Kwame Amponsah

Person

Ithaca, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Fine pitch probe card
- Patent number 12,085,589
- Issue date Sep 10, 2024
- Xallent Inc.
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 11,573,247
- Issue date Feb 7, 2023
- Xallent INC.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Functional prober chip
- Patent number 11,280,825
- Issue date Mar 22, 2022
- Xallent LLC
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 11,125,774
- Issue date Sep 21, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Nanoelectromechanical devices with metal-to-metal contacts
- Patent number 11,017,959
- Issue date May 25, 2021
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple integrated tips scanning probe microscope
- Patent number 10,895,585
- Issue date Jan 19, 2021
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Functional prober chip
- Patent number 10,866,273
- Issue date Dec 15, 2020
- Xallent, LLC
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoelectromechanical devices with metal-to-metal contacts
- Patent number 10,784,054
- Issue date Sep 22, 2020
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple integrated tips scanning probe microscope with pre-alignme...
- Patent number 10,663,484
- Issue date May 26, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Multiple integrated tips scanning probe microscope
- Patent number 10,613,115
- Issue date Apr 7, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 10,545,171
- Issue date Jan 28, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for manufacturing nano-electro-mechanical-syste...
- Patent number 10,436,814
- Issue date Oct 8, 2019
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Motion sensor integrated nano-probe N/MEMS apparatus, method, and a...
- Patent number 10,048,289
- Issue date Aug 14, 2018
- Cornell University
- Amit Lal
- G01 - MEASURING TESTING
Information Patent Grant
Structures and methods for electrically and mechanically linked mon...
- Patent number 9,159,710
- Issue date Oct 13, 2015
- Cornell University
- Amit Lal
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
PROBE HEAD WITH REPLACEABLE PROBE BOARD
- Publication number 20240310410
- Publication date Sep 19, 2024
- Xallent Inc.
- Kwame Amponsah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND TECHNIQUES FOR DETERMINING WHEN A PROBE TIP IS PROXIMAT...
- Publication number 20240255571
- Publication date Aug 1, 2024
- Xallent Inc.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20230143037
- Publication date May 11, 2023
- Xallent Inc.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
FINE PITCH PROBE CARD
- Publication number 20220341968
- Publication date Oct 27, 2022
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20210389346
- Publication date Dec 16, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL PROBER CHIP
- Publication number 20210063470
- Publication date Mar 4, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
NANOELECTROMECHANICAL DEVICES WITH METAL-TO-METAL CONTACTS
- Publication number 20200373095
- Publication date Nov 26, 2020
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE
- Publication number 20200191827
- Publication date Jun 18, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20200156376
- Publication date May 21, 2020
- Xallent LLC
- Kwame Amponsah
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...
- Publication number 20190383856
- Publication date Dec 19, 2019
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE WITH PRE-ALIGNME...
- Publication number 20190250186
- Publication date Aug 15, 2019
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE
- Publication number 20190128919
- Publication date May 2, 2019
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND A...
- Publication number 20190018039
- Publication date Jan 17, 2019
- Cornell University
- Amit Lal
- G01 - MEASURING TESTING
Information Patent Application
NANOELECTROMECHANICAL DEVICES WITH METAL-TO-METAL CONTACTS
- Publication number 20180294108
- Publication date Oct 11, 2018
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Functional Prober Chip
- Publication number 20170261544
- Publication date Sep 14, 2017
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
Multiple Integrated Tips Scanning Probe Microscope
- Publication number 20160252545
- Publication date Sep 1, 2016
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Manufacturing Nano-Electro-Mechanical-Syste...
- Publication number 20160252546
- Publication date Sep 1, 2016
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND A...
- Publication number 20140331367
- Publication date Nov 6, 2014
- Amit Lal
- B82 - NANO-TECHNOLOGY
Information Patent Application
STRUCTURES AND METHODS FOR ELECTRICALLY AND MECHANICALLY LINKED MON...
- Publication number 20130328109
- Publication date Dec 12, 2013
- Cornell University
- Amit Lal
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Kwame Amponsah

Person

Patents Grantslast 30 patents

Fine pitch probe card

Systems and methods for manufacturing nano-electro-mechanical-syste...

Functional prober chip

Systems and methods for manufacturing nano-electro-mechanical-syste...

Nanoelectromechanical devices with metal-to-metal contacts

Multiple integrated tips scanning probe microscope

Functional prober chip

Nanoelectromechanical devices with metal-to-metal contacts

Multiple integrated tips scanning probe microscope with pre-alignme...

Multiple integrated tips scanning probe microscope

Systems and methods for manufacturing nano-electro-mechanical-syste...

Systems and methods for manufacturing nano-electro-mechanical-syste...

Motion sensor integrated nano-probe N/MEMS apparatus, method, and a...

Structures and methods for electrically and mechanically linked mon...

Patents Applicationslast 30 patents

PROBE HEAD WITH REPLACEABLE PROBE BOARD

METHODS AND TECHNIQUES FOR DETERMINING WHEN A PROBE TIP IS PROXIMAT...

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

FINE PITCH PROBE CARD

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

FUNCTIONAL PROBER CHIP

NANOELECTROMECHANICAL DEVICES WITH METAL-TO-METAL CONTACTS

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTE...

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE WITH PRE-ALIGNME...

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE

MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND A...

NANOELECTROMECHANICAL DEVICES WITH METAL-TO-METAL CONTACTS

Functional Prober Chip

Multiple Integrated Tips Scanning Probe Microscope

Systems and Methods for Manufacturing Nano-Electro-Mechanical-Syste...

MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND A...

STRUCTURES AND METHODS FOR ELECTRICALLY AND MECHANICALLY LINKED MON...