Justin R. Arrington

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electron induced chemical etching and deposition for local circuit...
- Patent number 8,821,682
- Issue date Sep 2, 2014
- Micron Technology, Inc.
- Mark J. Williamson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for integrated circuit diagnosis
- Patent number 8,809,074
- Issue date Aug 19, 2014
- Micron Technology, Inc.
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Profiling solid state samples
- Patent number 8,609,542
- Issue date Dec 17, 2013
- Micron Technology, Inc.
- Neal R. Rueger
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Profiling solid state samples
- Patent number 8,389,415
- Issue date Mar 5, 2013
- Micron Technology, Inc.
- Neal R. Rueger
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method of removing or deposting material on a surface including mat...
- Patent number 8,026,501
- Issue date Sep 27, 2011
- Micron Technology, Inc.
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Electron induced chemical etching for device level diagnosis
- Patent number 7,892,978
- Issue date Feb 22, 2011
- Micron Technology, Inc.
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Electron induced chemical etching and deposition for local circuit...
- Patent number 7,807,062
- Issue date Oct 5, 2010
- Micron Technology, Inc.
- Mark J. Williamson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron induced chemical etching/deposition for enhanced detection...
- Patent number 7,791,055
- Issue date Sep 7, 2010
- Micron Technology, Inc.
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Profiling solid state samples
- Patent number 7,791,071
- Issue date Sep 7, 2010
- Micron Technology, Inc.
- Neal R. Rueger
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method and apparatus for integrated circuit failure analysis
- Patent number 6,819,125
- Issue date Nov 16, 2004
- Micron Technology, Inc.
- James E. Green
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR INTEGRATED CIRCUIT DIAGNOSIS
- Publication number 20130295700
- Publication date Nov 7, 2013
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Application
PROFILING SOLID STATE SAMPLES
- Publication number 20130180950
- Publication date Jul 18, 2013
- Micron Technology, Inc.
- Neal R. Rueger
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
APPARATUS AND SYSTEMS FOR INTEGRATED CIRCUIT DIAGNOSIS
- Publication number 20110139368
- Publication date Jun 16, 2011
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Application
Electron induced chemical etching and deposition for local circuit...
- Publication number 20110017401
- Publication date Jan 27, 2011
- Mark J. Williamson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ENHANCING DETECTION OF DEFECTS ON A SURFACE
- Publication number 20100320384
- Publication date Dec 23, 2010
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Application
PROFILING SOLID STATE SAMPLES
- Publication number 20100314354
- Publication date Dec 16, 2010
- Neal R. Rueger
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Profiling solid state samples
- Publication number 20080038863
- Publication date Feb 14, 2008
- Micron Technology, Inc.
- Neal R. Rueger
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Electron induced chemical etching/deposition for enhanced detection...
- Publication number 20080006786
- Publication date Jan 10, 2008
- Micron Technology, Inc.
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Application
Electron induced chemical etching for device level diagnosis
- Publication number 20080009140
- Publication date Jan 10, 2008
- Micron Technology, Inc.
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Application
Electron induced chemical etching and deposition for local circuit...
- Publication number 20080006603
- Publication date Jan 10, 2008
- Micron Technology, Inc.
- Mark J. Williamson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON INDUCED CHEMICAL ETCHING FOR MATERIALS CHARACTERIZATION
- Publication number 20070278180
- Publication date Dec 6, 2007
- Mark J. Williamson
- G01 - MEASURING TESTING

Justin R. Arrington

Person

Patents Grantslast 30 patents

Electron induced chemical etching and deposition for local circuit...

Method for integrated circuit diagnosis

Profiling solid state samples

Profiling solid state samples

Method of removing or deposting material on a surface including mat...

Electron induced chemical etching for device level diagnosis

Electron induced chemical etching and deposition for local circuit...

Electron induced chemical etching/deposition for enhanced detection...

Profiling solid state samples

Method and apparatus for integrated circuit failure analysis

Patents Applicationslast 30 patents

METHOD FOR INTEGRATED CIRCUIT DIAGNOSIS

PROFILING SOLID STATE SAMPLES

APPARATUS AND SYSTEMS FOR INTEGRATED CIRCUIT DIAGNOSIS

Electron induced chemical etching and deposition for local circuit...

METHOD OF ENHANCING DETECTION OF DEFECTS ON A SURFACE

PROFILING SOLID STATE SAMPLES

Profiling solid state samples

Electron induced chemical etching/deposition for enhanced detection...

Electron induced chemical etching for device level diagnosis

Electron induced chemical etching and deposition for local circuit...

ELECTRON INDUCED CHEMICAL ETCHING FOR MATERIALS CHARACTERIZATION