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Kaushik De
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San Jose, CA, US
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last 30 patents
Information
Patent Grant
IDDQ test solution for large asics
Patent number
6,212,655
Issue date
Apr 3, 2001
LSI Logic Corporation
Venkat C. Ghanta
G01 - MEASURING TESTING
Information
Patent Grant
System and method for representing a system level RTL design using...
Patent number
6,135,647
Issue date
Oct 24, 2000
LSI Logic Corporation
Arun Balakrishnan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test shells for protecting proprietary information in asic cores
Patent number
5,903,578
Issue date
May 11, 1999
LSI Logic Corporation
Kaushik De
G01 - MEASURING TESTING
Information
Patent Grant
Defect isolation using scan-path testing and electron beam probing...
Patent number
5,663,967
Issue date
Sep 2, 1997
LSI Logic Corporation
Grant A. Lindberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Protecting proprietary asic design information using boundary scan...
Patent number
5,638,380
Issue date
Jun 10, 1997
LSI Logic Corp.
Kaushik De
G01 - MEASURING TESTING