Lynda C. Mantalas

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Campbell, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Chemical mechanical polishing test structures and methods for inspe...
- Patent number 7,655,482
- Issue date Feb 2, 2010
- KLA Tencor
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical mechanical polishing test structures and methods for inspe...
- Patent number 7,179,661
- Issue date Feb 20, 2007
- KLA Tencor
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures and methods for inspection of semiconductor integra...
- Patent number 6,921,672
- Issue date Jul 26, 2005
- KLA-Tencor Technologies Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Inspectable buried test structures and methods for inspecting the same
- Patent number 6,576,923
- Issue date Jun 10, 2003
- KLA-Tencor Corporation
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures and methods for inspection of semiconductor integra...
- Patent number 6,528,818
- Issue date Mar 4, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Inspectable buried test structures and methods for inspecting the same
- Patent number 6,509,197
- Issue date Jan 21, 2003
- KLA-Tencor Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...
- Publication number 20080246030
- Publication date Oct 9, 2008
- KLA-TENCOR
- Akella V.S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHEMICAL MECHANICAL POLISHING TEST STRUCTURES AND METHODS FOR INSPE...
- Publication number 20070111342
- Publication date May 17, 2007
- KLA-TENCOR
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test structures and methods for inspection of semiconductor integra...
- Publication number 20030096436
- Publication date May 22, 2003
- KLA-Tencor Technologies Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Application
Inspectable buried test structures and methods for inspecting the same
- Publication number 20020187582
- Publication date Dec 12, 2002
- KLA-Tencor Corporation
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS