Jon Daley

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Phase change current density control structure
- Patent number 9,147,838
- Issue date Sep 29, 2015
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of eliminating pattern collapse on photoresist patterns
- Patent number 8,956,981
- Issue date Feb 17, 2015
- Micron Technology, Inc.
- Jon Daley
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Phase change current density control structure
- Patent number 8,847,193
- Issue date Sep 30, 2014
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase change memory elements using energy conversion layers, memory...
- Patent number 8,659,002
- Issue date Feb 25, 2014
- Micron Technology, Inc.
- Jun Liu
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Access transistor for memory device
- Patent number 8,652,903
- Issue date Feb 18, 2014
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of eliminating pattern collapse on photoresist patterns
- Patent number 8,552,538
- Issue date Oct 8, 2013
- Micron Technology, Inc.
- Jon Daley
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Phase change current density control structure
- Patent number 8,546,784
- Issue date Oct 1, 2013
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming patterned photoresist layers over semiconductor...
- Patent number 8,334,221
- Issue date Dec 18, 2012
- Micron Technology, Inc.
- Jon P. Daley
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Phase change current density control structure
- Patent number 8,252,622
- Issue date Aug 28, 2012
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase change memory elements using energy conversion layers, memory...
- Patent number 8,241,947
- Issue date Aug 14, 2012
- Micron Technology, Inc.
- Jun Liu
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Methods of forming patterned photoresist layers over semiconductor...
- Patent number 7,985,698
- Issue date Jul 26, 2011
- Micron Technology, Inc.
- Jon P. Daley
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Memory array for increased bit density and method of forming the same
- Patent number 7,968,927
- Issue date Jun 28, 2011
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase change current density control structure
- Patent number 7,943,921
- Issue date May 17, 2011
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistance variable memory device with sputtered metal-chalcogenide...
- Patent number 7,940,556
- Issue date May 10, 2011
- Micron Technology, Inc.
- Kristy A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase change memory elements using energy conversion layers, memory...
- Patent number 7,800,092
- Issue date Sep 21, 2010
- Micron Technology, Inc.
- Jun Liu
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Access transistor for memory device
- Patent number 7,709,885
- Issue date May 4, 2010
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory elements having patterned electrodes and method of forming t...
- Patent number 7,709,289
- Issue date May 4, 2010
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for increasing depth of field for an imager
- Patent number 7,711,259
- Issue date May 4, 2010
- Aptina Imaging Corporation
- Jon Daley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of forming memory arrays for increased bit density
- Patent number 7,700,422
- Issue date Apr 20, 2010
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistance variable memory device with sputtered metal-chalcogenide...
- Patent number 7,701,760
- Issue date Apr 20, 2010
- Micron Technology, Inc.
- Kristy A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of eliminating pattern collapse on photoresist patterns
- Patent number 7,687,406
- Issue date Mar 30, 2010
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory elements having patterned electrodes and method of forming t...
- Patent number 7,663,133
- Issue date Feb 16, 2010
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for erasing chalcogenide variable resistance memory bits
- Patent number 7,643,333
- Issue date Jan 5, 2010
- Micron Technology, Inc.
- Jon Daley
- G11 - INFORMATION STORAGE
Information Patent Grant
Access transistor for memory device
- Patent number 7,579,615
- Issue date Aug 25, 2009
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistance variable memory device with sputtered metal-chalcogenide...
- Patent number 7,433,227
- Issue date Oct 7, 2008
- Micron Technolohy, Inc.
- Kristy A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory array for increased bit density
- Patent number 7,427,770
- Issue date Sep 23, 2008
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming patterned photoresist layers over semiconductor...
- Patent number 7,368,399
- Issue date May 6, 2008
- Micron Technology, Inc.
- Guy T. Blalock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistance variable memory element with threshold device and method...
- Patent number 7,289,349
- Issue date Oct 30, 2007
- Micron Technology, Inc.
- Kristy A. Campbell
- G11 - INFORMATION STORAGE
Information Patent Grant
Resistance variable memory element with threshold device and method...
- Patent number 7,277,313
- Issue date Oct 2, 2007
- Micron Technology, Inc.
- Kristy A. Campbell
- G11 - INFORMATION STORAGE
Information Patent Grant
Resistance variable memory device with sputtered metal-chalcogenide...
- Patent number 7,274,034
- Issue date Sep 25, 2007
- Micron Technology, Inc.
- Kristy A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PHASE CHANGE CURRENT DENSITY CONTROL STRUCTURE
- Publication number 20140374685
- Publication date Dec 25, 2014
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF ELIMINATING PATTERN COLLAPSE ON PHOTORESIST PATTERNS
- Publication number 20140038425
- Publication date Feb 6, 2014
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CHANGE CURRENT DENSITY CONTROL STRUCTURE
- Publication number 20140021435
- Publication date Jan 23, 2014
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY ELEMENTS USING SELF-ALIGNED PHASE CHANGE MATERIAL LAYERS AND...
- Publication number 20130248810
- Publication date Sep 26, 2013
- Micron Technology, Inc.
- Jun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CHANGE CURRENT DENSITY CONTROL STRUCTURE
- Publication number 20130020547
- Publication date Jan 24, 2013
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CHANGE MEMORY ELEMENTS USING ENERGY CONVERSION LAYERS, MEMORY...
- Publication number 20120281466
- Publication date Nov 8, 2012
- Jun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of Forming Patterned Photoresist Layers Over Semiconductor...
- Publication number 20110281434
- Publication date Nov 17, 2011
- Micron Technology, Inc.
- Jon P. Daley
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PHASE CHANGE CURRENT DENSITY CONTROL STRUCTURE
- Publication number 20110201148
- Publication date Aug 18, 2011
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CHANGE MEMORY ELEMENTS USING ENERGY CONVERSION LAYERS, MEMORY...
- Publication number 20100321992
- Publication date Dec 23, 2010
- Jun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of eliminating pattern collapse on photoresist patterns
- Publication number 20100181656
- Publication date Jul 22, 2010
- Jon Daley
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ACCESS TRANSISTOR FOR MEMORY DEVICE
- Publication number 20100178741
- Publication date Jul 15, 2010
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory array for increased bit density and method of forming the same
- Publication number 20100171091
- Publication date Jul 8, 2010
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESISTANCE VARIABLE MEMORY DEVICE WITH SPUTTERED METAL-CHALCOGENIDE...
- Publication number 20100171088
- Publication date Jul 8, 2010
- Kristy A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Resistance variable memory device with sputtered metal-chalcogenide...
- Publication number 20090078925
- Publication date Mar 26, 2009
- Kristy A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS FOR ERASING CHALCOGENIDE VARIABLE RESISTANCE MEMORY BITS
- Publication number 20080310208
- Publication date Dec 18, 2008
- Jon Daley
- G11 - INFORMATION STORAGE
Information Patent Application
Phase change memory elements using energy conversion layers, memory...
- Publication number 20080044632
- Publication date Feb 21, 2008
- Micron Technology, Inc.
- Jun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for increasing depth of field for an imager
- Publication number 20080013941
- Publication date Jan 17, 2008
- Micron Technology, Inc.
- Jon Daley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Resistance variable memory device with sputtered metal-chalcogenide...
- Publication number 20070287219
- Publication date Dec 13, 2007
- Kristy A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase change current density control structure
- Publication number 20070158631
- Publication date Jul 12, 2007
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Access transistor for memory device
- Publication number 20070138527
- Publication date Jun 21, 2007
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Resistance variable memory element with threshold device and method...
- Publication number 20070064474
- Publication date Mar 22, 2007
- Micron Technology, Inc.
- Kristy A. Campbell
- G11 - INFORMATION STORAGE
Information Patent Application
Memory elements having patterned electrodes and method of forming t...
- Publication number 20070059882
- Publication date Mar 15, 2007
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Resistance variable memory element with threshold device and method...
- Publication number 20070047297
- Publication date Mar 1, 2007
- Kristy A. Campbell
- G11 - INFORMATION STORAGE
Information Patent Application
Memory array for increased bit density and method of forming the same
- Publication number 20070040160
- Publication date Feb 22, 2007
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Access transistor for memory device
- Publication number 20070034921
- Publication date Feb 15, 2007
- Micron Technology, Inc.
- Jon Daley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Resistance variable memory device with sputtered metal-chalcogenide...
- Publication number 20070023744
- Publication date Feb 1, 2007
- Micron Technology, Inc.
- Kristy A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process for erasing chalcogenide variable resistance memory bits
- Publication number 20070008768
- Publication date Jan 11, 2007
- Micron Technology, Inc.
- Jon Daley
- G11 - INFORMATION STORAGE
Information Patent Application
Methods of eliminating pattern collapse on photoresist patterns
- Publication number 20060257758
- Publication date Nov 16, 2006
- Jon Daley
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods of forming patterned photoresist layers over semiconductor...
- Publication number 20060252277
- Publication date Nov 9, 2006
- Jon P. Daley
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods of forming patterned photoresist layers over semiconductor...
- Publication number 20060246734
- Publication date Nov 2, 2006
- Guy T. Blalock
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Person

Patents Grantslast 30 patents

Phase change current density control structure

Methods of eliminating pattern collapse on photoresist patterns

Phase change current density control structure

Phase change memory elements using energy conversion layers, memory...

Access transistor for memory device

Methods of eliminating pattern collapse on photoresist patterns

Phase change current density control structure

Methods of forming patterned photoresist layers over semiconductor...

Phase change current density control structure

Phase change memory elements using energy conversion layers, memory...

Methods of forming patterned photoresist layers over semiconductor...

Memory array for increased bit density and method of forming the same

Phase change current density control structure

Resistance variable memory device with sputtered metal-chalcogenide...

Phase change memory elements using energy conversion layers, memory...

Access transistor for memory device

Memory elements having patterned electrodes and method of forming t...

Method and apparatus for increasing depth of field for an imager

Methods of forming memory arrays for increased bit density

Resistance variable memory device with sputtered metal-chalcogenide...

Methods of eliminating pattern collapse on photoresist patterns

Memory elements having patterned electrodes and method of forming t...

Process for erasing chalcogenide variable resistance memory bits

Access transistor for memory device

Resistance variable memory device with sputtered metal-chalcogenide...

Memory array for increased bit density

Methods of forming patterned photoresist layers over semiconductor...

Resistance variable memory element with threshold device and method...

Resistance variable memory element with threshold device and method...

Resistance variable memory device with sputtered metal-chalcogenide...

Patents Applicationslast 30 patents

PHASE CHANGE CURRENT DENSITY CONTROL STRUCTURE

METHODS OF ELIMINATING PATTERN COLLAPSE ON PHOTORESIST PATTERNS

PHASE CHANGE CURRENT DENSITY CONTROL STRUCTURE

MEMORY ELEMENTS USING SELF-ALIGNED PHASE CHANGE MATERIAL LAYERS AND...

PHASE CHANGE CURRENT DENSITY CONTROL STRUCTURE

PHASE CHANGE MEMORY ELEMENTS USING ENERGY CONVERSION LAYERS, MEMORY...

Methods of Forming Patterned Photoresist Layers Over Semiconductor...

PHASE CHANGE CURRENT DENSITY CONTROL STRUCTURE

PHASE CHANGE MEMORY ELEMENTS USING ENERGY CONVERSION LAYERS, MEMORY...

Methods of eliminating pattern collapse on photoresist patterns

ACCESS TRANSISTOR FOR MEMORY DEVICE

Memory array for increased bit density and method of forming the same

RESISTANCE VARIABLE MEMORY DEVICE WITH SPUTTERED METAL-CHALCOGENIDE...

Resistance variable memory device with sputtered metal-chalcogenide...

PROCESS FOR ERASING CHALCOGENIDE VARIABLE RESISTANCE MEMORY BITS

Phase change memory elements using energy conversion layers, memory...

Method and apparatus for increasing depth of field for an imager

Resistance variable memory device with sputtered metal-chalcogenide...

Phase change current density control structure

Access transistor for memory device

Resistance variable memory element with threshold device and method...

Memory elements having patterned electrodes and method of forming t...

Resistance variable memory element with threshold device and method...

Memory array for increased bit density and method of forming the same

Access transistor for memory device

Resistance variable memory device with sputtered metal-chalcogenide...

Process for erasing chalcogenide variable resistance memory bits

Methods of eliminating pattern collapse on photoresist patterns

Methods of forming patterned photoresist layers over semiconductor...

Methods of forming patterned photoresist layers over semiconductor...