Justin L. Lawrence

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Boise, ID, US

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Patents Grantslast 30 patents

Information Patent Grant
Devices and method for handling microelectronics assemblies
- Patent number 9,048,272
- Issue date Jun 2, 2015
- Illinois Tool Works Inc.
- Valoris L. Forsyth
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Compliant contactor for testing semiconductors
- Patent number 6,362,639
- Issue date Mar 26, 2002
- Micron Technology, Inc.
- Justin L. Lawrence
- G01 - MEASURING TESTING
Information Patent Grant
Extended length, high frequency contactor block
- Patent number 6,293,817
- Issue date Sep 25, 2001
- Micron Technology, Inc.
- Steven L. Hamren
- G01 - MEASURING TESTING
Information Patent Grant
Compliant contactor for testing semiconductors
- Patent number 6,259,263
- Issue date Jul 10, 2001
- Micron Technology, Inc.
- Justin L. Lawrence
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICES AND METHODS FOR HANDLING MICROELECTRONICS ASSEMBLIES
- Publication number 20150235882
- Publication date Aug 20, 2015
- Illinois Tool Works Inc.
- Valoris L. FORSYTH
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
DEVICES AND METHOD FOR HANDLING MICROELECTRONICS ASSEMBLIES
- Publication number 20110259772
- Publication date Oct 27, 2011
- Illinois Tool Works Inc.
- Valoris L. Forsyth
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
DEVICES AND METHODS FOR HANDLING MICROELECTRONIC ASSEMBLIES
- Publication number 20100089851
- Publication date Apr 15, 2010
- Micron Technology, Inc.
- Michael R. Slaughter
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Compliant contactor for testing semiconductors
- Publication number 20010026167
- Publication date Oct 4, 2001
- Justin L. Lawrence
- G01 - MEASURING TESTING