Kimball M. Watson

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Inline measurement of through-silicon via depth
- Patent number 9,865,514
- Issue date Jan 9, 2018
- GLOBALFOUNDRIES Inc.
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Matching of bipolar transistor pair through electrical stress
- Patent number 9,568,538
- Issue date Feb 14, 2017
- International Business Machines Corporation
- Ephrem G Gebreselasie
- G01 - MEASURING TESTING
Information Patent Grant
Micro-electro-mechanical system (MEMS) structure and design structures
- Patent number 9,496,110
- Issue date Nov 15, 2016
- GLOBALFOUNDRIES Inc.
- Ward A. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inline measurement of through-silicon via depth
- Patent number 9,059,051
- Issue date Jun 16, 2015
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating thermally controlled refractory metal resistor
- Patent number 8,765,568
- Issue date Jul 1, 2014
- International Business Machines Corporation
- Joseph M. Lukaitis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming and programming an electronically programmable r...
- Patent number 8,686,478
- Issue date Apr 1, 2014
- International Business Machines Corporation
- Benjamin T. Voegeli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermally controlled refractory metal resistor
- Patent number 8,592,947
- Issue date Nov 26, 2013
- International Business Machines Corporation
- Joseph M. Lukaitis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin film resistors and methods of manufacture
- Patent number 8,486,796
- Issue date Jul 16, 2013
- International Business Machines Corporation
- David L. Harmon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal wiring structure for integration with through substrate vias
- Patent number 8,234,606
- Issue date Jul 31, 2012
- International Business Machines Corporation
- David S. Collins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optically transparent wires for secure circuits and methods of maki...
- Patent number 8,207,609
- Issue date Jun 26, 2012
- International Business Machines Corporation
- Stephen Peter Ayotte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically programmable resistor
- Patent number 8,125,019
- Issue date Feb 28, 2012
- International Business Machines Corporation
- Benjamin T. Voegeli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC interconnect for high current
- Patent number 8,089,160
- Issue date Jan 3, 2012
- International Business Machines Corporation
- Ping-Chuan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optically transparent wires for secure circuits and methods of maki...
- Patent number 8,017,514
- Issue date Sep 13, 2011
- International Business Machines Corporation
- Stephen Peter Ayotte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Programming of laser fuse
- Patent number 7,981,732
- Issue date Jul 19, 2011
- International Business Machines Corporation
- Dinesh A. Badami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal wiring structure for integration with through substrate vias
- Patent number 7,968,975
- Issue date Jun 28, 2011
- International Business Machines Corporation
- David S. Collins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for ballast resistor
- Patent number 7,919,830
- Issue date Apr 5, 2011
- International Business Machines Corporation
- Douglas D. Coolbaugh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge seal for thru-silicon-via technology
- Patent number 7,919,834
- Issue date Apr 5, 2011
- International Business Machines Corporation
- Robert Edgar Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-line depth measurement for thru silicon via
- Patent number 7,904,273
- Issue date Mar 8, 2011
- International Business Machines Corporation
- Qizhi Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structures including means for lateral current carrying capability...
- Patent number 7,904,868
- Issue date Mar 8, 2011
- International Business Machines Corporation
- Natalie Barbara Feilchenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for lateral current carrying capability improvement in semi...
- Patent number 7,453,151
- Issue date Nov 18, 2008
- International Business Machines Corporation
- Natalie Barbara Feilchenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and programming of laser fuse
- Patent number 7,384,824
- Issue date Jun 10, 2008
- International Business Machines Corporation
- Dinesh A. Badami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and programming of laser fuse
- Patent number 7,064,409
- Issue date Jun 20, 2006
- International Business Machines Corporation
- Dinesh A. Badami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to calculate hot-electron test voltage differential for asse...
- Patent number 5,634,001
- Issue date May 27, 1997
- International Business Machines Corporation
- Steven W. Mittl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to assess electromigration and hot electron reliability for...
- Patent number 5,533,197
- Issue date Jul 2, 1996
- International Business Machines Corporation
- David E. Moran
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INLINE MEASUREMENT OF THROUGH-SILICON VIA DEPTH
- Publication number 20150187667
- Publication date Jul 2, 2015
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRO-ELECTRO-MECHANICAL SYSTEM (MEMS) STRUCTURE AND DESIGN STRUCTURES
- Publication number 20140368292
- Publication date Dec 18, 2014
- Ward A. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INLINE MEASUREMENT OF THROUGH-SILICON VIA DEPTH
- Publication number 20140332973
- Publication date Nov 13, 2014
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMALLY CONTROLLED REFRACTORY METAL RESISTOR
- Publication number 20140038381
- Publication date Feb 6, 2014
- International Business Machines Corporation
- Joseph M. Lukaitis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMALLY CONTROLLED REFRACTORY METAL RESISTOR
- Publication number 20120146186
- Publication date Jun 14, 2012
- International Business Machines Corporation
- Joseph M. Lukaitis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THIN FILM RESISTORS AND METHODS OF MANUFACTURE
- Publication number 20120126370
- Publication date May 24, 2012
- International Business Machines Corporation
- David L. HARMON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING AND PROGRAMMING AN ELECTRONICALLY PROGRAMMABLE R...
- Publication number 20120058611
- Publication date Mar 8, 2012
- International Business Machines Corporation
- Benjamin T. Voegeli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICALLY TRANSPARENT WIRES FOR SECURE CIRCUITS AND METHODS OF MAKI...
- Publication number 20110284280
- Publication date Nov 24, 2011
- International Business Machines Corporation
- Stephen Peter Ayotte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL WIRING STRUCTURE FOR INTEGRATION WITH THROUGH SUBSTRATE VIAS
- Publication number 20110185330
- Publication date Jul 28, 2011
- International Business Machines Corporation
- David S. Collins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LINE DEPTH MEASUREMENT OF THRU SILICON VIA
- Publication number 20100210043
- Publication date Aug 19, 2010
- International Business Machines Corporation
- Qizhi Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL WIRING STRUCTURE FOR INTEGRATION WITH THROUGH SUBSTRATE VIAS
- Publication number 20100032809
- Publication date Feb 11, 2010
- International Business Machines Corporation
- David S. Collins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICALLY TRANSPARENT WIRES FOR SECURE CIRCUITS AND METHODS OF MAKI...
- Publication number 20090273084
- Publication date Nov 5, 2009
- Stephen Peter Ayotte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND STRUCTURE FOR BALLAST RESISTOR
- Publication number 20090253239
- Publication date Oct 8, 2009
- International Business Machines Corporation
- Douglas D. Coolbaugh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IC INTERCONNECT FOR HIGH CURRENT
- Publication number 20090152724
- Publication date Jun 18, 2009
- International Business Machines Corporation
- Ping-Chuan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EDGE SEAL FOR THRU-SILICON-VIA TECHNOLOGY
- Publication number 20090140395
- Publication date Jun 4, 2009
- International Business Machines Corporation
- Robert Edgar Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESIGN STRUCTURES INCLUDING MEANS FOR LATERAL CURRENT CARRYING CAPA...
- Publication number 20090106726
- Publication date Apr 23, 2009
- Natalie Barbara Feilchenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERAL CURRENT CARRYING CAPABILITY IMPROVEMENT IN SEMICONDUCTOR DE...
- Publication number 20080308940
- Publication date Dec 18, 2008
- Natalie Barbara Feilchenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROGRAMMING OF LASER FUSE
- Publication number 20080194064
- Publication date Aug 14, 2008
- Dinesh A. Badami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR LATERAL CURRENT CARRYING CAPABILITY IMPROVEMENT IN SEMI...
- Publication number 20080122096
- Publication date May 29, 2008
- Natalie Barbara Feilchenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICALLY PROGRAMMABLE RESISTOR AND METHODS
- Publication number 20080093659
- Publication date Apr 24, 2008
- Benjamin T. Voegeli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and programming of laser fuse
- Publication number 20060145291
- Publication date Jul 6, 2006
- International Business Machines Corporation
- Dinesh A. Badami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND PROGRAMMING OF LASER FUSE
- Publication number 20050093091
- Publication date May 5, 2005
- International Business Machines Corporation
- Dinesh A. Badami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nitride etchstop film to protect metal-insulator-metal capacitor di...
- Publication number 20030146492
- Publication date Aug 7, 2003
- International Business Machines Corporation
- John Chester Malinowski
- H01 - BASIC ELECTRIC ELEMENTS

