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Kazuhiro SAKAGUCHI
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Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Test apparatus, test method and recording medium
Patent number
11,714,106
Issue date
Aug 1, 2023
Renesas Electronics Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Screening method, screening device and program
Patent number
8,878,561
Issue date
Nov 4, 2014
Renesas Electronics Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for processing data
Patent number
8,011,011
Issue date
Aug 30, 2011
Canon Kabushiki Kaisha
Kazuhiro Sakaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Information processing device, information processing method, and c...
Patent number
7,970,817
Issue date
Jun 28, 2011
Canon Kabushiki Kaisha
Tadashi Hagiuda
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for sampling a power supply current of an inte...
Patent number
7,483,799
Issue date
Jan 27, 2009
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for sampling a power supply current of an inte...
Patent number
6,996,489
Issue date
Feb 7, 2006
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Observation and/or failure inspection apparatus, method and program...
Patent number
6,973,395
Issue date
Dec 6, 2005
NEC Electronics Corporation
Yutaka Yoshizawa
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting an integrated circuit in failure among integrat...
Patent number
6,931,336
Issue date
Aug 16, 2005
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit fault tester, integrated circuit fault test meth...
Patent number
6,766,485
Issue date
Jul 20, 2004
NEC Electronics Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting an integrated circuit in failure among integrat...
Patent number
6,704,675
Issue date
Mar 9, 2004
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting an integrated circuit in failure among integrat...
Patent number
6,694,274
Issue date
Feb 17, 2004
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting an integrated circuit in failure among integrat...
Patent number
6,684,170
Issue date
Jan 27, 2004
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Image formation system, control method of image formation system, i...
Patent number
6,510,289
Issue date
Jan 21, 2003
Canon Kabushiki Kaisha
Yoshihide Terao
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Screening of semiconductor integrated circuit devices
Patent number
6,480,011
Issue date
Nov 12, 2002
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
High speed LSI spectral analysis testing apparatus and method
Patent number
6,351,835
Issue date
Feb 26, 2002
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for diagnosing failure occurrence position
Patent number
6,205,559
Issue date
Mar 20, 2001
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Diagnostic system analyzing frequency spectrum of electric power fo...
Patent number
6,058,502
Issue date
May 2, 2000
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit fault testing system based on power spectrum ana...
Patent number
5,949,798
Issue date
Sep 7, 1999
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Electronic circuit tester and method of testing electronic circuit
Patent number
5,801,540
Issue date
Sep 1, 1998
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Grant
CMOS integrated circuit failure diagnosis apparatus and diagnostic...
Patent number
5,790,565
Issue date
Aug 4, 1998
NEC Corporation
Kazuhiro Sakaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electronic circuit tester and method of testing electronic circuit
Patent number
5,659,244
Issue date
Aug 19, 1997
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEST APPARATUS, TEST METHOD AND RECORDING MEDIUM
Publication number
20220268809
Publication date
Aug 25, 2022
RENESAS ELECTRONICS CORPORATION
Kazuhiro SAKAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
SCREENING DEVICE FOR SEMICONDUCTOR DEVICES, SCREENING METHOD FOR SE...
Publication number
20130103328
Publication date
Apr 25, 2013
RENESAS ELECTRONICS CORPORATION
Kazuhiro SAKAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
SCREENING METHOD, SCREENING DEVICE AND PROGRAM
Publication number
20130057311
Publication date
Mar 7, 2013
RENESAS ELECTRONICS CORPORATION
Kazuhiro SAKAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
SCREENING APPARATUS, SCREENING METHOD, AND PROGRAM
Publication number
20110172941
Publication date
Jul 14, 2011
RENESAS ELECTRONICS CORPORATION
Kazuhiro SAKAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
Data processing apparatus, data processing method, and computer pro...
Publication number
20060059093
Publication date
Mar 16, 2006
Canon Kabushiki Kaisha
Yoichi Takaragi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for sampling a power supply current of an inte...
Publication number
20060007226
Publication date
Jan 12, 2006
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Application
Information processing device, information processing method, and c...
Publication number
20050257126
Publication date
Nov 17, 2005
Canon Kabushiki Kaisha
Tadashi Hagiuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for processing data
Publication number
20050160068
Publication date
Jul 21, 2005
Canon Kabushiki Kaisha
Kazuhiro Sakaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Observation and/or failure inspection apparatus, method and program...
Publication number
20040034490
Publication date
Feb 19, 2004
Yutaka Yoshizawa
G01 - MEASURING TESTING
Information
Patent Application
Method of detecting an integrated circuit in failure among integrat...
Publication number
20030182073
Publication date
Sep 25, 2003
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Application
Method of detecting an integrated circuit in failure among integrat...
Publication number
20030093237
Publication date
May 15, 2003
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Application
Method of detecting an integrated circuit in failure among integrat...
Publication number
20030088380
Publication date
May 8, 2003
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Application
Image formation system, control method of image formation system, i...
Publication number
20010051052
Publication date
Dec 13, 2001
Yoshihide Terao
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Screening of semiconductor integrated circuit devices
Publication number
20010043079
Publication date
Nov 22, 2001
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for sampling a power supply current of an inte...
Publication number
20010020283
Publication date
Sep 6, 2001
NEC Corporation
Kazuhiro Sakaguchi
G01 - MEASURING TESTING