K. Reed Gleason

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
High frequency interconnect structures, electronic assemblies that...
- Patent number 9,372,214
- Issue date Jun 21, 2016
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Resilient electrical interposers, systems that include the interpos...
- Patent number 9,099,449
- Issue date Aug 4, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resilient electrical interposers, systems that include the interpos...
- Patent number 8,970,240
- Issue date Mar 3, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing method using improved contact
- Patent number 8,451,017
- Issue date May 28, 2013
- Cascade Microtech, Inc.
- K. Reed Gleason
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe for testing a device under test
- Patent number 7,898,273
- Issue date Mar 1, 2011
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing structure with laterally scrubbing contacts
- Patent number 7,893,704
- Issue date Feb 22, 2011
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Active wafer probe
- Patent number 7,759,953
- Issue date Jul 20, 2010
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Grant
Fluid dispensing system
- Patent number 7,618,590
- Issue date Nov 17, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system with local contact scrub
- Patent number 7,550,983
- Issue date Jun 23, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system with local contact scrub
- Patent number 7,541,821
- Issue date Jun 2, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,518,387
- Issue date Apr 14, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,501,842
- Issue date Mar 10, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,498,829
- Issue date Mar 3, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,489,149
- Issue date Feb 10, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,482,823
- Issue date Jan 27, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe with low contact resistance for testing a device und...
- Patent number 7,436,194
- Issue date Oct 14, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Active wafer probe
- Patent number 7,427,868
- Issue date Sep 23, 2008
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a device under test
- Patent number 7,394,269
- Issue date Jul 1, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
System for evaluating probing networks
- Patent number 7,321,233
- Issue date Jan 22, 2008
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for high-frequency testing of a device under test
- Patent number 7,304,488
- Issue date Dec 4, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,271,603
- Issue date Sep 18, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
System for evaluating probing networks
- Patent number 7,164,279
- Issue date Jan 16, 2007
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a device under test
- Patent number 7,161,363
- Issue date Jan 9, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system with local contact scrub
- Patent number 7,109,731
- Issue date Sep 19, 2006
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,057,404
- Issue date Jun 6, 2006
- Sharp Laboratories of America, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
System for evaluating probing networks
- Patent number 6,987,398
- Issue date Jan 17, 2006
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system with local contact scrub
- Patent number 6,927,585
- Issue date Aug 9, 2005
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a device under test
- Patent number 6,815,963
- Issue date Nov 9, 2004
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Interconnect assembly for use in evaluating probing networks
- Patent number 6,803,779
- Issue date Oct 12, 2004
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Reference transmission line junction for probing device
- Patent number 6,608,496
- Issue date Aug 19, 2003
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...
- Publication number 20150301082
- Publication date Oct 22, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- G01 - MEASURING TESTING
Information Patent Application
RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...
- Publication number 20150114925
- Publication date Apr 30, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC D...
- Publication number 20130015871
- Publication date Jan 17, 2013
- Cascade Microtech, Inc.
- Tim Cleary
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY INTERCONNECT STRUCTURES, ELECTRONIC ASSEMBLIES THAT...
- Publication number 20120306587
- Publication date Dec 6, 2012
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Application
RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...
- Publication number 20120112779
- Publication date May 10, 2012
- Cascade Microtech, Inc.
- Kenneth R. Smith
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE WAFER PROBE
- Publication number 20100253377
- Publication date Oct 7, 2010
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20090267625
- Publication date Oct 29, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system with local contact scrub
- Publication number 20090224783
- Publication date Sep 10, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Active wafer probe
- Publication number 20080309358
- Publication date Dec 18, 2008
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080054929
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080054923
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080048692
- Publication date Feb 28, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080042671
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080042672
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080024149
- Publication date Jan 31, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system with local contact scrub
- Publication number 20070296431
- Publication date Dec 27, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Sample preparation technique
- Publication number 20070278421
- Publication date Dec 6, 2007
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20070273399
- Publication date Nov 29, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
System for evaluating probing networks
- Publication number 20070109001
- Publication date May 17, 2007
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20070075716
- Publication date Apr 5, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Fluid dispensing system
- Publication number 20070003447
- Publication date Jan 4, 2007
- K. Reed Gleason
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Membrane probing system with local contact scrub
- Publication number 20060214676
- Publication date Sep 28, 2006
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20060170439
- Publication date Aug 3, 2006
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
System for evaluating probing networks
- Publication number 20060103403
- Publication date May 18, 2006
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system with local contact scrub
- Publication number 20050231223
- Publication date Oct 20, 2005
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Active wafer probe
- Publication number 20050140386
- Publication date Jun 30, 2005
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20050099191
- Publication date May 12, 2005
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
System for evaluating probing networks
- Publication number 20050040837
- Publication date Feb 24, 2005
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20040232927
- Publication date Nov 25, 2004
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20040004491
- Publication date Jan 8, 2004
- K. Reed Gleason
- G01 - MEASURING TESTING

K. Reed Gleason

Person

Patents Grantslast 30 patents

High frequency interconnect structures, electronic assemblies that...

Resilient electrical interposers, systems that include the interpos...

Resilient electrical interposers, systems that include the interpos...

Membrane probing method using improved contact

Probe for testing a device under test

Membrane probing structure with laterally scrubbing contacts

Active wafer probe

Fluid dispensing system

Membrane probing system with local contact scrub

Membrane probing system with local contact scrub

Shielded probe for testing a device under test

Shielded probe for testing a device under test

Shielded probe for testing a device under test

Shielded probe for testing a device under test

Shielded probe for testing a device under test

Shielded probe with low contact resistance for testing a device und...

Active wafer probe

Probe for testing a device under test

System for evaluating probing networks

Shielded probe for high-frequency testing of a device under test

Shielded probe for testing a device under test

System for evaluating probing networks

Probe for testing a device under test

Membrane probing system with local contact scrub

Shielded probe for testing a device under test

System for evaluating probing networks

Membrane probing system with local contact scrub

Probe for testing a device under test

Interconnect assembly for use in evaluating probing networks

Reference transmission line junction for probing device

Patents Applicationslast 30 patents

RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...

RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...

SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC D...

HIGH FREQUENCY INTERCONNECT STRUCTURES, ELECTRONIC ASSEMBLIES THAT...

RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...

ACTIVE WAFER PROBE

Probe for testing a device under test

Membrane probing system with local contact scrub

Active wafer probe

Probe for testing a device under test

Probe for testing a device under test

Probe for testing a device under test

Probe for testing a device under test

Probe for testing a device under test

Probe for testing a device under test

Membrane probing system with local contact scrub

Sample preparation technique

Probe for testing a device under test

System for evaluating probing networks

Probe for testing a device under test

Fluid dispensing system

Membrane probing system with local contact scrub

Probe for testing a device under test

System for evaluating probing networks

Membrane probing system with local contact scrub

Active wafer probe

Probe for testing a device under test

System for evaluating probing networks

Probe for testing a device under test

Probe for testing a device under test