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KANAGAWA, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of testing a semiconductor device and suctioning a semicondu...
Patent number
8,759,119
Issue date
Jun 24, 2014
Fujitsu Semiconductor Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Method of testing a semiconductor device and suctioning a semicondu...
Patent number
8,404,496
Issue date
Mar 26, 2013
Fujitsu Semiconductor Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Method of fabricating semiconductor device
Patent number
7,556,985
Issue date
Jul 7, 2009
Fujitsu Microelectronics Limited
Norio Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having an alignment mark formed by the same ma...
Patent number
7,112,889
Issue date
Sep 26, 2006
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having a ball grid array and a fabrication pro...
Patent number
7,064,047
Issue date
Jun 20, 2006
Fujitsu Limited
Norio Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating a semiconductor device having a groove formed...
Patent number
6,987,054
Issue date
Jan 17, 2006
Fujitsu Limited
Norio Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having a ball grid array and a fabrication pro...
Patent number
6,784,542
Issue date
Aug 31, 2004
Fujitsu Limited
Norio Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe card and method of testing wafer having a plurality of semico...
Patent number
6,774,650
Issue date
Aug 10, 2004
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having a ball grid array and a fabrication pro...
Patent number
6,657,282
Issue date
Dec 2, 2003
Fujitsu Limited
Norio Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe card and method of testing wafer having a plurality of semico...
Patent number
6,563,330
Issue date
May 13, 2003
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Method of producing semiconductor devices having easy separability...
Patent number
6,511,620
Issue date
Jan 28, 2003
Fujitsu Limited
Toshimi Kawahara
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Mold for fabricating semiconductor devices
Patent number
6,471,501
Issue date
Oct 29, 2002
Fujitsu Limited
Yasuhiro Shinma
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Semiconductor device and method of production of the semiconductor...
Patent number
6,469,370
Issue date
Oct 22, 2002
Fujitsu Limited
Toshimi Kawahara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having a ball grid array and a fabrication pro...
Patent number
6,455,920
Issue date
Sep 24, 2002
Fujitsu Limited
Norio Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having improved electrical characteristics and...
Patent number
6,437,432
Issue date
Aug 20, 2002
Fujitsu Limited
Masamitsu Ikumo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device with flip chip bonding pads and manufacture th...
Patent number
6,218,281
Issue date
Apr 17, 2001
Fujitsu Limited
Eiji Watanabe
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF TESTING A SEMICONDUCTOR DEVICE AND SUCTIONING A SEMICONDU...
Publication number
20130171748
Publication date
Jul 4, 2013
FUJITSU SEMICONDUCTOR LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device having an alignment mark formed by the same ma...
Publication number
20060279003
Publication date
Dec 14, 2006
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Method of fabricating semiconductor device
Publication number
20060030127
Publication date
Feb 9, 2006
FUJITSU LIMITED
Norio Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having a ball grid array and a fabrication pro...
Publication number
20040259346
Publication date
Dec 23, 2004
FUJITSU LIMITED
Norio Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having a ball grid array and a fabrication pro...
Publication number
20040012088
Publication date
Jan 22, 2004
Fujitsu Limited,
Norio Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Probe card and method of testing wafer having a plurality of semico...
Publication number
20030160626
Publication date
Aug 28, 2003
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device having a ball grid array and a fabrication pro...
Publication number
20020089054
Publication date
Jul 11, 2002
FUJITSU LIMITED
Norio Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having a ball grid array and a fabrication pro...
Publication number
20020089040
Publication date
Jul 11, 2002
FIJITSU LIMITED
Norio Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having improved electrical characteristic and...
Publication number
20010023981
Publication date
Sep 27, 2001
Masamitsu Ikumo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING A BALL GRID ARRAY AND A FABRICATION PRO...
Publication number
20010011772
Publication date
Aug 9, 2001
FUJITSU LIMITED
NORIO FUKASAWA
H01 - BASIC ELECTRIC ELEMENTS