Keigo Kasuya

Person

Kokubunji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron source and charged particle beam device
- Patent number 11,929,230
- Issue date Mar 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for controlling electron beam ap...
- Patent number 11,894,211
- Issue date Feb 6, 2024
- HITACHI HIGH-TECH CORPORATION
- Erina Kawamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermoelectric field emission electron source and electron beam app...
- Patent number 11,508,544
- Issue date Nov 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Soichiro Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron source, method for manufacturing the same, and electron be...
- Patent number 11,322,329
- Issue date May 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,903,037
- Issue date Jan 26, 2021
- HITACHI HIGH-TECH CORPORATION
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum apparatus
- Patent number 10,804,084
- Issue date Oct 13, 2020
- HITACHI HIGH-TECH CORPORATION
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron source and electron beam device using the same
- Patent number 10,707,046
- Issue date Jul 7, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission electron source, method for manufacturing same, and...
- Patent number 10,586,674
- Issue date Mar 10, 2020
- Hitachi High-Technologies Corporation
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 10,522,319
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion pump and charged particle beam device using the same
- Patent number 9,837,243
- Issue date Dec 5, 2017
- Hitachi, Ltd.
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, and method of controlling the same
- Patent number 8,772,735
- Issue date Jul 8, 2014
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation device
- Patent number 8,426,835
- Issue date Apr 23, 2013
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle beam apparatus, and method of controlling the same
- Patent number 8,319,193
- Issue date Nov 27, 2012
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240379318
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE, ELECTRON GUN, AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20230352262
- Publication date Nov 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Source, Method of Manufacturing the Same, And Electron Bea...
- Publication number 20230317401
- Publication date Oct 5, 2023
- Hitachi High-Tech Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Gun and Charged Particle Beam System
- Publication number 20230178325
- Publication date Jun 8, 2023
- Hitachi High-Tech Corporation
- Masahiro FUKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Source, Electron Beam Device, and Method for Manufacturing...
- Publication number 20220415603
- Publication date Dec 29, 2022
- Hitachi High-Tech Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPARATUS AND METHOD FOR CONTROLLING ELECTRON BEAM AP...
- Publication number 20220351934
- Publication date Nov 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Erina KAWAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20220199349
- Publication date Jun 23, 2022
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMOELECTRIC FIELD EMISSION ELECTRON SOURCE AND ELECTRON BEAM APP...
- Publication number 20220037107
- Publication date Feb 3, 2022
- Hitachi High-Tech Corporation
- Soichiro Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE, METHOD FOR MANUFACTURING THE SAME, AND ELECTRON BE...
- Publication number 20210327674
- Publication date Oct 21, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20200090897
- Publication date Mar 19, 2020
- Hitachi High-Technologies Corporation
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Source and Electron Beam Device Using the Same
- Publication number 20190385809
- Publication date Dec 19, 2019
- Hitachi High-Technologies Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus
- Publication number 20190237289
- Publication date Aug 1, 2019
- Hitachi High-Technologies Corporation
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Field Emission Electron Source, Method for Manufacturing Same, and...
- Publication number 20190066966
- Publication date Feb 28, 2019
- Hitachi High-Technologies Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM APPARATUS
- Publication number 20180254173
- Publication date Sep 6, 2018
- Hitachi High-Technologies Corporation
- Souichi KATAGIRI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION PUMP AND CHARGED PARTICLE BEAM DEVICE USING THE SAME
- Publication number 20160233050
- Publication date Aug 11, 2016
- Hitachi, Ltd
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME
- Publication number 20130063029
- Publication date Mar 14, 2013
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE RADIATION DEVICE
- Publication number 20120085925
- Publication date Apr 12, 2012
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME
- Publication number 20110089336
- Publication date Apr 21, 2011
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS

Keigo Kasuya

Person

Patents Grantslast 30 patents

Electron source and charged particle beam device

Electron beam apparatus and method for controlling electron beam ap...

Thermoelectric field emission electron source and electron beam app...

Electron source, method for manufacturing the same, and electron be...

Charged particle beam device

Vacuum apparatus

Electron source and electron beam device using the same

Field emission electron source, method for manufacturing same, and...

Electron beam apparatus

Ion pump and charged particle beam device using the same

Charged particle beam apparatus, and method of controlling the same

Charged particle radiation device

Charged particle beam apparatus, and method of controlling the same

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE

ELECTRON SOURCE, ELECTRON GUN, AND CHARGED PARTICLE BEAM DEVICE

Electron Source, Method of Manufacturing the Same, And Electron Bea...

Charged Particle Gun and Charged Particle Beam System

Electron Source, Electron Beam Device, and Method for Manufacturing...

ELECTRON BEAM APPARATUS AND METHOD FOR CONTROLLING ELECTRON BEAM AP...

ELECTRON SOURCE AND CHARGED PARTICLE BEAM DEVICE

THERMOELECTRIC FIELD EMISSION ELECTRON SOURCE AND ELECTRON BEAM APP...

ELECTRON SOURCE, METHOD FOR MANUFACTURING THE SAME, AND ELECTRON BE...

CHARGED PARTICLE BEAM DEVICE

Electron Source and Electron Beam Device Using the Same

Electron Beam Apparatus

Field Emission Electron Source, Method for Manufacturing Same, and...

VACUUM APPARATUS

ION PUMP AND CHARGED PARTICLE BEAM DEVICE USING THE SAME

CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME

CHARGED PARTICLE RADIATION DEVICE

CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME