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Lorenz-Peter Schmidt
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Hessdorf, DE
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for calibrating a measuring arrangement and chara...
Patent number
10,451,453
Issue date
Oct 22, 2019
Rohde & Schwarz GmbH & Co. KG
Lorenz-Peter Schmidt
G01 - MEASURING TESTING
Information
Patent Grant
Reconfigurable bandpass filter based on a planar combline filter co...
Patent number
9,160,045
Issue date
Oct 13, 2015
IAD Gesellschaft für Informatik, Automatisierung und Datenverarbeitung mbH
Hermann Hampel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device and method for the improved directional estimation and decod...
Patent number
8,253,622
Issue date
Aug 28, 2012
IAD Gesellschaft für Informatik, Automatisierung und Datenverarbeitung mbH
Hermann Hampel
G01 - MEASURING TESTING
Information
Patent Grant
Ferrite filter comprising aperture-coupled fin lines
Patent number
8,207,801
Issue date
Jun 26, 2012
Rohde & Schwarz GmbH & Co. KG
Michael Sterns
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for determining a distance to a target object
Patent number
8,174,434
Issue date
May 8, 2012
Valeo Schalter und Sensoren GmbH
Frank Künzler
G01 - MEASURING TESTING
Information
Patent Grant
Magnetically tunable filter with coplanar lines
Patent number
8,120,449
Issue date
Feb 21, 2012
Rohde & Schwarz GmbH & Co. KG
Michael Aigle
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for high-resolution imaging of test objects by el...
Patent number
7,710,307
Issue date
May 4, 2010
Smiths Heimann GmbH
Jochen Weinzierl
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance system with radio-frequency shield with frequenc...
Patent number
7,642,780
Issue date
Jan 5, 2010
Siemens Aktiengesellschaft
Dirk Diehl
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for imaging test objects by means of electromagne...
Patent number
7,609,196
Issue date
Oct 27, 2009
Smiths Heimann GmbH
Michael Jeck
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR CALIBRATING A MEASURING ARRANGEMENT AND CHARA...
Publication number
20150292921
Publication date
Oct 15, 2015
Rohde& Schwarz GmbH & Co. KG
Lorenz-Peter SCHMIDT
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR MEASURING THE LOCATION OF A PARTICLE BEAM PRE...
Publication number
20130113503
Publication date
May 9, 2013
Marcel Ruf
G01 - MEASURING TESTING
Information
Patent Application
RECONFIGURABLE BANDPASS FILTER BASED ON A PLANAR COMBLINE FILTER CO...
Publication number
20130063228
Publication date
Mar 14, 2013
IAD Gesellschaft Fur Informatik, Automatisierung Und Datenverarbeitung MBH
Hermann Hampel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE AND METHOD FOR THE IMPROVED DIRECTIONAL ESTIMATION AND DECOD...
Publication number
20110001659
Publication date
Jan 6, 2011
iAD Gesellschaft Fur Informatik Automatisierung und Datenverabetung
Hermann Hampel
G01 - MEASURING TESTING
Information
Patent Application
Method and device for determining a distance to a target object
Publication number
20100007548
Publication date
Jan 14, 2010
Frank Künzler
G01 - MEASURING TESTING
Information
Patent Application
Ferrite Filter Comprising Aperture-Coupled Fin Lines
Publication number
20090179717
Publication date
Jul 16, 2009
Michael Sterns
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND DEVICE FOR HIGH-RESOLUTION IMAGING OF TEST OBJECTS BY EL...
Publication number
20090051586
Publication date
Feb 26, 2009
Jochen Weinzierl
G01 - MEASURING TESTING
Information
Patent Application
Magnetically Tunable Filter with Coplanar Lines
Publication number
20090039983
Publication date
Feb 12, 2009
ROHDE &SCHWARZ GMBH & CO. KG
Michael Aigle
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC RESONANCE SYSTEM WITH RADIO-FREQUENCY SHIELD WITH FREQUENC...
Publication number
20080231276
Publication date
Sep 25, 2008
Dirk Diehl
G01 - MEASURING TESTING