Joseph M. Salazar

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Field triage of EOS failures in semiconductor devices
- Patent number 9,939,488
- Issue date Apr 10, 2018
- Teseda Corporation
- Joseph M. Salazar
- G01 - MEASURING TESTING
Information Patent Grant
Electrical characterization for a semiconductor device pin
- Patent number 8,907,697
- Issue date Dec 9, 2014
- Teseda Corporation
- Jack Frost
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FIELD TRIAGE OF EOS FAILURES IN SEMICONDUCTOR DEVICES
- Publication number 20150149106
- Publication date May 28, 2015
- TESEDA CORPORATION
- Joseph M. Salazar
- G01 - MEASURING TESTING
Information Patent Application
Electrical Characterization for a Semiconductor Device Pin
- Publication number 20130049790
- Publication date Feb 28, 2013
- TESEDA CORPORATION
- Jack Frost
- G01 - MEASURING TESTING