Kenneth P. Parker

Person

Fort Collins, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for manufacturing and probing test probe acces...
- Patent number 7,518,384
- Issue date Apr 14, 2009
- Agilent Technologies, Inc.
- Glen E Leinbach
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for manufacturing and probing printed circuit...
- Patent number 7,504,589
- Issue date Mar 17, 2009
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Boundary-Scan methods and apparatus
- Patent number 7,437,638
- Issue date Oct 14, 2008
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for non-contact testing and diagnosing of ope...
- Patent number 7,362,106
- Issue date Apr 22, 2008
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining probing locations for a printe...
- Patent number 7,325,219
- Issue date Jan 29, 2008
- Agilent Technologies, Inc.
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Grant
Printed circuit board test access point structures and method for m...
- Patent number 7,307,222
- Issue date Dec 11, 2007
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for unpowered testing of open connections on...
- Patent number 7,307,426
- Issue date Dec 11, 2007
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for engineering a testability interposer for t...
- Patent number 7,307,427
- Issue date Dec 11, 2007
- Agilent Technologies, Inc.
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Grant
Method for non-contact testing of marginal integrated circuit conne...
- Patent number 7,295,031
- Issue date Nov 13, 2007
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for a twisting fixture probe for probing test...
- Patent number 7,259,576
- Issue date Aug 21, 2007
- Agilent Technologies, Inc.
- Kenneth P Parker
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for non-contact testing and diagnosing of ina...
- Patent number 7,224,169
- Issue date May 29, 2007
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method for non-contact testing of fixed and inaccessible connection...
- Patent number 7,208,957
- Issue date Apr 24, 2007
- Agilent Technologies, Inc.
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for layout independent test point placement on...
- Patent number 7,190,157
- Issue date Mar 13, 2007
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for implicitly encoding preferred probing locatio...
- Patent number 7,187,165
- Issue date Mar 6, 2007
- Agilent Technologies, Inc.
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Grant
Methods for testing continuity of electrical paths through connecto...
- Patent number 7,170,298
- Issue date Jan 30, 2007
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for a wobble fixture probe for probing test ac...
- Patent number 7,161,369
- Issue date Jan 9, 2007
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for minimizing current surges during integrat...
- Patent number 7,137,052
- Issue date Nov 14, 2006
- Verigy IPco
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for non-contact testing and diagnosing electri...
- Patent number 7,123,022
- Issue date Oct 17, 2006
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Test structure embedded in a shipping and handling cover for integr...
- Patent number 7,068,039
- Issue date Jun 27, 2006
- Agilent Technologies, Inc.
- Kenneth P Parker
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for diagnosing defect locations in electrical...
- Patent number 6,960,917
- Issue date Nov 1, 2005
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for characterizing board test coverage
- Patent number 6,948,140
- Issue date Sep 20, 2005
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing continuity of electrical paths th...
- Patent number 6,933,730
- Issue date Aug 23, 2005
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Methods for predicting board test coverage
- Patent number 6,895,565
- Issue date May 17, 2005
- Agilent Technologies, Inc.
- Kenneth P Parker
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for characterizing board test coverage
- Patent number 6,792,385
- Issue date Sep 14, 2004
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of boundary scan testing for AC-coupled differ...
- Patent number 6,763,486
- Issue date Jul 13, 2004
- Agilent Technologies, Inc.
- Benny W H Lai
- G01 - MEASURING TESTING
Information Patent Grant
Boundary-scan testing of opto-electronic devices
- Patent number 6,744,256
- Issue date Jun 1, 2004
- Agilent Technologies, Inc.
- Kenneth Paul Parker
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for electrolytic bare board testing
- Patent number 6,452,410
- Issue date Sep 17, 2002
- Agilent Technologies, Inc.
- Kenneth P Parker
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism and display for boundary-scan debugging information
- Patent number 6,389,565
- Issue date May 14, 2002
- Agilent Technologies, Inc.
- Heather M. Ryan
- G01 - MEASURING TESTING
Information Patent Grant
Post-mission test method for checking the integrity of a boundary s...
- Patent number 6,243,843
- Issue date Jun 5, 2001
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Development of automated digital libraries for in-circuit testing o...
- Patent number 6,243,853
- Issue date Jun 5, 2001
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and apparatus using one or more supernodes when testing for...
- Publication number 20080315892
- Publication date Dec 25, 2008
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing one or more differential signalin...
- Publication number 20080297168
- Publication date Dec 4, 2008
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method for improving a printed circuit board development cycle
- Publication number 20080148208
- Publication date Jun 19, 2008
- Chris R. Jacobsen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and apparatus for manufacturing and probing test probe acces...
- Publication number 20070018663
- Publication date Jan 25, 2007
- Glen E. Leinbach
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for engineering a testability interposer for t...
- Publication number 20070018672
- Publication date Jan 25, 2007
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for unpowered testing of open connections on...
- Publication number 20070013383
- Publication date Jan 18, 2007
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Non-Contact Testing and Diagnosing Electri...
- Publication number 20070007978
- Publication date Jan 11, 2007
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for non-contact testing and diagnosing of ope...
- Publication number 20070001686
- Publication date Jan 4, 2007
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for a twisting fixture probe for probing test...
- Publication number 20060202675
- Publication date Sep 14, 2006
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method for non-contact testing of fixed and inaccessible connection...
- Publication number 20060197539
- Publication date Sep 7, 2006
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining probing locations for a printe...
- Publication number 20060192579
- Publication date Aug 31, 2006
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
Printed circuit board development cycle using probe location automa...
- Publication number 20060129955
- Publication date Jun 15, 2006
- Chris R. Jacobsen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and system for implicitly encoding preferred probing locatio...
- Publication number 20060125496
- Publication date Jun 15, 2006
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for a wobble fixture probe for probing test ac...
- Publication number 20060103405
- Publication date May 18, 2006
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for a twisting fixture probe for probing test...
- Publication number 20060103397
- Publication date May 18, 2006
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for non-contact testing and diagnosing of ina...
- Publication number 20060103391
- Publication date May 18, 2006
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for manufacturing and probing printed circuit...
- Publication number 20060097737
- Publication date May 11, 2006
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for layout independent test point placement on...
- Publication number 20060087337
- Publication date Apr 27, 2006
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing and diagnosing electrical paths th...
- Publication number 20050253616
- Publication date Nov 17, 2005
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for non-contact testing and diagnosing electri...
- Publication number 20050242824
- Publication date Nov 3, 2005
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Test structure embedded in a shipping and handling cover for integr...
- Publication number 20050242823
- Publication date Nov 3, 2005
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Methods for testing continuity of electrical paths through connecto...
- Publication number 20050242826
- Publication date Nov 3, 2005
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for diagnosing defect locations in electrical...
- Publication number 20050099186
- Publication date May 12, 2005
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing continuity of electrical paths th...
- Publication number 20050077907
- Publication date Apr 14, 2005
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Printed circuit board test access point structures and method for m...
- Publication number 20050061540
- Publication date Mar 24, 2005
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Boundary-scan methods and apparatus
- Publication number 20040093543
- Publication date May 13, 2004
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Methods for predicting board test coverage
- Publication number 20040068702
- Publication date Apr 8, 2004
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for characterizing board test coverage
- Publication number 20040044498
- Publication date Mar 4, 2004
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for characterizing board test coverage
- Publication number 20040044973
- Publication date Mar 4, 2004
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Boundary-scan testing of opto-electronic devices
- Publication number 20030080750
- Publication date May 1, 2003
- Kenneth Paul Parker
- G01 - MEASURING TESTING

