Kewei Zuo

Person

Xinbei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Machine learning on overlay management
- Patent number 11,626,304
- Issue date Apr 11, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tzu-Cheng Lin
- G05 - CONTROLLING REGULATING
Information Patent Grant
Machine learning on overlay virtual metrology
- Patent number 10,964,566
- Issue date Mar 30, 2021
- Taiwan Semiconductor Manufacturing Go., Ltd.
- Tzu-Cheng Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clustering for prediction models in process control and for optimal...
- Patent number 10,054,938
- Issue date Aug 21, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jung Cheng Ko
- G05 - CONTROLLING REGULATING
Information Patent Grant
Temperature controlled loadlock chamber
- Patent number 9,698,030
- Issue date Jul 4, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Hsien Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Near non-adaptive virtual metrology and chamber control
- Patent number 9,588,505
- Issue date Mar 7, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzu-Yu Wang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Die-tracing in integrated circuit manufacturing and packaging
- Patent number 9,508,653
- Issue date Nov 29, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kewei Zuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for automatic quality control for assembly line p...
- Patent number 9,390,491
- Issue date Jul 12, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kewei Zuo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Packaging methods, material dispensing methods and apparatuses, and...
- Patent number 9,390,060
- Issue date Jul 12, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien Rhone Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Preventing contamination in integrated circuit manufacturing lines
- Patent number 9,177,843
- Issue date Nov 3, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Ming Sung
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
System and method for through silicon via yield
- Patent number 9,153,506
- Issue date Oct 6, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien Rhone Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clustering for prediction models in process control and for optimal...
- Patent number 9,037,279
- Issue date May 19, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Francis Ko
- G05 - CONTROLLING REGULATING
Information Patent Grant
Solder joint reflow process for reducing packaging failure rate
- Patent number 9,010,617
- Issue date Apr 21, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen-Hua Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method to improve package and 3DIC yield in underfill pr...
- Patent number 8,945,983
- Issue date Feb 3, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yen-Hsin Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature controlled loadlock chamber
- Patent number 8,905,124
- Issue date Dec 9, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Hsien Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic virtual metrology for semiconductor wafer result prediction
- Patent number 8,682,466
- Issue date Mar 25, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Francis Ko
- G05 - CONTROLLING REGULATING
Information Patent Grant
Near non-adaptive virtual metrology and chamber control
- Patent number 8,433,434
- Issue date Apr 30, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Amy Wang
- G05 - CONTROLLING REGULATING
Information Patent Grant
System for extraction of key process parameters from fault detectio...
- Patent number 7,974,728
- Issue date Jul 5, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Hsien Lin
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for thinning a substrate
- Patent number 7,972,969
- Issue date Jul 5, 2011
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ku-Feng Yang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING ON OVERLAY MANAGEMENT
- Publication number 20230223287
- Publication date Jul 13, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tzu-Cheng LIN
- G05 - CONTROLLING REGULATING
Information Patent Application
MACHINE LEARNING ON OVERLAY MANAGEMENT
- Publication number 20220269184
- Publication date Aug 25, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tzu-Cheng LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING ON OVERLAY MANAGEMENT
- Publication number 20210175105
- Publication date Jun 10, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tzu-Cheng LIN
- G05 - CONTROLLING REGULATING
Information Patent Application
MACHINE LEARNING ON OVERLAY VIRTUAL METROLOGY
- Publication number 20200006102
- Publication date Jan 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tzu-Cheng Lin
- G05 - CONTROLLING REGULATING
Information Patent Application
Clustering for Prediction Models in Process Control and for Optimal...
- Publication number 20150241876
- Publication date Aug 27, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jung Cheng Ko
- G05 - CONTROLLING REGULATING
Information Patent Application
Temperature Controlled Loadlock Chamber
- Publication number 20150132100
- Publication date May 14, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Hsien Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Die-Tracing in Integrated Circuit Manufacturing and Packaging
- Publication number 20150079734
- Publication date Mar 19, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kewei Zuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC OPTICAL APPEARANCE INSPECTION BY LINE SCAN APPARATUS
- Publication number 20150051860
- Publication date Feb 19, 2015
- Taiwan Semiconductor Manufacturing Co., LTD
- Kewei ZUO
- G07 - CHECKING-DEVICES
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATIC QUALITY CONTROL FOR ASSEMBLY LINE P...
- Publication number 20140210982
- Publication date Jul 31, 2014
- Taiwan Semiconductor Manufacturing Co., LTD
- Kewei ZUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method to Improve Package and 3DIC Yield in Underfill Pr...
- Publication number 20140183760
- Publication date Jul 3, 2014
- Yen-Hsin Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Near Non-Adaptive Virtual Metrology and Chamber Control
- Publication number 20140088747
- Publication date Mar 27, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzu-Yu Wang
- G05 - CONTROLLING REGULATING
Information Patent Application
System and Method for Through Silicon Via Yield
- Publication number 20140011301
- Publication date Jan 9, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien Rhone Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Packaging Methods, Material Dispensing Methods and Apparatuses, and...
- Publication number 20130244346
- Publication date Sep 19, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien Rhone Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Solder Joint Reflow Process for Reducing Packaging Failure Rate
- Publication number 20120175403
- Publication date Jul 12, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen-Hua Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Clustering for Prediction Models in Process Control and for Optimal...
- Publication number 20110060441
- Publication date Mar 10, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Francis Ko
- G05 - CONTROLLING REGULATING
Information Patent Application
Near Non-Adaptive Virtual Metrology and Chamber Control
- Publication number 20110009998
- Publication date Jan 13, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Amy Wang
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND APPARATUS FOR THINNING A SUBSTRATE
- Publication number 20090227047
- Publication date Sep 10, 2009
- Taiwan Semiconductor Manufacturing Co., LTD
- Ku-Feng Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Temperature Controlled Loadlock Chamber
- Publication number 20090000769
- Publication date Jan 1, 2009
- Chun-Hsien Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Preventing Contamination in Integrated Circuit Manufacturing Lines
- Publication number 20080304944
- Publication date Dec 11, 2008
- Chien-Ming Sung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXTRACTION OF KEY PROCESS PARAMETER
- Publication number 20080275585
- Publication date Nov 6, 2008
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Hsien Lin
- G05 - CONTROLLING REGULATING
Information Patent Application
Novel Methodology To Realize Automatic Virtual Metrology
- Publication number 20080275586
- Publication date Nov 6, 2008
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Francis Ko
- G05 - CONTROLLING REGULATING

Person

Patents Grantslast 30 patents

Machine learning on overlay management

Machine learning on overlay virtual metrology

Clustering for prediction models in process control and for optimal...

Temperature controlled loadlock chamber

Near non-adaptive virtual metrology and chamber control

Die-tracing in integrated circuit manufacturing and packaging

System and method for automatic quality control for assembly line p...

Packaging methods, material dispensing methods and apparatuses, and...

Preventing contamination in integrated circuit manufacturing lines

System and method for through silicon via yield

Clustering for prediction models in process control and for optimal...

Solder joint reflow process for reducing packaging failure rate

System and method to improve package and 3DIC yield in underfill pr...

Temperature controlled loadlock chamber

Automatic virtual metrology for semiconductor wafer result prediction

Near non-adaptive virtual metrology and chamber control

System for extraction of key process parameters from fault detectio...

Method and apparatus for thinning a substrate

Patents Applicationslast 30 patents

MACHINE LEARNING ON OVERLAY MANAGEMENT

MACHINE LEARNING ON OVERLAY MANAGEMENT

MACHINE LEARNING ON OVERLAY MANAGEMENT

MACHINE LEARNING ON OVERLAY VIRTUAL METROLOGY

Clustering for Prediction Models in Process Control and for Optimal...

Temperature Controlled Loadlock Chamber

Die-Tracing in Integrated Circuit Manufacturing and Packaging

AUTOMATIC OPTICAL APPEARANCE INSPECTION BY LINE SCAN APPARATUS

SYSTEM AND METHOD FOR AUTOMATIC QUALITY CONTROL FOR ASSEMBLY LINE P...

System and Method to Improve Package and 3DIC Yield in Underfill Pr...

Near Non-Adaptive Virtual Metrology and Chamber Control

System and Method for Through Silicon Via Yield

Packaging Methods, Material Dispensing Methods and Apparatuses, and...

Solder Joint Reflow Process for Reducing Packaging Failure Rate

Clustering for Prediction Models in Process Control and for Optimal...

Near Non-Adaptive Virtual Metrology and Chamber Control

METHOD AND APPARATUS FOR THINNING A SUBSTRATE

Temperature Controlled Loadlock Chamber

Preventing Contamination in Integrated Circuit Manufacturing Lines

EXTRACTION OF KEY PROCESS PARAMETER

Novel Methodology To Realize Automatic Virtual Metrology