Jerry Broz

Person

Longmont, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Pick and place machine cleaning system and method
- Patent number 11,756,811
- Issue date Sep 12, 2023
- INTERNATIONAL TEST SOLUTIONS, LLC
- Alan E. Humphrey
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
System and method for cleaning wire bonding machines using function...
- Patent number 11,318,550
- Issue date May 3, 2022
- INTERNATIONAL TEST SOLUTIONS, LLC
- Alan E. Humphrey
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for cleaning contact elements and support hardwar...
- Patent number 11,211,242
- Issue date Dec 28, 2021
- INTERNATIONAL TEST SOLUTIONS, LLC
- Alan E. Humphrey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for thermal stabilization of probe elements using...
- Patent number 11,035,898
- Issue date Jun 15, 2021
- International Test Solutions, Inc.
- Alan E. Humphrey
- G01 - MEASURING TESTING
Information Patent Grant
Wafer manufacturing cleaning apparatus, process and method of use
- Patent number 10,896,828
- Issue date Jan 19, 2021
- International Test Solutions, Inc.
- Alan E. Humphrey
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Pick and place machine cleaning system and method
- Patent number 10,792,713
- Issue date Oct 6, 2020
- International Test Solutions, Inc.
- Alan E. Humphrey
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Wafer manufacturing cleaning apparatus, process and method of use
- Patent number 10,741,420
- Issue date Aug 11, 2020
- International Test Solutions, Inc.
- Alan E. Humphrey
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Working surface cleaning system and method
- Patent number 10,406,568
- Issue date Sep 10, 2019
- International Test Solutions, Inc.
- Alan Humphrey
- G01 - MEASURING TESTING
Information Patent Grant
Working surface cleaning system and method
- Patent number 10,239,099
- Issue date Mar 26, 2019
- International Test Solutions, Inc.
- Alan Eugene Humphrey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses, device, and methods for cleaning tester interface cont...
- Patent number 10,195,648
- Issue date Feb 5, 2019
- International Test Solutions, Inc.
- Jerry J. Broz
- B24 - GRINDING POLISHING
Information Patent Grant
Wafer manufacturing cleaning apparatus, process and method of use
- Patent number 10,109,504
- Issue date Oct 23, 2018
- International Test Solutions, Inc.
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Grant
Wafer manufacturing cleaning apparatus, process and method of use
- Patent number 10,002,776
- Issue date Jun 19, 2018
- International Test Solutions, Inc.
- Alan E. Humphrey
- B24 - GRINDING POLISHING
Information Patent Grant
Working surface cleaning system and method
- Patent number 9,833,818
- Issue date Dec 5, 2017
- International Test Solutions, Inc.
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Grant
Wafer manufacturing cleaning apparatus, process and method of use
- Patent number 9,595,456
- Issue date Mar 14, 2017
- International Test Solutions, Inc.
- Alan E. Humphrey
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatuses, device, and methods for cleaning tester interface cont...
- Patent number 8,801,869
- Issue date Aug 12, 2014
- International Test Solutions, Inc.
- Jerry J. Broz
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatuses, device, and methods for cleaning tester interface cont...
- Patent number 8,790,466
- Issue date Jul 29, 2014
- International Test Solutions, Inc.
- Alan E. Humphrey
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatuses, device, and methods for cleaning tester interface cont...
- Patent number 8,371,316
- Issue date Feb 12, 2013
- International Test Solutions, Inc.
- Alan E. Humphrey
- B24 - GRINDING POLISHING
Information Patent Grant
Cleaning system, device and method
- Patent number 7,202,683
- Issue date Apr 10, 2007
- International Test Solutions
- Gene Humphrey
- B08 - CLEANING
Information Patent Grant
Multiple contact vertical probe solution enabling Kelvin connection...
- Patent number 6,911,834
- Issue date Jun 28, 2005
- Texas Instruments Incorporated
- Scott W. Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
High density, area array probe card apparatus
- Patent number 6,906,539
- Issue date Jun 14, 2005
- Texas Instruments Incorporated
- Lester Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Combined electrical test and mechanical test system for thin film c...
- Patent number 6,752,012
- Issue date Jun 22, 2004
- Texas Instruments Incorporated
- Jerry J. Broz
- G01 - MEASURING TESTING
Information Patent Grant
High density probe card apparatus and method of manufacture
- Patent number 6,720,780
- Issue date Apr 13, 2004
- Texas Instruments Incorporated
- Reynaldo M. Rincon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR CLEANING CONTACT ELEMENTS AND SUPPORT HARDWAR...
- Publication number 20220093394
- Publication date Mar 24, 2022
- INTERNATIONAL TEST SOLUTIONS, LLC
- Alan E. Humphrey
- B24 - GRINDING POLISHING
Information Patent Application
SYSTEM AND METHOD FOR CLEANING WIRE BONDING MACHINES USING FUNCTION...
- Publication number 20210146464
- Publication date May 20, 2021
- International Test Solutions, Inc.
- Alan E. Humphrey
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM AND METHOD FOR CLEANING CONTACT ELEMENTS AND SUPPORT HARDWAR...
- Publication number 20210151317
- Publication date May 20, 2021
- INTERNATIONAL TEST SOLUTIONS
- Alan E. Humphrey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PICK AND PLACE MACHINE CLEANING SYSTEM AND METHOD
- Publication number 20210005483
- Publication date Jan 7, 2021
- International Test Solutions, Inc.
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Application
PICK AND PLACE MACHINE CLEANING SYSTEM AND METHOD
- Publication number 20210005484
- Publication date Jan 7, 2021
- International Test Solutions, Inc.
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Application
PICK AND PLACE MACHINE CLEANING SYSTEM AND METHOD
- Publication number 20210001378
- Publication date Jan 7, 2021
- International Test Solutions, Inc.
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Application
PICK AND PLACE MACHINE CLEANING SYSTEM AND METHOD
- Publication number 20210005499
- Publication date Jan 7, 2021
- International Test Solutions, Inc.
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Application
Wafer Manufacturing Cleaning Apparatus, Process And Method Of Use
- Publication number 20200303217
- Publication date Sep 24, 2020
- International Test Solutions, Inc.
- Alan E. Humphrey
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONT...
- Publication number 20200200800
- Publication date Jun 25, 2020
- INTERNATIONAL TEST SOLUTIONS
- Jerry J. Broz
- B08 - CLEANING
Information Patent Application
WORKING SURFACE CLEANING SYSTEM AND METHOD
- Publication number 20190201944
- Publication date Jul 4, 2019
- International Test Solutions, Inc.
- Alan Eugene Humphrey
- B08 - CLEANING
Information Patent Application
Wafer Manufacturing Cleaning Apparatus, Process And Method Of Use
- Publication number 20190019694
- Publication date Jan 17, 2019
- International Test Solutions, Inc.
- Alan E. Humphrey
- B24 - GRINDING POLISHING
Information Patent Application
WORKING SURFACE CLEANING SYSTEM AND METHOD
- Publication number 20180071798
- Publication date Mar 15, 2018
- International Test Solutions, Inc.
- Alan Eugene Humphrey
- B08 - CLEANING
Information Patent Application
Wafer Manufacturing Cleaning Apparatus, Process And Method Of Use
- Publication number 20170136500
- Publication date May 18, 2017
- International Test Solutions, Inc.
- Alan E. Humphrey
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
WORKING SURFACE CLEANING SYSTEM AND METHOD
- Publication number 20140338698
- Publication date Nov 20, 2014
- International Test Solutions, Inc.
- Alan Eugene Humphrey
- B08 - CLEANING
Information Patent Application
APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONT...
- Publication number 20140331421
- Publication date Nov 13, 2014
- International Test Solutions, Inc.
- Jerry J. Broz
- B08 - CLEANING
Information Patent Application
WAFER MANUFACTURING CLEANING APPARATUS, PROCESS AND METHOD OF USE
- Publication number 20130333128
- Publication date Dec 19, 2013
- International Test Solutions, Inc.
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Application
WAFER MANUFACTURING CLEANING APPARATUS, PROCESS AND METHOD OF USE
- Publication number 20130198982
- Publication date Aug 8, 2013
- International Test Solutions, Inc.
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Application
APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONT...
- Publication number 20120048298
- Publication date Mar 1, 2012
- International Test Solutions, Inc.
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Application
APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONT...
- Publication number 20120042463
- Publication date Feb 23, 2012
- International Test Solutions, Inc.
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Application
APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONT...
- Publication number 20110132396
- Publication date Jun 9, 2011
- International Test Solutions, Inc.
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Application
WAFER MANUFACTURING CLEANING APPARATUS, PROCESS AND METHOD OF USE
- Publication number 20100258144
- Publication date Oct 14, 2010
- INTERNATIONAL TEST SOLUTIONS
- Jerry J. Broz
- B08 - CLEANING
Information Patent Application
Test Cell Conditioner (TCC) Surrogate Cleaning Device
- Publication number 20100132736
- Publication date Jun 3, 2010
- Jtron Technology Corporation
- Yih-Min LIN
- B08 - CLEANING
Information Patent Application
Working surface cleaning system and method
- Publication number 20060065290
- Publication date Mar 30, 2006
- Jerry Broz
- B08 - CLEANING
Information Patent Application
Substrate protection system, device and method
- Publication number 20050196900
- Publication date Sep 8, 2005
- Alan E. Humphrey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High density, area array probe card apparatus
- Publication number 20050140382
- Publication date Jun 30, 2005
- Lester Wilson
- G01 - MEASURING TESTING
Information Patent Application
Cleaning system, device and method
- Publication number 20050001645
- Publication date Jan 6, 2005
- Alan E. Humphrey
- B08 - CLEANING
Information Patent Application
High density probe card apparatus and method of manufacture
- Publication number 20040169521
- Publication date Sep 2, 2004
- Reynaldo M. Rincon
- G01 - MEASURING TESTING
Information Patent Application
Method of improving contact resistance
- Publication number 20040115934
- Publication date Jun 17, 2004
- Jerry Broz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Combined electrical test and mechanical test system for thin film c...
- Publication number 20030140684
- Publication date Jul 31, 2003
- Jerry J. Broz
- G01 - MEASURING TESTING
Information Patent Application
Multiple contact vertical probe solution enabling kelvin connection...
- Publication number 20030141883
- Publication date Jul 31, 2003
- Scott W. Mitchell
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Pick and place machine cleaning system and method

