Kenji Yamaguchi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Trolley coupling structure
- Patent number 11,485,397
- Issue date Nov 1, 2022
- Nansin Co., Ltd
- Akinori Saito
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Polishing apparatus and polishing method
- Patent number 10,166,647
- Issue date Jan 1, 2019
- Ebara Corporation
- Tamami Takahashi
- B24 - GRINDING POLISHING
Information Patent Grant
Probe apparatus
- Patent number 9,562,942
- Issue date Feb 7, 2017
- Tokyo Electron Limited
- Eiichi Shinohara
- G01 - MEASURING TESTING
Information Patent Grant
Polishing apparatus and polishing method
- Patent number 9,517,544
- Issue date Dec 13, 2016
- Ebara Corporation
- Tamami Takahashi
- B24 - GRINDING POLISHING
Information Patent Grant
Substrate processing apparatus
- Patent number 9,287,158
- Issue date Mar 15, 2016
- Ebara Corporation
- Tamami Takahashi
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing apparatus and polishing method
- Patent number 8,986,069
- Issue date Mar 24, 2015
- Ebara Corporation
- Tamami Takahashi
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing apparatus and polishing method
- Patent number 8,187,055
- Issue date May 29, 2012
- Ebara Corporation
- Tamami Takahashi
- B24 - GRINDING POLISHING
Information Patent Grant
Semiconductor device
- Patent number 8,089,136
- Issue date Jan 3, 2012
- Renesas Electronics Corporation
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for polishing peripheral edge of semiconductor wafer
- Patent number 8,029,333
- Issue date Oct 4, 2011
- Ebara Corporation
- Tamami Takahashi
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing apparatus and substrate processing apparatus
- Patent number 7,862,402
- Issue date Jan 4, 2011
- Ebara Corporation
- Akihisa Hongo
- B24 - GRINDING POLISHING
Information Patent Grant
Semiconductor device having resistor elements and method for manufa...
- Patent number 7,821,078
- Issue date Oct 26, 2010
- Renesas Electronics Corporation
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing method and substrate processing apparatus
- Patent number 7,767,472
- Issue date Aug 3, 2010
- Ebara Corporation
- Atsushi Shigeta
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing apparatus and substrate processing apparatus
- Patent number 7,682,225
- Issue date Mar 23, 2010
- Ebara Corporation
- Akihisa Hongo
- B24 - GRINDING POLISHING
Information Patent Grant
Characteristic evaluation apparatus for insulated gate type transis...
- Patent number 7,480,598
- Issue date Jan 20, 2009
- Renesas Technology Corp.
- Kenji Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Substrate processing apparatus and substrate processing method
- Patent number 7,476,290
- Issue date Jan 13, 2009
- Ebara Corporation
- Takayuki Saito
- B08 - CLEANING
Information Patent Grant
Semiconductor substrate, field-effect transistor, and their manufac...
- Patent number 7,138,650
- Issue date Nov 21, 2006
- Sumitomo Mitsubishi Silicon Corporation
- Kazuki Mizushima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Production method for semiconductor substrate and production method...
- Patent number 7,056,789
- Issue date Jun 6, 2006
- Sumitomo Mitsubishi Silicon Corporation
- Ichiro Shiono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with resistor elements formed on insulating film
- Patent number 7,045,865
- Issue date May 16, 2006
- Renesas Technology Corp.
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, method and pattern for evaluating semiconductor device c...
- Patent number 6,779,160
- Issue date Aug 17, 2004
- Renesas Technology Corp.
- Hiroyuki Amishiro
- G01 - MEASURING TESTING
Information Patent Grant
Characteristic extraction device, characteristic evaluation device,...
- Patent number 6,735,558
- Issue date May 11, 2004
- Renesas Technology Corp.
- Kenji Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characteristic evaluation apparatus for insulated gate type transis...
- Patent number 6,727,724
- Issue date Apr 27, 2004
- Renesas Technology Corp.
- Kenji Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Characteristic evaluation apparatus for insulated gate type transis...
- Patent number 6,649,430
- Issue date Nov 18, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical material and optical element using the same
- Patent number 6,569,534
- Issue date May 27, 2003
- Mitsubishi Materials Corporation
- Kenji Yamaguchi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Characteristic evaluation apparatus for insulated gate type transis...
- Patent number 6,559,672
- Issue date May 6, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor substrate, field effect transistor, method of forming...
- Patent number 6,525,338
- Issue date Feb 25, 2003
- Mitsubishi Materials Corporation
- Kazuki Mizushima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, method and pattern for evaluating semiconductor device c...
- Patent number 6,518,592
- Issue date Feb 11, 2003
- Mitsubushi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- G01 - MEASURING TESTING
Information Patent Grant
Device for evaluating characteristic of insulated gate transistor
- Patent number 6,407,573
- Issue date Jun 18, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Silicon-and-nitrogen-containing luminescent substance, method for f...
- Patent number 6,399,225
- Issue date Jun 4, 2002
- Mitsubishi Materials Corporation
- Kenji Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characteristic evaluation apparatus for insulated gate type transis...
- Patent number 6,373,274
- Issue date Apr 16, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Characteristic evaluation apparatus for insulated gate type transis...
- Patent number 6,169,415
- Issue date Jan 2, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Yamaguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TROLLEY COUPLING STRUCTURE
- Publication number 20200207395
- Publication date Jul 2, 2020
- NANSIN CO., LTD.
- Akinori Saito
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Application
POLISHING APPARATUS AND POLISHING METHOD
- Publication number 20170072528
- Publication date Mar 16, 2017
- EBARA CORPORATION
- Tamami TAKAHASHI
- B24 - GRINDING POLISHING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS
- Publication number 20160172221
- Publication date Jun 16, 2016
- EBARA CORPORATION
- Tamami TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POLISHING APPARATUS AND POLISHING METHOD
- Publication number 20150104620
- Publication date Apr 16, 2015
- EBARA CORPORATION
- Tamami TAKAHASHI
- B24 - GRINDING POLISHING
Information Patent Application
PROBE APPARATUS
- Publication number 20150015285
- Publication date Jan 15, 2015
- TOKYO ELECTRON LIMITED
- Eiichi Shinohara
- G01 - MEASURING TESTING
Information Patent Application
POLISHING APPARATUS AND POLISHING METHOD
- Publication number 20120208437
- Publication date Aug 16, 2012
- Tamami TAKAHASHI
- B24 - GRINDING POLISHING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20110012231
- Publication date Jan 20, 2011
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
- Publication number 20100255757
- Publication date Oct 7, 2010
- Atsushi Shigeta
- B24 - GRINDING POLISHING
Information Patent Application
POLISHING APPARATUS AND SUBSTRATE PROCESSING APPARATUS
- Publication number 20100136886
- Publication date Jun 3, 2010
- Akihisa Hongo
- B24 - GRINDING POLISHING
Information Patent Application
Electric heating device and manufacturing method thereof
- Publication number 20090314764
- Publication date Dec 24, 2009
- CALSONIC KANSEI CORPORATION
- Kazuaki Mori
- F24 - HEATING RANGES VENTILATING
Information Patent Application
Polishing apparatus and polishing method
- Publication number 20090142992
- Publication date Jun 4, 2009
- EBARA CORPORATION
- Tamami Takahashi
- B24 - GRINDING POLISHING
Information Patent Application
Polishing apparatus and substrate processing apparatus
- Publication number 20090117828
- Publication date May 7, 2009
- Akihisa Hongo
- B24 - GRINDING POLISHING
Information Patent Application
Substrate processing apparatus and substrate processing method
- Publication number 20090090397
- Publication date Apr 9, 2009
- Takayuki Saito
- B08 - CLEANING
Information Patent Application
DEVICE FOR AND METHOD OF POLISHING PERIPHERAL EDGE OF SEMICONDUCTOR...
- Publication number 20090093192
- Publication date Apr 9, 2009
- EBARA CORPORATION
- Tamami Takahashi
- B24 - GRINDING POLISHING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS
- Publication number 20090017733
- Publication date Jan 15, 2009
- EBARA CORPORATION
- Tamami Takahashi
- B24 - GRINDING POLISHING
Information Patent Application
Substrate Processing Apparatus
- Publication number 20080200100
- Publication date Aug 21, 2008
- EBARA CORPORATION
- Tamami Takahashi
- B24 - GRINDING POLISHING
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20080116526
- Publication date May 22, 2008
- Renesas Technology Corp.
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARACTERISTIC EVALUATION APPARATUS FOR INSULATED GATE TYPE TRANSIS...
- Publication number 20080048707
- Publication date Feb 28, 2008
- Renesas Technology Corp.
- Kenji Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Buffer member
- Publication number 20080024972
- Publication date Jan 31, 2008
- Polymatech Co., Ltd.
- Kenji Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Substrate processing method and substrate processing apparatus
- Publication number 20070287364
- Publication date Dec 13, 2007
- Atsushi Shigeta
- B24 - GRINDING POLISHING
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20060175679
- Publication date Aug 10, 2006
- Renesas Technology Corp.
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Substrate processing method and substrate processing apparatus
- Publication number 20060019417
- Publication date Jan 26, 2006
- Atsushi Shigeta
- B24 - GRINDING POLISHING
Information Patent Application
Substrate processing apparatus and substrate processing method
- Publication number 20050092351
- Publication date May 5, 2005
- Takayuki Saito
- B08 - CLEANING
Information Patent Application
Semiconductor substrate, field-effect transistor, and their manufac...
- Publication number 20040251458
- Publication date Dec 16, 2004
- Kazuki Mizushima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Production method for semiconductor substrate and production method...
- Publication number 20040245552
- Publication date Dec 9, 2004
- Ichiro Shiono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Characteristic evaluation apparatus for insulated gate type transis...
- Publication number 20040098681
- Publication date May 20, 2004
- Renesas Technology Corp.
- Kenji Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, method and pattern for evaluating semiconductor device c...
- Publication number 20030126567
- Publication date Jul 3, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- G01 - MEASURING TESTING
Information Patent Application
Characteristic evaluation apparatus for insulated gate type transis...
- Publication number 20030113946
- Publication date Jun 19, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of arranging transistors for formin...
- Publication number 20030030075
- Publication date Feb 13, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device evaluation method and apparatus, semiconductor...
- Publication number 20020167034
- Publication date Nov 14, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS

Kenji Yamaguchi

Person

Patents Grantslast 30 patents

Trolley coupling structure

Polishing apparatus and polishing method

Probe apparatus

Polishing apparatus and polishing method

Substrate processing apparatus

Polishing apparatus and polishing method

Polishing apparatus and polishing method

Semiconductor device

Device for polishing peripheral edge of semiconductor wafer

Polishing apparatus and substrate processing apparatus

Semiconductor device having resistor elements and method for manufa...

Substrate processing method and substrate processing apparatus

Polishing apparatus and substrate processing apparatus

Characteristic evaluation apparatus for insulated gate type transis...

Substrate processing apparatus and substrate processing method

Semiconductor substrate, field-effect transistor, and their manufac...

Production method for semiconductor substrate and production method...

Semiconductor device with resistor elements formed on insulating film

Apparatus, method and pattern for evaluating semiconductor device c...

Characteristic extraction device, characteristic evaluation device,...

Characteristic evaluation apparatus for insulated gate type transis...

Characteristic evaluation apparatus for insulated gate type transis...

Optical material and optical element using the same

Characteristic evaluation apparatus for insulated gate type transis...

Semiconductor substrate, field effect transistor, method of forming...

Apparatus, method and pattern for evaluating semiconductor device c...

Device for evaluating characteristic of insulated gate transistor

Silicon-and-nitrogen-containing luminescent substance, method for f...

Characteristic evaluation apparatus for insulated gate type transis...

Characteristic evaluation apparatus for insulated gate type transis...

Patents Applicationslast 30 patents

TROLLEY COUPLING STRUCTURE

POLISHING APPARATUS AND POLISHING METHOD

SUBSTRATE PROCESSING APPARATUS

POLISHING APPARATUS AND POLISHING METHOD

PROBE APPARATUS

POLISHING APPARATUS AND POLISHING METHOD

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS

POLISHING APPARATUS AND SUBSTRATE PROCESSING APPARATUS

Electric heating device and manufacturing method thereof

Polishing apparatus and polishing method

Polishing apparatus and substrate processing apparatus

Substrate processing apparatus and substrate processing method

DEVICE FOR AND METHOD OF POLISHING PERIPHERAL EDGE OF SEMICONDUCTOR...

SUBSTRATE PROCESSING APPARATUS

Substrate Processing Apparatus

Semiconductor device and method for manufacturing the same

CHARACTERISTIC EVALUATION APPARATUS FOR INSULATED GATE TYPE TRANSIS...

Buffer member

Substrate processing method and substrate processing apparatus

Semiconductor device and method for manufacturing the same

Substrate processing method and substrate processing apparatus

Substrate processing apparatus and substrate processing method

Semiconductor substrate, field-effect transistor, and their manufac...

Production method for semiconductor substrate and production method...

Characteristic evaluation apparatus for insulated gate type transis...

Apparatus, method and pattern for evaluating semiconductor device c...

Characteristic evaluation apparatus for insulated gate type transis...

Semiconductor device and method of arranging transistors for formin...

Semiconductor device evaluation method and apparatus, semiconductor...