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Joseph F. Wrinn
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Quincy, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for bond wire testing in an integrated circuit
Patent number
10,955,465
Issue date
Mar 23, 2021
Teradyne, Inc.
Anthony J. Suto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thermal control using phase-change material
Patent number
10,401,423
Issue date
Sep 3, 2019
Teradyne, Inc.
Larry Akers
G01 - MEASURING TESTING
Information
Patent Grant
Test fixture
Patent number
9,977,052
Issue date
May 22, 2018
Teradyne, Inc.
Anthony J. Suto
G01 - MEASURING TESTING
Information
Patent Grant
Engaging test slots
Patent number
9,001,456
Issue date
Apr 7, 2015
Teradyne, Inc.
Philip Campbell
G11 - INFORMATION STORAGE
Information
Patent Grant
X-ray inspection of solder reflow in high-density printed circuit b...
Patent number
8,031,929
Issue date
Oct 4, 2011
Teradyne, Inc.
Govindarajan T. Srinivasan
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of and system for calibration of inspection systems producin...
Patent number
7,819,581
Issue date
Oct 26, 2010
Teradyne, Inc.
Govindarajan T. Srinivasan
G01 - MEASURING TESTING
Information
Patent Grant
Method of and system for obtaining linear data for object scanned u...
Patent number
7,626,175
Issue date
Dec 1, 2009
Teradyne, Inc.
Peter A. Reichert
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Printed circuit board tester using magnetic induction
Patent number
5,631,572
Issue date
May 20, 1997
Teradyne, Inc.
Timothy W. Sheen
G01 - MEASURING TESTING
Information
Patent Grant
Relay multiplexing for circuit testers
Patent number
4,746,855
Issue date
May 24, 1988
Teradyne, Inc.
Joseph F. Wrinn
G01 - MEASURING TESTING
Information
Patent Grant
Circuitry for synchronizing a multiple channel circuit tester
Patent number
4,660,197
Issue date
Apr 21, 1987
Teradyne, Inc.
Joseph F. Wrinn
G01 - MEASURING TESTING
Information
Patent Grant
Analyzing electrical circuit boards
Patent number
4,178,543
Issue date
Dec 11, 1979
Teradyne, Inc.
Joseph F. Wrinn
G01 - MEASURING TESTING
Information
Patent Grant
Analyzing electrical circuit boards
Patent number
4,176,313
Issue date
Nov 27, 1979
Teradyne, Inc.
Joseph F. Wrinn
G01 - MEASURING TESTING
Information
Patent Grant
Electrical circuitry for measuring low level signals
Patent number
4,176,312
Issue date
Nov 27, 1979
Teradyne, Inc.
Joseph F. Wrinn
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR BOND WIRE TESTING IN AN INTEGRATED CIRCUIT
Publication number
20200088785
Publication date
Mar 19, 2020
Teradyne, Inc.
Anthony J. Suto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST FIXTURE
Publication number
20180095109
Publication date
Apr 5, 2018
Teradyne, Inc.
Anthony J. Suto
G01 - MEASURING TESTING
Information
Patent Application
THERMAL CONTROL USING PHASE-CHANGE MATERIAL
Publication number
20170322253
Publication date
Nov 9, 2017
Teradyne, Inc.
Larry Akers
G01 - MEASURING TESTING
Information
Patent Application
Engaging Test Slots
Publication number
20120050903
Publication date
Mar 1, 2012
Teradyne, Inc.
Philip Campbell
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD OF AND SYSTEM FOR CALIBRATION OF INSPECTION SYSTEMS PRODUCIN...
Publication number
20090218480
Publication date
Sep 3, 2009
Govindarajan T. SRINIVASAN
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF AND SYSTEM FOR OBTAINING LINEAR DATA FOR OBJECT SCANNED U...
Publication number
20090218498
Publication date
Sep 3, 2009
Peter A. Reichert
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY INSPECTION OF SOLDER REFLOW IN HIGH-DENSITY PRINTED CIRCUIT B...
Publication number
20090080764
Publication date
Mar 26, 2009
Teradyne, Inc.
Govindarajan T. SRINIVASAN
G06 - COMPUTING CALCULATING COUNTING