Joseph C. Davis

Person

Allen, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for product yield prediction
- Patent number 7,673,262
- Issue date Mar 2, 2010
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for improving mask layout and fabrication
- Patent number 7,434,197
- Issue date Oct 7, 2008
- PDF Solutions, Inc.
- Christoph Dolainsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for product yield prediction
- Patent number 7,373,625
- Issue date May 13, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 7,356,800
- Issue date Apr 8, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 7,174,521
- Issue date Feb 6, 2007
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 6,901,564
- Issue date May 31, 2005
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for predicting an operational lifetime of a tr...
- Patent number 6,530,064
- Issue date Mar 4, 2003
- Texas Instruments Incorporated
- Karthik Vasanth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Equipment evaluation and design
- Patent number 6,438,439
- Issue date Aug 20, 2002
- Texas Instruments Incorporated
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrating dual supply voltages using a single extra mask level
- Patent number 6,388,288
- Issue date May 14, 2002
- Texas Instruments Incorporated
- Karthik Vasanth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for using response-surface methodologies to deter...
- Patent number 6,381,564
- Issue date Apr 30, 2002
- Texas Instruments Incorporated
- Joseph C. Davis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for non-parametric modeling of processed induced...
- Patent number 6,317,640
- Issue date Nov 13, 2001
- Texas Instruments Incorporated
- Suraj Rao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design of microelectronic process flows for manufacturability and p...
- Patent number 6,311,096
- Issue date Oct 30, 2001
- Texas Instruments Incorporated
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrating dual supply voltage by removing the drain extender impl...
- Patent number 6,157,062
- Issue date Dec 5, 2000
- Texas Instruments Incorporated
- Karthik Vasanth
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
System And Method For Product Yield Prediction
- Publication number 20080282210
- Publication date Nov 13, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20070118242
- Publication date May 24, 2007
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20060277506
- Publication date Dec 7, 2006
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20050158888
- Publication date Jul 21, 2005
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20030145292
- Publication date Jul 31, 2003
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING

Joseph C. Davis

Person

Patents Grantslast 30 patents

System and method for product yield prediction

Method for improving mask layout and fabrication

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction

Method and apparatus for predicting an operational lifetime of a tr...

Equipment evaluation and design

Integrating dual supply voltages using a single extra mask level

Method and system for using response-surface methodologies to deter...

System and method for non-parametric modeling of processed induced...

Design of microelectronic process flows for manufacturability and p...

Integrating dual supply voltage by removing the drain extender impl...

Patents Applicationslast 30 patents

System And Method For Product Yield Prediction

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction