Junichi Arita

Person

Musashimurayama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic device
- Patent number 10,098,179
- Issue date Oct 9, 2018
- RENESAS ELECTRONICS CORPORATION
- Shintaro Yamamichi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device and method of manufacturing same
- Patent number 8,492,882
- Issue date Jul 23, 2013
- Renesas Electronics Corporation
- Junichi Arita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing same
- Patent number 8,188,583
- Issue date May 29, 2012
- Renesas Electronics Corporation
- Junichi Arita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle measuring device and measuring method thereof
- Patent number 6,774,638
- Issue date Aug 10, 2004
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 6,661,093
- Issue date Dec 9, 2003
- Renesas Technology Corporation
- Kenji Ujiie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle measuring device and measuring method thereof
- Patent number 6,639,392
- Issue date Oct 28, 2003
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and mounting board
- Patent number 6,621,160
- Issue date Sep 16, 2003
- Hitachi, Ltd.
- Masanori Shibamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 6,563,212
- Issue date May 13, 2003
- Hitachi, Ltd.
- Masanori Shibamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, manufacturing method thereof and mounting board
- Patent number 6,404,049
- Issue date Jun 11, 2002
- Hitachi, Ltd.
- Masanori Shibamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TSOP type semiconductor device
- Patent number 6,232,653
- Issue date May 15, 2001
- Hitachi, Ltd.
- Naotaka Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with lead structure on principal surface of chip
- Patent number 5,869,888
- Issue date Feb 9, 1999
- Hitachi, Ltd.
- Kunihiro Tsubosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 5,714,405
- Issue date Feb 3, 1998
- Hitachi, Ltd.
- Kunihiro Tsubosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with lead structure within the planar area of...
- Patent number 5,583,375
- Issue date Dec 10, 1996
- Hitachi, Ltd.
- Kunihiro Tsubosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor leadframe and its production method and plastic encap...
- Patent number 5,571,428
- Issue date Nov 5, 1996
- Hitachi, Ltd.
- Asao Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Packaged semiconductor device having stress absorbing film
- Patent number 5,466,888
- Issue date Nov 14, 1995
- Hitachi, Ltd.
- Lim T. Beng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor leadframe and its production method and plastic encap...
- Patent number 5,437,915
- Issue date Aug 1, 1995
- Hitachi, Ltd.
- Asao Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Packaged semiconductor device having stress absorbing film
- Patent number 5,406,028
- Issue date Apr 11, 1995
- Hitachi, Ltd.
- Lim T. Beng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of uniformly encapsulating a semiconductor device in resin
- Patent number 5,371,044
- Issue date Dec 6, 1994
- Hitachi, Ltd.
- Isamu Yoshida
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Plastic sealed type semiconductor apparatus
- Patent number 5,299,092
- Issue date Mar 29, 1994
- Hitachi, Ltd.
- Akihiro Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having stacked lead structure
- Patent number 5,252,854
- Issue date Oct 12, 1993
- Hitachi, Ltd.
- Junichi Arita
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE
- Publication number 20140329476
- Publication date Nov 6, 2014
- RENESAS ELECTRONICS CORPORATION
- Shintaro YAMAMICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
- Publication number 20120280379
- Publication date Nov 8, 2012
- Renesas Electronics Corporation
- JUNICHI ARITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
- Publication number 20100244214
- Publication date Sep 30, 2010
- RENESAS TECHNOLOGY CORP.
- Junichi ARITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle measuring device and measuring method thereof
- Publication number 20030146760
- Publication date Aug 7, 2003
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING
Information Patent Application
Charged particle measuring device and measuring method thereof
- Publication number 20030030444
- Publication date Feb 13, 2003
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device, manufacturing method thereof and mounting board
- Publication number 20020105070
- Publication date Aug 8, 2002
- Hitachi, Ltd.
- Masanori Shibamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and a method of manufacturing the same
- Publication number 20020074656
- Publication date Jun 20, 2002
- Hitachi, Ltd.
- Kenji Ujiie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device, manufacturing method thereof and mounting board
- Publication number 20020066955
- Publication date Jun 6, 2002
- Hitachi, Ltd.
- Masanori Shibamoto
- H01 - BASIC ELECTRIC ELEMENTS

Junichi Arita

Person

Patents Grantslast 30 patents

Electronic device

Semiconductor device and method of manufacturing same

Semiconductor device and method of manufacturing same

Charged particle measuring device and measuring method thereof

Semiconductor device

Charged particle measuring device and measuring method thereof

Semiconductor device and mounting board

Semiconductor device

Semiconductor device, manufacturing method thereof and mounting board

TSOP type semiconductor device

Semiconductor device with lead structure on principal surface of chip

Semiconductor device

Semiconductor device with lead structure within the planar area of...

Semiconductor leadframe and its production method and plastic encap...

Packaged semiconductor device having stress absorbing film

Semiconductor leadframe and its production method and plastic encap...

Packaged semiconductor device having stress absorbing film

Method of uniformly encapsulating a semiconductor device in resin

Plastic sealed type semiconductor apparatus

Semiconductor device having stacked lead structure

Patents Applicationslast 30 patents

ELECTRONIC DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME

Charged particle measuring device and measuring method thereof

Charged particle measuring device and measuring method thereof

Semiconductor device, manufacturing method thereof and mounting board

Semiconductor device and a method of manufacturing the same

Semiconductor device, manufacturing method thereof and mounting board