Kiyomi Yoshinari

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer
- Patent number 12,087,565
- Issue date Sep 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Kouji Ishiguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector
- Patent number 11,955,327
- Issue date Apr 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and nozzle member
- Patent number 11,049,706
- Issue date Jun 29, 2021
- HITACHI HIGH-TECH CORPORATION
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and nozzle member
- Patent number 11,011,361
- Issue date May 18, 2021
- HITACHI HIGH-TECH CORPORATION
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 10,607,825
- Issue date Mar 31, 2020
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with ion frequency selection
- Patent number 10,332,736
- Issue date Jun 25, 2019
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry device
- Patent number 10,229,821
- Issue date Mar 12, 2019
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 10,068,756
- Issue date Sep 4, 2018
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer system
- Patent number 7,932,486
- Issue date Apr 26, 2011
- Hitachi High-Technologies Corporation
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometric method, mass spectrometric system, diagnosis sys...
- Patent number 7,595,484
- Issue date Sep 29, 2009
- Hitachi High-Technologies Corp.
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tandem type mass analysis system and method
- Patent number 7,544,930
- Issue date Jun 9, 2009
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer system
- Patent number 7,473,892
- Issue date Jan 6, 2009
- Hitachi High-Technologies Corporation
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometric analysis method and system using the method
- Patent number 7,435,949
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Atsushi Ohtake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric method and mass spectrometric system
- Patent number 7,332,713
- Issue date Feb 19, 2008
- Hitachi, Ltd.
- Kiyomi Yoshinari
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometry and mass spectrometry system
- Patent number 7,180,056
- Issue date Feb 20, 2007
- Hitachi, Ltd.
- Atsushi Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometric data analyzing method, mass spectrometric data a...
- Patent number 7,158,893
- Issue date Jan 2, 2007
- Hitachi, Ltd.
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrometry system
- Patent number 7,126,113
- Issue date Oct 24, 2006
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass spectrometry on an ion-trap method
- Patent number 7,075,069
- Issue date Jul 11, 2006
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,064,319
- Issue date Jun 20, 2006
- Hitachi High-Technologies Corporation
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,053,367
- Issue date May 30, 2006
- Hitachi High-Technologies Corporation
- Tomoyuki Tobita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass analyzing apparatus
- Patent number 6,977,373
- Issue date Dec 20, 2005
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for analyzing compound structure
- Patent number 6,957,159
- Issue date Oct 18, 2005
- Hitachi Ltd.
- Kinya Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrum analyzing system
- Patent number 6,917,037
- Issue date Jul 12, 2005
- Hitachi High-Technologies Corporation
- Atsushi Ootake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for analyzing mass spectrometric data
- Patent number 6,914,239
- Issue date Jul 5, 2005
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric data analyzing method, mass spectrometric data a...
- Patent number 6,907,352
- Issue date Jun 14, 2005
- Hitachi, Ltd.
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrometer
- Patent number 6,852,972
- Issue date Feb 8, 2005
- Hitachi High-Technologies Corporation
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass analyzing apparatus
- Patent number 6,759,652
- Issue date Jul 6, 2004
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric data analyzing method, mass spectrometric data a...
- Patent number 6,745,134
- Issue date Jun 1, 2004
- Hitachi, Ltd.
- Kinya Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ion trap mass spectrometer and spectrometry
- Patent number 6,683,303
- Issue date Jan 27, 2004
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass spectrometry on an ion-trap method
- Patent number 6,633,033
- Issue date Oct 14, 2003
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Mass Spectrometer
- Publication number 20220319825
- Publication date Oct 6, 2022
- Hitachi High-Tech Corporation
- Kouji ISHIGURO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Detector
- Publication number 20220181138
- Publication date Jun 9, 2022
- Hitachi High-Tech Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer and Nozzle Member
- Publication number 20210159063
- Publication date May 27, 2021
- Hitachi High-Technologies Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20190006164
- Publication date Jan 3, 2019
- Hitachi High-Technologies Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry Device
- Publication number 20180269049
- Publication date Sep 20, 2018
- Hitachi High-Technologies Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20170125230
- Publication date May 4, 2017
- Hitachi High-Technologies Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER SYSTEM AND METHOD
- Publication number 20160020082
- Publication date Jan 21, 2016
- Hitachi High-Technologies Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analysis Computation Method, Analysis Computation Program and Recor...
- Publication number 20140337402
- Publication date Nov 13, 2014
- Hitachi, Ltd
- Kazutami Tago
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Numerical Analysis System
- Publication number 20140200845
- Publication date Jul 17, 2014
- Hitachi Ltd.
- Kiyomi Yoshinari
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE ANALYSIS METHOD USING MASS SPECTROMETER
- Publication number 20110101215
- Publication date May 5, 2011
- Atsumu Hirabayashi
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER SYSTEM
- Publication number 20090189063
- Publication date Jul 30, 2009
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Application
Mass analysis system
- Publication number 20070221836
- Publication date Sep 27, 2007
- Kinya Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TANDEM TYPE MASS ANALYSIS SYSTEM AND METHOD
- Publication number 20070187588
- Publication date Aug 16, 2007
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometric analysis method and system using the method
- Publication number 20060289735
- Publication date Dec 28, 2006
- Atsushi Ohtake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometric method, mass spectrometric system, diagnosis sys...
- Publication number 20060169889
- Publication date Aug 3, 2006
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometric method and mass spectrometric system
- Publication number 20060043281
- Publication date Mar 2, 2006
- Kiyomi Yoshinari
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometry and mass spectrometry system
- Publication number 20050274884
- Publication date Dec 15, 2005
- Atsushi Otake
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometry system
- Publication number 20050184232
- Publication date Aug 25, 2005
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometric data analyzing method, mass spectrometric data a...
- Publication number 20050139761
- Publication date Jun 30, 2005
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mass spectrometer system
- Publication number 20050063864
- Publication date Mar 24, 2005
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometer
- Publication number 20040262512
- Publication date Dec 30, 2004
- Tomoyuki Tobita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap mass analyzing apparatus
- Publication number 20040211898
- Publication date Oct 28, 2004
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer
- Publication number 20040195502
- Publication date Oct 7, 2004
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for analyzing mass spectrometric data
- Publication number 20040181347
- Publication date Sep 16, 2004
- HITACHI LTD.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrum analyzing system
- Publication number 20040169138
- Publication date Sep 2, 2004
- Atsushi Ootake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for analyzing compound structure
- Publication number 20040111228
- Publication date Jun 10, 2004
- Hitachi, Ltd.
- Kinya Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Valve-encased nozzle device and liquid handling device
- Publication number 20040050974
- Publication date Mar 18, 2004
- Chahn Lee
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Mass spectrometric data analyzing method, mass spectrometric data a...
- Publication number 20030236636
- Publication date Dec 25, 2003
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mass spectrometric data analyzing method, mass spectrometric data a...
- Publication number 20030236634
- Publication date Dec 25, 2003
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mass spectrometer
- Publication number 20030222214
- Publication date Dec 4, 2003
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS

Kiyomi Yoshinari

Person

Patents Grantslast 30 patents

Mass spectrometer

Ion detector

Mass spectrometer and nozzle member

Mass spectrometer and nozzle member

Mass spectrometer

Mass spectrometer with ion frequency selection

Mass spectrometry device

Mass spectrometer

Mass spectrometer system

Mass spectrometric method, mass spectrometric system, diagnosis sys...

Tandem type mass analysis system and method

Mass spectrometer system

Mass spectrometric analysis method and system using the method

Mass spectrometric method and mass spectrometric system

Mass spectrometry and mass spectrometry system

Mass spectrometric data analyzing method, mass spectrometric data a...

Mass spectrometry system

Apparatus for mass spectrometry on an ion-trap method

Mass spectrometer

Mass spectrometer

Ion trap mass analyzing apparatus

System for analyzing compound structure

Mass spectrum analyzing system

System for analyzing mass spectrometric data

Mass spectrometric data analyzing method, mass spectrometric data a...

Mass spectrometer

Ion trap mass analyzing apparatus

Mass spectrometric data analyzing method, mass spectrometric data a...

Ion trap mass spectrometer and spectrometry

Apparatus for mass spectrometry on an ion-trap method

Patents Applicationslast 30 patents

Mass Spectrometer

Ion Detector

Mass Spectrometer and Nozzle Member

Mass Spectrometer

Mass Spectrometry Device

MASS SPECTROMETER

MASS SPECTROMETER SYSTEM AND METHOD

Analysis Computation Method, Analysis Computation Program and Recor...

Numerical Analysis System

QUANTITATIVE ANALYSIS METHOD USING MASS SPECTROMETER

MASS SPECTROMETER SYSTEM

Mass analysis system

TANDEM TYPE MASS ANALYSIS SYSTEM AND METHOD

Mass spectrometric analysis method and system using the method

Mass spectrometric method, mass spectrometric system, diagnosis sys...

Mass spectrometric method and mass spectrometric system

Mass spectrometry and mass spectrometry system

Mass spectrometry system

Mass spectrometric data analyzing method, mass spectrometric data a...

Mass spectrometer system

Mass spectrometer

Ion trap mass analyzing apparatus

Mass spectrometer

System for analyzing mass spectrometric data

Mass spectrum analyzing system

System for analyzing compound structure

Valve-encased nozzle device and liquid handling device

Mass spectrometric data analyzing method, mass spectrometric data a...

Mass spectrometric data analyzing method, mass spectrometric data a...

Mass spectrometer