI MOSFET structure

Semiconductor temperature monitor

Method and structure for creating high density buried contact for u...

Disposable spacer for symmetric and asymmetric Schottky contact to...

Wet cleans for cobalt disilicide processing

Buried butted contact and method for fabricating

Method of controlling stress in a film

Plasma etch pre-silicide clean

Method of forming planar isolation and substrate contacts in SIMOX-...

Integrated cobalt silicide process for semiconductor devices

Patents Applicationslast 30 patents

COBALT DISILICIDE STRUCTURE

PREVENTION OF BACKSIDE CRACKS IN SEMICONDUCTOR CHIPS OR WAFERS USIN...

PREVENTION OF BACKSIDE CRACKS IN SEMICONDUCTOR CHIPS OR WAFERS USIN...

RECESSED GATE FOR A CMOS IMAGE SENSOR

CMOS SENSORS HAVING CHARGE PUSHING REGIONS

PIXEL SENSOR CELL HAVING REDUCED PINNING LAYER BARRIER POTENTIAL AN...

DEEP TRENCH CONTACT AND ISOLATION OF BURIED PHOTODETECTORS

TEST STRUCTURE AND METHOD FOR DETECTING AND STUDYING CRYSTAL LATTIC...

PIXEL SENSOR CELL HAVING REDUCED PINNING LAYER BARRIER POTENTIAL AN...

RECESSED GATE FOR AN IMAGE SENSOR

FIN field effect transistor with self-aligned gate

Power distribution design method for stacked flip-chip packages

POWER DISTRIBUTION DESIGN METHOD FOR STACKED FLIP-CHIP PACKAGES

Silicon-on-insulator SRAM cells with increased stability and yield

Fin field effect transistor with self-aligned gate

Semiconductor temperature monitor

Double planar gated SOI MOSFET structure

SOI devices with integrated gettering structure

Disposable spacer for symmetric and asymmetric schottky contact to...

Wet cleans for cobalt disilicide processing

Integrated cobalt silicide process for semiconductor devices