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Kun-Yu Liu

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  • HsinChu, TW
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    CMP SAFE ALIGNMENT MARK
    • Publication number 20240387398
    • Publication date Nov 21, 2024
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Huang-Jen HSU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CMP SAFE ALIGNMENT MARK
    • Publication number 20220102285
    • Publication date Mar 31, 2022
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Huang-Jen HSU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    READER AND RFID READER
    • Publication number 20160104015
    • Publication date Apr 14, 2016
    • WISTRON NEWEB CORP.
    • CHUNG-PING CHANG
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Dual damascene with via liner
    • Publication number 20080230919
    • Publication date Sep 25, 2008
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Uway Tseng
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Management systems and methods
    • Publication number 20070128892
    • Publication date Jun 7, 2007
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Derek Wang
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Parallel Adder-Based DCT / IDCT Design Using Cyclic Convolution
    • Publication number 20070094320
    • Publication date Apr 26, 2007
    • Macronix International Co., Ltd.
    • Jiun-In Guo
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Dual damascene with via liner
    • Publication number 20060170106
    • Publication date Aug 3, 2006
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Uway Tseng
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Manufacturing management system and method
    • Publication number 20060079978
    • Publication date Apr 13, 2006
    • Shiaw-Lin Chi
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    Monitoring semiconductor wafer defects below one nanometer
    • Publication number 20060037941
    • Publication date Feb 23, 2006
    • Wu-An Weng
    • G01 - MEASURING TESTING
  • Information Patent Application

    Parallel adder-based DCT/IDCT design using cyclic convolution
    • Publication number 20050004963
    • Publication date Jan 6, 2005
    • Macronix International Co., Ltd.
    • Jiun-In Guo
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    METHOD OF CALCULATING THE REAL ADDED DEFECT COUNTS
    • Publication number 20040033632
    • Publication date Feb 19, 2004
    • Wei-Ming Chen
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Verification photomask
    • Publication number 20030044696
    • Publication date Mar 6, 2003
    • Taiwan Semiconductor Manufacturing Co. Ltd.
    • Kun-Yi Liu
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Optical proximity correction verification mask
    • Publication number 20030044692
    • Publication date Mar 6, 2003
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Kun-Yi Liu
    • G06 - COMPUTING CALCULATING COUNTING