Kohei YAMAGUCHI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Light adjustment device and light adjustment device manufacturing m...
- Patent number 12,174,476
- Issue date Dec 24, 2024
- Japan Display Inc.
- Shunpei Takeuchi
- G02 - OPTICS
Information Patent Grant
Information processing apparatus, control system, system, informati...
- Patent number 12,169,705
- Issue date Dec 17, 2024
- Honda Motor Co., Ltd.
- Tomoaki Taki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electric-rotating-machine rotor and manufacturing method therefor
- Patent number 12,136,853
- Issue date Nov 5, 2024
- Mitsubishi Electric Corporation
- Kohei Yamaguchi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Control system, mobile object, control method, and computer-readabl...
- Patent number 12,026,498
- Issue date Jul 2, 2024
- Honda Motor Co., Ltd.
- Kohei Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control system, mobile object, server, control method and computer-...
- Patent number 11,960,874
- Issue date Apr 16, 2024
- Honda Motor Co., Ltd.
- Kohei Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control system, moving object, server, and control method for perfo...
- Patent number 11,880,671
- Issue date Jan 23, 2024
- Honda Motor Co., Ltd.
- Kohei Yamaguchi
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Stationary induction electrical apparatus
- Patent number 10,090,095
- Issue date Oct 2, 2018
- Hitachi, Ltd.
- Li Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stationary induction electric apparatus
- Patent number 9,947,453
- Issue date Apr 17, 2018
- Hitachi, Ltd.
- Yasunori Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,342,878
- Issue date May 17, 2016
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,040,937
- Issue date May 26, 2015
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope
- Patent number 8,188,428
- Issue date May 29, 2012
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection tool and method of parameter tuning for defect in...
- Patent number 8,139,847
- Issue date Mar 20, 2012
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect review apparatus and method of reviewing defects
- Patent number 8,108,172
- Issue date Jan 31, 2012
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning microscope
- Patent number 7,881,558
- Issue date Feb 1, 2011
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Defect review apparatus and method of reviewing defects
- Patent number 7,869,969
- Issue date Jan 11, 2011
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,732,765
- Issue date Jun 8, 2010
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,638,767
- Issue date Dec 29, 2009
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging method
- Patent number 7,526,143
- Issue date Apr 28, 2009
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,307,253
- Issue date Dec 11, 2007
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,307,254
- Issue date Dec 11, 2007
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of observing a specimen using a scanning electron microscope
- Patent number 7,075,077
- Issue date Jul 11, 2006
- Hitachi High-Technologies Corporation
- Hirohito Okuda
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
VOCALIZATION ASSISTANCE DEVICE
- Publication number 20240081980
- Publication date Mar 14, 2024
- NATIONAL UNIVERSITY CORPORATION TOKYO MEDICAL AND DENTAL UNIVERSITY
- Haruka TOHARA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
LIGHT ADJUSTMENT DEVICE AND LIGHT ADJUSTMENT DEVICE MANUFACTURING M...
- Publication number 20240012276
- Publication date Jan 11, 2024
- Japan Display Inc.
- Shunpei TAKEUCHI
- G02 - OPTICS
Information Patent Application
Core for Stationary Electromagnetic Apparatus
- Publication number 20230386728
- Publication date Nov 30, 2023
- Hitachi, Ltd
- Chie KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC-ROTATING-MACHINE ROTOR AND MANUFACTURING METHOD THEREFOR
- Publication number 20220416596
- Publication date Dec 29, 2022
- Mitsubishi Electric Corporation
- Kohei YAMAGUCHI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CONTROL SYSTEM, MOBILE OBJECT, SERVER, CONTROL METHOD AND COMPUTER-...
- Publication number 20220222061
- Publication date Jul 14, 2022
- Honda Motor Co.,Ltd.
- Kohei YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, CONTROL SYSTEM, SYSTEM, INFORMATI...
- Publication number 20220222062
- Publication date Jul 14, 2022
- Honda Motor Co.,Ltd.
- Tomoaki TAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL SYSTEM, MOBILE OBJECT, CONTROL METHOD, AND COMPUTER-READABL...
- Publication number 20220222059
- Publication date Jul 14, 2022
- Honda Motor Co.,Ltd.
- Kohei YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL SYSTEM, MOBILE OBJECT, INFORMATION PROCESSING APPARATUS, CO...
- Publication number 20220219566
- Publication date Jul 14, 2022
- Honda Motor Co.,Ltd.
- Tomoaki TAKI
- B60 - VEHICLES IN GENERAL
Information Patent Application
CONTROL SYSTEM, MOBILE OBJECT, CONTROL METHOD AND COMPUTER-READABLE...
- Publication number 20220197627
- Publication date Jun 23, 2022
- HONDA MOTOR CO.,LTD.
- Kohei YAMAGUCHI
- B60 - VEHICLES IN GENERAL
Information Patent Application
CONTROL SYSTEM, MOVING OBJECT, SERVER AND CONTROL METHOD
- Publication number 20220197626
- Publication date Jun 23, 2022
- Honda Motor Co.,Ltd.
- Kohei YAMAGUCHI
- B60 - VEHICLES IN GENERAL
Information Patent Application
STATIONARY INDUCTION ELECTRICAL APPARATUS
- Publication number 20170301454
- Publication date Oct 19, 2017
- Hitachi, Ltd
- Li LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stationary Induction Electric Apparatus
- Publication number 20160247621
- Publication date Aug 25, 2016
- Hitachi, Ltd
- Yasunori ONO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150060667
- Publication date Mar 5, 2015
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130265408
- Publication date Oct 10, 2013
- Kohei Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Review Apparatus and Method of Reviewing Defects
- Publication number 20110062328
- Publication date Mar 17, 2011
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20100213371
- Publication date Aug 26, 2010
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT INSPECTION TOOL AND METHOD OF PARAMETER TUNING FOR DEFECT IN...
- Publication number 20090222753
- Publication date Sep 3, 2009
- Kohei YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING MICROSCOPE
- Publication number 20090202166
- Publication date Aug 13, 2009
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Defect Review Apparatus and Method of Reviewing Defects
- Publication number 20080270044
- Publication date Oct 30, 2008
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20080128617
- Publication date Jun 5, 2008
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20070170358
- Publication date Jul 26, 2007
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- G02 - OPTICS
Information Patent Application
Imaging method
- Publication number 20060243905
- Publication date Nov 2, 2006
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20060043294
- Publication date Mar 2, 2006
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20050236569
- Publication date Oct 27, 2005
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of observing a specimen using a scanning electron microscope
- Publication number 20050194533
- Publication date Sep 8, 2005
- Hirohito Okuda
- H01 - BASIC ELECTRIC ELEMENTS

