Lindsey H. Hall

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method to improve semiconductor surfaces and polishing
- Patent number 9,252,050
- Issue date Feb 2, 2016
- International Business Machines Corporation
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to improve semiconductor surfaces and polishing
- Patent number 9,230,857
- Issue date Jan 5, 2016
- International Business Machines Corporation
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overlapping contacts for semiconductor device
- Patent number 8,940,634
- Issue date Jan 27, 2015
- International Business Machines Corporation
- Brett H. Engel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mitigation of gate to contact capacitance in CMOS flow
- Patent number 8,119,470
- Issue date Feb 21, 2012
- Texas Instruments Incorporated
- Shashank Sureshchandra Ekbote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mitigation of edge degradation in ferroelectric memory devices thro...
- Patent number 8,053,252
- Issue date Nov 8, 2011
- Texas Instruments Incorporated
- Kezhakkedath R. Udayakumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mitigation of edge degradation in ferroelectric memory devices thro...
- Patent number 7,799,582
- Issue date Sep 21, 2010
- Texas Instruments Incorporated
- Kezhakkedath R. Udayakumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for cleaning post-etch noble metal residues
- Patent number 7,723,199
- Issue date May 25, 2010
- Texas Instruments Incorporated
- Yaw S. Obeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mitigation of edge degradation in ferroelectric memory devices thro...
- Patent number 7,572,698
- Issue date Aug 11, 2009
- Texas Instruments Incorporated
- Kezhakkedath R. Udayakumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Recessed drain extensions in transistor device
- Patent number 7,517,779
- Issue date Apr 14, 2009
- Texas Instruments Incorporated
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process method to facilitate silicidation
- Patent number 7,448,395
- Issue date Nov 11, 2008
- Texas Instruments Incorporated
- Jiong-Ping Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor device having silicided re...
- Patent number 7,422,968
- Issue date Sep 9, 2008
- Texas Instruments Incorporated
- Jiong-Ping Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor device containing metal si...
- Patent number 7,422,967
- Issue date Sep 9, 2008
- Texas Instruments Incorporated
- Juanita DeLoach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon recess improvement through improved post implant resist rem...
- Patent number 7,371,691
- Issue date May 13, 2008
- Texas Instruments Incorporated
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a silicided gate electrode using a buffer...
- Patent number 7,341,933
- Issue date Mar 11, 2008
- Texas Instruments Incorporated
- Shaofeng Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clean for high density capacitors
- Patent number 7,252,773
- Issue date Aug 7, 2007
- Texas Instruments Incorporated
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating dual work function metal gates
- Patent number 7,253,049
- Issue date Aug 7, 2007
- Texas Instruments Incorporated
- Jiong-Ping Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Recessed drain extensions in transistor device
- Patent number 7,253,086
- Issue date Aug 7, 2007
- Texas Instruments Incorporated
- Lindsey Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drive current improvement from recessed SiGe incorporation close to...
- Patent number 7,244,654
- Issue date Jul 17, 2007
- Texas Instruments Incorporated
- Pr Chidambaram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FRAM capacitor stack clean
- Patent number 7,228,865
- Issue date Jun 12, 2007
- Texas Instruments Incorporated
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ferroelectric capacitor stack etch cleaning methods
- Patent number 7,220,600
- Issue date May 22, 2007
- Texas Instruments Incorporated
- Scott R. Summerfelt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor fabrication methods using dual sidewall spacers
- Patent number 7,217,626
- Issue date May 15, 2007
- Texas Instruments Incorporated
- Haowen Bu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for using a wet etch to manufacturing a semiconductor device...
- Patent number 7,157,358
- Issue date Jan 2, 2007
- Texas Instruments Incorporated
- Lindsey Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ferroelectric capacitor having a substantially planar dielectric la...
- Patent number 7,153,706
- Issue date Dec 26, 2006
- Texas Instruments Incorporated
- Sanjeev Aggarwal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Increased drive current by isotropic recess etch
- Patent number 7,060,579
- Issue date Jun 13, 2006
- Texas Instruments Incorporated
- PR Chidambaram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface treatment of copper to improve interconnect formation
- Patent number 6,995,088
- Issue date Feb 7, 2006
- Texas Instruments Incorporated
- Sanjeev Aggarwal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of amorphous aluminum oxide on a capacitor sidewall for use as...
- Patent number 6,876,021
- Issue date Apr 5, 2005
- Texas Instruments Incorporated
- J. Scott Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FeRAM capacitor post stack etch clean/repair
- Patent number 6,656,748
- Issue date Dec 2, 2003
- Texas Instruments Incorporated
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stabilization of peroxygen-containing slurries used in a chemical m...
- Patent number 6,448,182
- Issue date Sep 10, 2002
- Texas Instruments Incorporated
- Lindsey Hall
- B24 - GRINDING POLISHING
Information Patent Grant
Integrated circuit planarization method
- Patent number 6,372,648
- Issue date Apr 16, 2002
- Texas Instruments Incorporated
- Lindsey H. Hall
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Piranha etch preparation having long shelf life and method of makin...
- Patent number 6,294,145
- Issue date Sep 25, 2001
- Texas Instruments Incorporated
- Lindsey H. Hall
- C01 - INORGANIC CHEMISTRY

