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Joseph M. Haemer
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San Jose, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Enhanced compliant probe card systems having improved planarity
Patent number
7,349,223
Issue date
Mar 25, 2008
NanoNexus, Inc.
Joseph Michael Haemer
G01 - MEASURING TESTING
Information
Patent Grant
Miniaturized contact spring
Patent number
7,137,830
Issue date
Nov 21, 2006
NanoNexus, Inc.
Syamal Kumar Lahiri
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Miniaturized contact spring
Patent number
7,126,220
Issue date
Oct 24, 2006
NanoNexus, Inc.
Syamal Kumar Lahiri
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Construction structures and manufacturing processes for probe card...
Patent number
6,917,525
Issue date
Jul 12, 2005
NanoNexus, Inc.
Sammy Mok
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Miniaturized Contact Spring
Publication number
20070144841
Publication date
Jun 28, 2007
Fu Chiung Chong
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Enhanced compliant probe card systems having improved planarity
Publication number
20040223309
Publication date
Nov 11, 2004
Joseph Michael Haemer
G01 - MEASURING TESTING
Information
Patent Application
Miniaturized contact spring
Publication number
20030218244
Publication date
Nov 27, 2003
Syamal Kumar Lahiri
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Miniaturized contact spring
Publication number
20030214045
Publication date
Nov 20, 2003
Syamal Kumar Lahiri
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Construction structures and manufacturing processes for probe card...
Publication number
20030099097
Publication date
May 29, 2003
Sammy Mok
G01 - MEASURING TESTING