Kohei YAMAGUCHI

Person

Patents Grantslast 30 patents

Light adjustment device and light adjustment device manufacturing m...

Information processing apparatus, control system, system, informati...

Electric-rotating-machine rotor and manufacturing method therefor

Control system, mobile object, control method, and computer-readabl...

Control system, mobile object, server, control method and computer-...

Control system, moving object, server, and control method for perfo...

Stationary induction electrical apparatus

Stationary induction electric apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Scanning electron microscope

Defect inspection tool and method of parameter tuning for defect in...

Defect review apparatus and method of reviewing defects

Scanning microscope

Defect review apparatus and method of reviewing defects

Scanning electron microscope

Scanning electron microscope

Imaging method

Scanning electron microscope

Scanning electron microscope

Method of observing a specimen using a scanning electron microscope

Patents Applicationslast 30 patents

VOCALIZATION ASSISTANCE DEVICE

LIGHT ADJUSTMENT DEVICE AND LIGHT ADJUSTMENT DEVICE MANUFACTURING M...

Core for Stationary Electromagnetic Apparatus

ELECTRIC-ROTATING-MACHINE ROTOR AND MANUFACTURING METHOD THEREFOR

CONTROL SYSTEM, MOBILE OBJECT, SERVER, CONTROL METHOD AND COMPUTER-...

INFORMATION PROCESSING APPARATUS, CONTROL SYSTEM, SYSTEM, INFORMATI...

CONTROL SYSTEM, MOBILE OBJECT, CONTROL METHOD, AND COMPUTER-READABL...

CONTROL SYSTEM, MOBILE OBJECT, INFORMATION PROCESSING APPARATUS, CO...

CONTROL SYSTEM, MOBILE OBJECT, CONTROL METHOD AND COMPUTER-READABLE...

CONTROL SYSTEM, MOVING OBJECT, SERVER AND CONTROL METHOD

STATIONARY INDUCTION ELECTRICAL APPARATUS

Stationary Induction Electric Apparatus

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

Defect Review Apparatus and Method of Reviewing Defects

SCANNING ELECTRON MICROSCOPE

DEFECT INSPECTION TOOL AND METHOD OF PARAMETER TUNING FOR DEFECT IN...

SCANNING MICROSCOPE

Defect Review Apparatus and Method of Reviewing Defects

Scanning electron microscope

Scanning electron microscope

Imaging method

Scanning electron microscope

Scanning electron microscope

Method of observing a specimen using a scanning electron microscope