Patents Applicationslast 30 patents

Information Patent Application
METHOD TO IMPROVE SEMICONDUCTOR SURFACES AND POLISHING
- Publication number 20150044869
- Publication date Feb 12, 2015
- International Business Machines Corporation
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNIFORM HEIGHT REPLACEMENT METAL GATE
- Publication number 20150008488
- Publication date Jan 8, 2015
- STMicroelectronics, Inc.
- LINDSEY HALL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO IMPROVE SEMICONDUCTOR SURFACES AND POLISHING
- Publication number 20140073131
- Publication date Mar 13, 2014
- STMicroelectronics, Inc.
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAPPING CONTACTS FOR SEMICONDUCTOR DEVICE
- Publication number 20130241070
- Publication date Sep 19, 2013
- International Business Machines Corporation
- Brett H. Engel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAPPING CONTACTS FOR SEMICONDUCTOR DEVICE
- Publication number 20130001786
- Publication date Jan 3, 2013
- International Business Machines Corporation
- Brett H. Engel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MITIGATION OF EDGE DEGRADATION IN FERROELECTRIC MEMORY DEVICES THRO...
- Publication number 20090275148
- Publication date Nov 5, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Kezhakkedath R. UDAYAKUMAR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MITIGATION OF EDGE DEGRADATION IN FERROELECTRIC MEMORY DEVICES THRO...
- Publication number 20090275147
- Publication date Nov 5, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Kezhakkedath R. Udayakumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mitigation of gate to contact capacitance in CMOS flow
- Publication number 20080230815
- Publication date Sep 25, 2008
- Texas Instruments Inc.
- Shashank Sureshchandra Ekbote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GCIB smoothing of the contact level to improve PZT films
- Publication number 20080076191
- Publication date Mar 27, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Lindsey Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CLEANING POST-ETCH NOBLE METAL RESIDUES
- Publication number 20070298521
- Publication date Dec 27, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Yaw S. Obeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Recessed Drain Extensions in Transistor Device
- Publication number 20070278524
- Publication date Dec 6, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mitigation of edge degradation in ferroelectric memory devices thro...
- Publication number 20070281422
- Publication date Dec 6, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Kezhakkedath R. Udayakumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Novel method for manufacturing a semiconductor device containing me...
- Publication number 20060258091
- Publication date Nov 16, 2006
- Texas Instruments Inc.
- Juanita DeLoach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ferroelectric capacitor stack etch cleaning methods
- Publication number 20060134808
- Publication date Jun 22, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Scott R. Summerfelt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating dual work function metal gates
- Publication number 20060134844
- Publication date Jun 22, 2006
- Jiong-Ping Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing a silicided gate electrode using a buffer...
- Publication number 20060121713
- Publication date Jun 8, 2006
- Texas Instruments, Inc.
- Shaofeng Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Recessed drain extensions in transistor device
- Publication number 20060081894
- Publication date Apr 20, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Increased drive current by isotropic recess etch
- Publication number 20060024898
- Publication date Feb 2, 2006
- PR Chidambaram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing a semiconductor device having silicided re...
- Publication number 20060024882
- Publication date Feb 2, 2006
- Texas Instruments, Incorporated
- Jiong-Ping Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Silicon recess improvement through improved post implant resist rem...
- Publication number 20060024972
- Publication date Feb 2, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Lindsey H. Hall
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Transistor fabrication methods using dual sidewall spacers
- Publication number 20060019456
- Publication date Jan 26, 2006
- Haowen Bu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process method to facilitate silicidation
- Publication number 20060014393
- Publication date Jan 19, 2006
- Jiong-Ping Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface treatment of copper to improve interconnect formation
- Publication number 20050260853
- Publication date Nov 24, 2005
- Texas Instruments, Incorporated
- Sanjeev Aggarwal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ferroelectric capacitor having a substantially planar dielectric la...
- Publication number 20050239218
- Publication date Oct 27, 2005
- TEXAS INSTRUMENTS INCORPORATED
- Sanjeev Aggarwal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Recess reduction for leakage improvement in high density capacitors
- Publication number 20050233563
- Publication date Oct 20, 2005
- TEXAS INSTRUMENTS INCORPORATED
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for using a wet etch to manufacturing a semiconductor device...
- Publication number 20050215038
- Publication date Sep 29, 2005
- Texas Instruments, Incorporated
- Lindsey Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Drive current improvement from recessed SiGe incorporation close to...
- Publication number 20050139872
- Publication date Jun 30, 2005
- Pr Chidambaram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FRAM capacitor stack clean
- Publication number 20050045590
- Publication date Mar 3, 2005
- Lindsey H. Hall
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FRAM capacitor stack clean
- Publication number 20040237998
- Publication date Dec 2, 2004
- Lindsey H. Hall
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Wet clean method for PZT capacitors
- Publication number 20040166678
- Publication date Aug 26, 2004
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS

Lindsey H. Hall

Person

Patents Grantslast 30 patents

Method to improve semiconductor surfaces and polishing

Method to improve semiconductor surfaces and polishing

Overlapping contacts for semiconductor device

Mitigation of gate to contact capacitance in CMOS flow

Mitigation of edge degradation in ferroelectric memory devices thro...

Mitigation of edge degradation in ferroelectric memory devices thro...

Method for cleaning post-etch noble metal residues

Mitigation of edge degradation in ferroelectric memory devices thro...

Recessed drain extensions in transistor device

Process method to facilitate silicidation

Method for manufacturing a semiconductor device having silicided re...

Method for manufacturing a semiconductor device containing metal si...

Silicon recess improvement through improved post implant resist rem...

Method for manufacturing a silicided gate electrode using a buffer...

Clean for high density capacitors

Method for fabricating dual work function metal gates

Recessed drain extensions in transistor device

Drive current improvement from recessed SiGe incorporation close to...

FRAM capacitor stack clean

Ferroelectric capacitor stack etch cleaning methods

Transistor fabrication methods using dual sidewall spacers

Method for using a wet etch to manufacturing a semiconductor device...

Ferroelectric capacitor having a substantially planar dielectric la...

Increased drive current by isotropic recess etch

Surface treatment of copper to improve interconnect formation

Use of amorphous aluminum oxide on a capacitor sidewall for use as...

FeRAM capacitor post stack etch clean/repair

Stabilization of peroxygen-containing slurries used in a chemical m...

Integrated circuit planarization method

Piranha etch preparation having long shelf life and method of makin...

Patents Applicationslast 30 patents

METHOD TO IMPROVE SEMICONDUCTOR SURFACES AND POLISHING

UNIFORM HEIGHT REPLACEMENT METAL GATE

METHOD TO IMPROVE SEMICONDUCTOR SURFACES AND POLISHING

OVERLAPPING CONTACTS FOR SEMICONDUCTOR DEVICE

OVERLAPPING CONTACTS FOR SEMICONDUCTOR DEVICE

MITIGATION OF EDGE DEGRADATION IN FERROELECTRIC MEMORY DEVICES THRO...

MITIGATION OF EDGE DEGRADATION IN FERROELECTRIC MEMORY DEVICES THRO...

Mitigation of gate to contact capacitance in CMOS flow

GCIB smoothing of the contact level to improve PZT films

METHOD FOR CLEANING POST-ETCH NOBLE METAL RESIDUES

Recessed Drain Extensions in Transistor Device

Mitigation of edge degradation in ferroelectric memory devices thro...

Novel method for manufacturing a semiconductor device containing me...

Ferroelectric capacitor stack etch cleaning methods

Method for fabricating dual work function metal gates

Method for manufacturing a silicided gate electrode using a buffer...

Recessed drain extensions in transistor device

Increased drive current by isotropic recess etch

Method for manufacturing a semiconductor device having silicided re...

Silicon recess improvement through improved post implant resist rem...

Transistor fabrication methods using dual sidewall spacers

Process method to facilitate silicidation

Surface treatment of copper to improve interconnect formation

Ferroelectric capacitor having a substantially planar dielectric la...

Recess reduction for leakage improvement in high density capacitors

Method for using a wet etch to manufacturing a semiconductor device...

Drive current improvement from recessed SiGe incorporation close to...

FRAM capacitor stack clean

FRAM capacitor stack clean

Wet clean method for PZT capacitors