Koji Eriguchi

Person

Ritto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with dummy conductors
- Patent number 7,432,556
- Issue date Oct 7, 2008
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 6,974,987
- Issue date Dec 13, 2005
- Matsushita Electric Industrial Co., Ltd.
- Hisashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
APPARATUS AND METHOD FOR OPTICAL EVALUATION, APPARATUS AND METHOD F...
- Patent number 6,849,470
- Issue date Feb 1, 2005
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for manufacturing semiconductor device and method of manufac...
- Patent number 6,750,976
- Issue date Jun 15, 2004
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- G01 - MEASURING TESTING
Information Patent Grant
Aggregate of semiconductor micro-needles and method of manufacturin...
- Patent number 6,734,451
- Issue date May 11, 2004
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Method of forming a high dielectric constant insulating film and me...
- Patent number 6,734,069
- Issue date May 11, 2004
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
APPARATUS AND METHOD FOR OPTICAL EVALUATION, APPARATUS AND METHOD F...
- Patent number 6,727,108
- Issue date Apr 27, 2004
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for evaluating insulating film
- Patent number 6,720,790
- Issue date Apr 13, 2004
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for manufacturing semiconductor device and method of manufac...
- Patent number 6,695,947
- Issue date Feb 24, 2004
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating insulating film
- Patent number 6,583,640
- Issue date Jun 24, 2003
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
APPARATUS AND METHOD FOR OPTICAL EVALUATION, APPARATUS AND METHOD F...
- Patent number 6,580,091
- Issue date Jun 17, 2003
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aggregate of semiconductor micro-needles and method of manufacturin...
- Patent number 6,489,629
- Issue date Dec 3, 2002
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for examining semiconductor substrate, and method for contro...
- Patent number 6,469,535
- Issue date Oct 22, 2002
- Matsushita Electric Industrial Co., Ltd.
- Kyoko Egashira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for manufacturing semiconductor device and method of manufac...
- Patent number 6,395,563
- Issue date May 28, 2002
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for semiconductor device fabrication
- Patent number 6,372,082
- Issue date Apr 16, 2002
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making aggregate of semiconductor micro-needles
- Patent number 6,177,291
- Issue date Jan 23, 2001
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for optical evaluation, apparatus and method f...
- Patent number 6,113,733
- Issue date Sep 5, 2000
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aggregate of semiconductor micro-needles and method of manufacturin...
- Patent number 6,087,197
- Issue date Jul 11, 2000
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for semiconductor device fabrication
- Patent number 6,069,090
- Issue date May 30, 2000
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing aggregate of semiconductor micro-needles
- Patent number 6,033,928
- Issue date Mar 7, 2000
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor manufacturing apparatus
- Patent number 5,985,032
- Issue date Nov 16, 1999
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
MIS device, method of manufacturing the same, and method of diagnos...
- Patent number 5,903,031
- Issue date May 11, 1999
- Matsushita Electric Industrial Co., Ltd.
- Takayuki Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of monitoring deposit in chamber, method of plasma processin...
- Patent number 5,897,378
- Issue date Apr 27, 1999
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for making a semiconductor device
- Patent number 5,898,207
- Issue date Apr 27, 1999
- Matsushita Electric Industrial Co., Ltd.
- Michihiko Takase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of presuming life time of semiconductor device
- Patent number 5,650,336
- Issue date Jul 22, 1997
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20090001473
- Publication date Jan 1, 2009
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20070108614
- Publication date May 17, 2007
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20050006707
- Publication date Jan 13, 2005
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and its manufacturing method
- Publication number 20040150025
- Publication date Aug 5, 2004
- Hisashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for optical evaluation, apparatus and method f...
- Publication number 20030207476
- Publication date Nov 6, 2003
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for evaluating insulating film
- Publication number 20030169065
- Publication date Sep 11, 2003
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of forming insulating film and method of producing semicondu...
- Publication number 20030092238
- Publication date May 15, 2003
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aggregate of Semicnductor micro-needles and method of manufacturing...
- Publication number 20030057451
- Publication date Mar 27, 2003
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Device for manufacturing semiconductor device and method of manufac...
- Publication number 20020135785
- Publication date Sep 26, 2002
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- G01 - MEASURING TESTING
Information Patent Application
Device for manufacturing semiconductor device and method of manufac...
- Publication number 20020129476
- Publication date Sep 19, 2002
- Matsushita Electric Industrial Co., Ltd.
- Koji Eriguchi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for evaluating insulating film
- Publication number 20020024351
- Publication date Feb 28, 2002
- Koji Eriguchi
- H01 - BASIC ELECTRIC ELEMENTS

Koji Eriguchi

Person

Patents Grantslast 30 patents

Semiconductor device with dummy conductors

Semiconductor device

APPARATUS AND METHOD FOR OPTICAL EVALUATION, APPARATUS AND METHOD F...

Device for manufacturing semiconductor device and method of manufac...

Aggregate of semiconductor micro-needles and method of manufacturin...

Method of forming a high dielectric constant insulating film and me...

APPARATUS AND METHOD FOR OPTICAL EVALUATION, APPARATUS AND METHOD F...

Method and apparatus for evaluating insulating film

Device for manufacturing semiconductor device and method of manufac...

Method and apparatus for evaluating insulating film

APPARATUS AND METHOD FOR OPTICAL EVALUATION, APPARATUS AND METHOD F...

Aggregate of semiconductor micro-needles and method of manufacturin...

Method for examining semiconductor substrate, and method for contro...

Device for manufacturing semiconductor device and method of manufac...

Method and apparatus for semiconductor device fabrication

Method of making aggregate of semiconductor micro-needles

Apparatus and method for optical evaluation, apparatus and method f...

Aggregate of semiconductor micro-needles and method of manufacturin...

Method and apparatus for semiconductor device fabrication

Method of manufacturing aggregate of semiconductor micro-needles

Semiconductor manufacturing apparatus

MIS device, method of manufacturing the same, and method of diagnos...

Method of monitoring deposit in chamber, method of plasma processin...

Method for making a semiconductor device

Method of presuming life time of semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

Semiconductor device and method for manufacturing the same

Semiconductor device and its manufacturing method

Apparatus and method for optical evaluation, apparatus and method f...

Method and apparatus for evaluating insulating film

Method of forming insulating film and method of producing semicondu...

Aggregate of Semicnductor micro-needles and method of manufacturing...

Device for manufacturing semiconductor device and method of manufac...

Device for manufacturing semiconductor device and method of manufac...

Method and apparatus for evaluating insulating film