Jun Kikuchi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle measuring apparatus
- Patent number 6,710,352
- Issue date Mar 23, 2004
- National Space Development Agency of Japan
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic apparatus for measuring signal potentials
- Patent number 6,683,447
- Issue date Jan 27, 2004
- Ando Electric Co., Ltd.
- Yoshiki Yanagisawa
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe and magneto-optic probe
- Patent number 6,624,644
- Issue date Sep 23, 2003
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,567,760
- Issue date May 20, 2003
- Ando Electric Co., Ltd.
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Light receiving circuit for use in electro-optic sampling oscilloscope
- Patent number 6,384,590
- Issue date May 7, 2002
- Ando Electric Co., Ltd.
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,377,036
- Issue date Apr 23, 2002
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Timing generation circuit for electro-optic sampling oscilloscope
- Patent number 6,310,507
- Issue date Oct 30, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Timing generation circuit for an electro-optic oscilloscope
- Patent number 6,288,529
- Issue date Sep 11, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope utilizing probe with electro-optic crystal
- Patent number 6,252,387
- Issue date Jun 26, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical oscilloscope with improved sampling
- Patent number 6,232,765
- Issue date May 15, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,201,235
- Issue date Mar 13, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing circuit for electro-optic probe
- Patent number 6,087,838
- Issue date Jul 11, 2000
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NAP SPOT SELECTION METHOD AND NAP SPOT SELECTION SYSTEM
- Publication number 20230304812
- Publication date Sep 28, 2023
- SUBARU CORPORATION
- Isao TSUKUI
- G01 - MEASURING TESTING
Information Patent Application
Charged particle measuring apparatus
- Publication number 20030158678
- Publication date Aug 21, 2003
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
Blood analyzing method and apparatus
- Publication number 20030114785
- Publication date Jun 19, 2003
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
Electro-optic probe and magneto-optic probe
- Publication number 20020008533
- Publication date Jan 24, 2002
- ANDO ELECTRIC CO., LTD.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Application
Probe signal outputting apparatus
- Publication number 20010022338
- Publication date Sep 20, 2001
- Yoshiki Yanagisawa
- G01 - MEASURING TESTING
Information Patent Application
Probe signal outputting apparatus
- Publication number 20010022339
- Publication date Sep 20, 2001
- Yoshiki Yanagisawa
- G01 - MEASURING TESTING

Jun Kikuchi

Person

Patents Grantslast 30 patents

Charged particle measuring apparatus

Electro-optic apparatus for measuring signal potentials

Electro-optic probe and magneto-optic probe

Electro-optic sampling oscilloscope

Light receiving circuit for use in electro-optic sampling oscilloscope

Electro-optic sampling oscilloscope

Timing generation circuit for electro-optic sampling oscilloscope

Timing generation circuit for an electro-optic oscilloscope

Oscilloscope utilizing probe with electro-optic crystal

Electro-optical oscilloscope with improved sampling

Electro-optic sampling oscilloscope

Signal processing circuit for electro-optic probe

Patents Applicationslast 30 patents

NAP SPOT SELECTION METHOD AND NAP SPOT SELECTION SYSTEM

Charged particle measuring apparatus

Blood analyzing method and apparatus

Electro-optic probe and magneto-optic probe

Probe signal outputting apparatus

Probe signal outputting apparatus