Kenneth P. Parker

Person

Patents Grantslast 30 patents

Method and apparatus for manufacturing and probing test probe acces...

Method and apparatus for manufacturing and probing printed circuit...

Boundary-Scan methods and apparatus

Methods and apparatus for non-contact testing and diagnosing of ope...

Method and apparatus for determining probing locations for a printe...

Printed circuit board test access point structures and method for m...

Methods and apparatus for unpowered testing of open connections on...

Method and apparatus for engineering a testability interposer for t...

Method for non-contact testing of marginal integrated circuit conne...

Method and apparatus for a twisting fixture probe for probing test...

Methods and apparatus for non-contact testing and diagnosing of ina...

Method for non-contact testing of fixed and inaccessible connection...

Method and apparatus for layout independent test point placement on...

Method and system for implicitly encoding preferred probing locatio...

Methods for testing continuity of electrical paths through connecto...

Method and apparatus for a wobble fixture probe for probing test ac...

Methods and apparatus for minimizing current surges during integrat...

Method and apparatus for non-contact testing and diagnosing electri...

Test structure embedded in a shipping and handling cover for integr...

Methods and apparatus for diagnosing defect locations in electrical...

Methods and apparatus for characterizing board test coverage

Methods and apparatus for testing continuity of electrical paths th...

Methods for predicting board test coverage

Methods and apparatus for characterizing board test coverage

Method and apparatus of boundary scan testing for AC-coupled differ...

Boundary-scan testing of opto-electronic devices

Apparatus and method for electrolytic bare board testing

Mechanism and display for boundary-scan debugging information

Post-mission test method for checking the integrity of a boundary s...

Development of automated digital libraries for in-circuit testing o...

Patents Applicationslast 30 patents

Methods and apparatus using one or more supernodes when testing for...

Methods and apparatus for testing one or more differential signalin...

Method for improving a printed circuit board development cycle

Method and apparatus for manufacturing and probing test probe acces...

Method and apparatus for engineering a testability interposer for t...

Methods and apparatus for unpowered testing of open connections on...

Method and Apparatus for Non-Contact Testing and Diagnosing Electri...

Methods and apparatus for non-contact testing and diagnosing of ope...

Method and apparatus for a twisting fixture probe for probing test...

Method for non-contact testing of fixed and inaccessible connection...

Method and apparatus for determining probing locations for a printe...

Printed circuit board development cycle using probe location automa...

Method and system for implicitly encoding preferred probing locatio...

Method and apparatus for a wobble fixture probe for probing test ac...

Method and apparatus for a twisting fixture probe for probing test...

Methods and apparatus for non-contact testing and diagnosing of ina...

Method and apparatus for manufacturing and probing printed circuit...

Method and apparatus for layout independent test point placement on...

Method and apparatus for testing and diagnosing electrical paths th...

Method and apparatus for non-contact testing and diagnosing electri...

Test structure embedded in a shipping and handling cover for integr...

Methods for testing continuity of electrical paths through connecto...

Methods and apparatus for diagnosing defect locations in electrical...

Methods and apparatus for testing continuity of electrical paths th...

Printed circuit board test access point structures and method for m...

Boundary-scan methods and apparatus

Methods for predicting board test coverage

Methods and apparatus for characterizing board test coverage

Methods and apparatus for characterizing board test coverage

Boundary-scan testing of opto-electronic devices