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Kedarnath J. Balakrishnan
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Command arbitration for high speed memory interfaces
Patent number
10,684,969
Issue date
Jun 16, 2020
Advanced Micro Devices, Inc.
James R. Magro
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory controller with flexible address decoding
Patent number
10,403,333
Issue date
Sep 3, 2019
Advanced Micro Devices, Inc.
Kevin M. Brandl
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory controller arbiter with streak and read/write transaction ma...
Patent number
10,402,120
Issue date
Sep 3, 2019
Advanced Micro Devices, Inc.
Kedarnath Balakrishnan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Low power memory throttling
Patent number
10,198,216
Issue date
Feb 5, 2019
Advanced Micro Devices, Inc.
Kedarnath Balakrishnan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory controller with virtual controller mode
Patent number
10,037,150
Issue date
Jul 31, 2018
Advanced Micro Devices, Inc.
James R. Magro
G11 - INFORMATION STORAGE
Information
Patent Grant
Fine granularity refresh
Patent number
9,899,074
Issue date
Feb 20, 2018
Advanced Micro Devices, Inc.
Kedarnath Balakrishnan
G11 - INFORMATION STORAGE
Information
Patent Grant
Fine granularity refresh
Patent number
9,576,637
Issue date
Feb 21, 2017
Advanced Micro Devices, Inc.
Kedarnath Balakrishnan
G11 - INFORMATION STORAGE
Information
Patent Grant
Test output compaction with improved blocking of unknown values
Patent number
7,610,527
Issue date
Oct 27, 2009
NEC Laboratories America, Inc.
Seongmoon Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method for generating, from a test cube set, a generator configured...
Patent number
7,610,540
Issue date
Oct 27, 2009
NEC Laboratories America, Inc.
Kedarnath Balakrishnan
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing logic circuit designs
Patent number
7,610,539
Issue date
Oct 27, 2009
NEC Laboratories America, Inc.
Kedarnath Balakrishnan
G01 - MEASURING TESTING
Information
Patent Grant
Re-configurable embedded core test protocol for system-on-chips (SO...
Patent number
7,577,540
Issue date
Aug 18, 2009
NEC Corporation
Seongmoon Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for testing logic circuit designs
Patent number
7,484,151
Issue date
Jan 27, 2009
NEC Laboratories America, Inc.
Kedarnath Balakrishnan
G01 - MEASURING TESTING
Information
Patent Grant
Test pattern compression with pattern-independent design-independen...
Patent number
7,302,626
Issue date
Nov 27, 2007
NEC Laboratories America, Inc.
Kedarnath Balakrishnan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DDR MEMORY ERROR RECOVERY
Publication number
20180018221
Publication date
Jan 18, 2018
Advanced Micro Devices, Inc.
James R. Magro
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY CONTROLLER WITH VIRTUAL CONTROLLER MODE
Publication number
20180018105
Publication date
Jan 18, 2018
Advanced Micro Devices, Inc.
James R. Magro
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY CONTROLLER WITH FLEXIBLE ADDRESS DECODING
Publication number
20180019006
Publication date
Jan 18, 2018
Advanced Micro Devices, Inc.
Kevin M. Brandl
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMMAND ARBITRATION FOR HIGH SPEED MEMORY INTERFACES
Publication number
20180018291
Publication date
Jan 18, 2018
Advanced Micro Devices, Inc.
James R. Magro
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY CONTROLLER ARBITER WITH STREAK AND READ/WRITE TRANSACTION MA...
Publication number
20180018133
Publication date
Jan 18, 2018
Advanced Micro Devices, Inc.
Kedarnath Balakrishnan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FINE GRANULARITY REFRESH
Publication number
20170345482
Publication date
Nov 30, 2017
Advanced Micro Devices, Inc.
Kedarnath Balakrishnan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LOW POWER MEMORY THROTTLING
Publication number
20170344309
Publication date
Nov 30, 2017
Advanced Micro Devices, Inc.
Kedarnath Balakrishnan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS TO FACILITATE BUILT-IN SELF-TEST DATA COLLECTION
Publication number
20120159274
Publication date
Jun 21, 2012
Kedarnath J. Balakrishnan
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR TESTING LOGIC CIRCUIT DESIGNS
Publication number
20090119563
Publication date
May 7, 2009
NEC Laboratories America, Inc.
Kedarnath Balakrishnan
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR TESTING LOGIC CIRCUIT DESIGNS
Publication number
20090119556
Publication date
May 7, 2009
NEC Laboratories America, Inc.
Kedarnath Balakrishnan
G01 - MEASURING TESTING
Information
Patent Application
Register Transfer Level (RTL) Test Point Insertion Method to Reduce...
Publication number
20080092093
Publication date
Apr 17, 2008
NEC Laboratories America, Inc.
Kedarnath Balakrishnan
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Testing an Integrated Circuit
Publication number
20070266283
Publication date
Nov 15, 2007
NEC Laboratories America, Inc.
Kedarnath Balakrishnan
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Testing Logic Circuit Designs
Publication number
20070113129
Publication date
May 17, 2007
NEC Laboratories America, Inc.
Kedarnath Balakrishnan
G01 - MEASURING TESTING
Information
Patent Application
Test Output Compaction with Improved Blocking of Unknown Values
Publication number
20060236186
Publication date
Oct 19, 2006
NEC Laboratories America, Inc.
Seongmoon Wang
G01 - MEASURING TESTING
Information
Patent Application
Test pattern compression with pattern-independent design-independen...
Publication number
20060112320
Publication date
May 25, 2006
NEC Laboratories America, Inc.
Kedarnath Balakrishnan
G01 - MEASURING TESTING
Information
Patent Application
Re-configurable embedded core test protocol for system-on-chips (SO...
Publication number
20030167144
Publication date
Sep 4, 2003
NEC USA, INC.
Seongmoon Wang
G06 - COMPUTING CALCULATING COUNTING