System and method for cleaning wire bonding machines using function...

System and method for cleaning contact elements and support hardwar...

Device and method for thermal stabilization of probe elements using...

Wafer manufacturing cleaning apparatus, process and method of use

Pick and place machine cleaning system and method

Wafer manufacturing cleaning apparatus, process and method of use

Working surface cleaning system and method

Working surface cleaning system and method

Apparatuses, device, and methods for cleaning tester interface cont...

Wafer manufacturing cleaning apparatus, process and method of use

Wafer manufacturing cleaning apparatus, process and method of use

Working surface cleaning system and method

Wafer manufacturing cleaning apparatus, process and method of use

Apparatuses, device, and methods for cleaning tester interface cont...

Apparatuses, device, and methods for cleaning tester interface cont...

Apparatuses, device, and methods for cleaning tester interface cont...

Cleaning system, device and method

Multiple contact vertical probe solution enabling Kelvin connection...

High density, area array probe card apparatus

Combined electrical test and mechanical test system for thin film c...

High density probe card apparatus and method of manufacture

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR CLEANING CONTACT ELEMENTS AND SUPPORT HARDWAR...

SYSTEM AND METHOD FOR CLEANING WIRE BONDING MACHINES USING FUNCTION...

SYSTEM AND METHOD FOR CLEANING CONTACT ELEMENTS AND SUPPORT HARDWAR...

PICK AND PLACE MACHINE CLEANING SYSTEM AND METHOD

PICK AND PLACE MACHINE CLEANING SYSTEM AND METHOD

PICK AND PLACE MACHINE CLEANING SYSTEM AND METHOD

PICK AND PLACE MACHINE CLEANING SYSTEM AND METHOD

Wafer Manufacturing Cleaning Apparatus, Process And Method Of Use

APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONT...

WORKING SURFACE CLEANING SYSTEM AND METHOD

Wafer Manufacturing Cleaning Apparatus, Process And Method Of Use

WORKING SURFACE CLEANING SYSTEM AND METHOD

Wafer Manufacturing Cleaning Apparatus, Process And Method Of Use

WORKING SURFACE CLEANING SYSTEM AND METHOD

APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONT...

WAFER MANUFACTURING CLEANING APPARATUS, PROCESS AND METHOD OF USE

WAFER MANUFACTURING CLEANING APPARATUS, PROCESS AND METHOD OF USE

APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONT...

APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONT...

APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONT...

WAFER MANUFACTURING CLEANING APPARATUS, PROCESS AND METHOD OF USE

Test Cell Conditioner (TCC) Surrogate Cleaning Device

Working surface cleaning system and method

Substrate protection system, device and method

High density, area array probe card apparatus

Cleaning system, device and method

High density probe card apparatus and method of manufacture

Method of improving contact resistance

Combined electrical test and mechanical test system for thin film c...

Multiple contact vertical probe solution enabling kelvin connection...