Kimball M. Watson

Person

Patents Grantslast 30 patents

Inline measurement of through-silicon via depth

Matching of bipolar transistor pair through electrical stress

Micro-electro-mechanical system (MEMS) structure and design structures

Inline measurement of through-silicon via depth

Method of fabricating thermally controlled refractory metal resistor

Methods of forming and programming an electronically programmable r...

Thermally controlled refractory metal resistor

Thin film resistors and methods of manufacture

Metal wiring structure for integration with through substrate vias

Optically transparent wires for secure circuits and methods of maki...

Electrically programmable resistor

IC interconnect for high current

Optically transparent wires for secure circuits and methods of maki...

Programming of laser fuse

Metal wiring structure for integration with through substrate vias

Method and structure for ballast resistor

Edge seal for thru-silicon-via technology

In-line depth measurement for thru silicon via

Structures including means for lateral current carrying capability...

Methods for lateral current carrying capability improvement in semi...

Structure and programming of laser fuse

Structure and programming of laser fuse

Method to calculate hot-electron test voltage differential for asse...

Method to assess electromigration and hot electron reliability for...

Patents Applicationslast 30 patents

INLINE MEASUREMENT OF THROUGH-SILICON VIA DEPTH

MICRO-ELECTRO-MECHANICAL SYSTEM (MEMS) STRUCTURE AND DESIGN STRUCTURES

INLINE MEASUREMENT OF THROUGH-SILICON VIA DEPTH

THERMALLY CONTROLLED REFRACTORY METAL RESISTOR

THERMALLY CONTROLLED REFRACTORY METAL RESISTOR

THIN FILM RESISTORS AND METHODS OF MANUFACTURE

METHODS OF FORMING AND PROGRAMMING AN ELECTRONICALLY PROGRAMMABLE R...

OPTICALLY TRANSPARENT WIRES FOR SECURE CIRCUITS AND METHODS OF MAKI...

METAL WIRING STRUCTURE FOR INTEGRATION WITH THROUGH SUBSTRATE VIAS

IN-LINE DEPTH MEASUREMENT OF THRU SILICON VIA

METAL WIRING STRUCTURE FOR INTEGRATION WITH THROUGH SUBSTRATE VIAS

OPTICALLY TRANSPARENT WIRES FOR SECURE CIRCUITS AND METHODS OF MAKI...

METHOD AND STRUCTURE FOR BALLAST RESISTOR

IC INTERCONNECT FOR HIGH CURRENT

EDGE SEAL FOR THRU-SILICON-VIA TECHNOLOGY

DESIGN STRUCTURES INCLUDING MEANS FOR LATERAL CURRENT CARRYING CAPA...

LATERAL CURRENT CARRYING CAPABILITY IMPROVEMENT IN SEMICONDUCTOR DE...

PROGRAMMING OF LASER FUSE

METHODS FOR LATERAL CURRENT CARRYING CAPABILITY IMPROVEMENT IN SEMI...

ELECTRICALLY PROGRAMMABLE RESISTOR AND METHODS

Structure and programming of laser fuse

STRUCTURE AND PROGRAMMING OF LASER FUSE

Nitride etchstop film to protect metal-insulator-metal capacitor di...