Kyoji Yamashita

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 8,013,361
- Issue date Sep 6, 2011
- Panasonic Corporation
- Kyoji Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit simulation method
- Patent number 7,792,663
- Issue date Sep 7, 2010
- Panasonic Corporation
- Daisaku Ikoma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 7,709,900
- Issue date May 4, 2010
- Panasonic Corporation
- Daisaku Ikoma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask layout design improvement in gate width direction
- Patent number 7,562,327
- Issue date Jul 14, 2009
- Panasonic Corporation
- Shinsaku Sekido
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit
- Patent number 7,476,957
- Issue date Jan 13, 2009
- Panasonic Corporation
- Shinji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,279,727
- Issue date Oct 9, 2007
- Matsushita Electric Industrial Co., Ltd.
- Daisaku Ikoma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitance measurement circuit
- Patent number 7,230,435
- Issue date Jun 12, 2007
- Renesas Technology Corp.
- Tatsuya Kunikiyo
- G01 - MEASURING TESTING
Information Patent Grant
System and method for operation verification of semiconductor integ...
- Patent number 7,171,640
- Issue date Jan 30, 2007
- Matsushita Electric Industrial Co., Ltd.
- Yuka Terai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,126,174
- Issue date Oct 24, 2006
- Matsushita Electric Industrial Co., Ltd.
- Mizuki Segawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 6,982,555
- Issue date Jan 3, 2006
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,967,409
- Issue date Nov 22, 2005
- Matsushita Electric Industrial Co., Ltd.
- Mizuki Segawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and capacitance measurement method
- Patent number 6,894,520
- Issue date May 17, 2005
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of checking semiconductor storage d...
- Patent number 6,876,208
- Issue date Apr 5, 2005
- Renesas Technology Corp.
- Tatsuya Kunikiyo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,847,119
- Issue date Jan 25, 2005
- Matsushita Electric Industrial Co., Ltd.
- Mizuki Segawa
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,709,950
- Issue date Mar 23, 2004
- Matsushita Electric Industrial Co., Ltd.
- Mizuki Segawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling production line
- Patent number 6,594,598
- Issue date Jul 15, 2003
- Matsushita Electronics Corporation
- Hiroaki Ishizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 6,492,672
- Issue date Dec 10, 2002
- Matsushita Electric Industrial Co., Ltd.
- Mizuki Segawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device which reduces the minimum distance requirement...
- Patent number 6,281,562
- Issue date Aug 28, 2001
- Matsushita Electric Industrial Co., Ltd.
- Mizuki Segawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for designing LSI circuit pattern
- Patent number 6,205,570
- Issue date Mar 20, 2001
- Matsushita Electronics Corporation
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 6,124,160
- Issue date Sep 26, 2000
- Matsushita Electric Industrial Co., Ltd.
- Mizuki Segawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 5,879,983
- Issue date Mar 9, 1999
- Matsushita Electric Industrial Co., Ltd.
- Mizuki Segawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit with parallel/serial/parallel conv...
- Patent number 5,856,754
- Issue date Jan 5, 1999
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
MOS semiconductor device with excellent drain current
- Patent number 5,841,173
- Issue date Nov 24, 1998
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Unsymmetrical MOS device having a gate insulator area offset from t...
- Patent number 5,675,168
- Issue date Oct 7, 1997
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having reduced gate overlapping capacitance
- Patent number 5,610,430
- Issue date Mar 11, 1997
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20080283922
- Publication date Nov 20, 2008
- Kyoji YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit
- Publication number 20080142898
- Publication date Jun 19, 2008
- Shinji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for variability constraints in design of integrated circuits...
- Publication number 20080105904
- Publication date May 8, 2008
- Matsushita Electric Industrial Co., Ltd.
- Takashi Sumikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit simulation method and circuit simulation apparatus
- Publication number 20080077378
- Publication date Mar 27, 2008
- Daisaku Ikoma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for designing semiconductor integrated circuit
- Publication number 20080072199
- Publication date Mar 20, 2008
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device
- Publication number 20080042214
- Publication date Feb 21, 2008
- Matsushita Electric Industrial Co., Ltd.
- Daisaku Ikoma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for designing semiconductor integrated circuit and method of...
- Publication number 20080021689
- Publication date Jan 24, 2008
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor circuit device and design method therefor
- Publication number 20070141766
- Publication date Jun 21, 2007
- Shinsaku Sekido
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Design method for semiconductor integrated circuit
- Publication number 20070111405
- Publication date May 17, 2007
- Shinji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit simulation method and circuit simulation apparatus
- Publication number 20060282249
- Publication date Dec 14, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Daisaku Ikoma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit designing method and library desig...
- Publication number 20060271902
- Publication date Nov 30, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device and layout design method for the same
- Publication number 20060113533
- Publication date Jun 1, 2006
- Yasuhiro Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20060097294
- Publication date May 11, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kyoji Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit and method for designing the same
- Publication number 20060097324
- Publication date May 11, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Katsuya Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20060017070
- Publication date Jan 26, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Daisaku Ikoma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit design method, design support syst...
- Publication number 20060010409
- Publication date Jan 12, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Yasuhiro Tamaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for operation verification of semiconductor integ...
- Publication number 20060010407
- Publication date Jan 12, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Yuka Terai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for variability constraints in design of integrated circuits...
- Publication number 20050205894
- Publication date Sep 22, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Takashi Sumikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for evaluating semiconductor device
- Publication number 20050193013
- Publication date Sep 1, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20050156220
- Publication date Jul 21, 2005
- Matsushita Electric Industrial Co., Ltd.
- Mizuki Segawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20050093089
- Publication date May 5, 2005
- Matsushita Electric Industrial Co., Ltd.
- Mizuki Segawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20050007120
- Publication date Jan 13, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Capacitance measurement circuit
- Publication number 20040207412
- Publication date Oct 21, 2004
- Renesas Technology Corp.
- Tatsuya Kunikiyo
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and capacitance measurement method
- Publication number 20030218473
- Publication date Nov 27, 2003
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20030205820
- Publication date Nov 6, 2003
- Matsushita Electric Industrial Co., Ltd.
- Mizuki Segawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of checking semiconductor storage d...
- Publication number 20030117151
- Publication date Jun 26, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Tatsuya Kunikiyo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20010054741
- Publication date Dec 27, 2001
- MATSUSHITA ELECTRIC INDUSTRIAL CO.,LTD.
- Mizuki Segawa
- H01 - BASIC ELECTRIC ELEMENTS

Kyoji Yamashita

Person

Patents Grantslast 30 patents

Semiconductor device and method for fabricating the same

Circuit simulation method

Semiconductor device

Mask layout design improvement in gate width direction

Semiconductor integrated circuit

Semiconductor device

Capacitance measurement circuit

System and method for operation verification of semiconductor integ...

Semiconductor device and method of manufacturing the same

Semiconductor device

Semiconductor device and method of manufacturing the same

Semiconductor device and capacitance measurement method

Semiconductor device and method of checking semiconductor storage d...

Semiconductor device and method of manufacturing the same

Semiconductor device and method of manufacturing the same

Method for controlling production line

Semiconductor device

Semiconductor device which reduces the minimum distance requirement...

Method for designing LSI circuit pattern

Semiconductor device and method for manufacturing the same

Semiconductor device and method for manufacturing the same

Semiconductor integrated circuit with parallel/serial/parallel conv...

MOS semiconductor device with excellent drain current

Unsymmetrical MOS device having a gate insulator area offset from t...

Semiconductor device having reduced gate overlapping capacitance

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

Semiconductor integrated circuit

Method for variability constraints in design of integrated circuits...

Circuit simulation method and circuit simulation apparatus

Method for designing semiconductor integrated circuit

Semiconductor device

Method for designing semiconductor integrated circuit and method of...

Semiconductor circuit device and design method therefor

Design method for semiconductor integrated circuit

Circuit simulation method and circuit simulation apparatus

Semiconductor integrated circuit designing method and library desig...

Semiconductor device and layout design method for the same

Semiconductor device and method for fabricating the same

Semiconductor integrated circuit and method for designing the same

Semiconductor device

Semiconductor integrated circuit design method, design support syst...

System and method for operation verification of semiconductor integ...

Method for variability constraints in design of integrated circuits...

Method for evaluating semiconductor device

Semiconductor device and method of manufacturing the same

Semiconductor device and method of manufacturing the same

Semiconductor device

Capacitance measurement circuit

Semiconductor device and capacitance measurement method

Semiconductor device and method of manufacturing the same

Semiconductor device and method of checking semiconductor storage d...

Semiconductor device and method of manufacturing the same