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Lyndon R. LOGAN
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Poughkeepsie, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Source/drain epitaxial electrical monitor
Patent number
9,972,550
Issue date
May 15, 2018
GLOBALFOUNDRIES INC.
Edward J. Nowak
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Capacitive measurements of divots in semiconductor devices
Patent number
9,941,179
Issue date
Apr 10, 2018
GLOBALFOUNDRIES Inc.
Lyndon R. Logan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Extraction of resistance associated with laterally diffused dopant...
Patent number
9,852,956
Issue date
Dec 26, 2017
GLOBALFOUNDRIES, INC.
Lyndon Ronald Logan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fin-type PIN diode array
Patent number
9,318,622
Issue date
Apr 19, 2016
International Business Machines Corporation
Lyndon R. Logan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
ZRAM heterochannel memory
Patent number
9,105,707
Issue date
Aug 11, 2015
International Business Machines Corporation
Andres Bryant
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measuring current and resistance using combined diodes/resistor str...
Patent number
9,059,190
Issue date
Jun 16, 2015
International Business Machines Corporation
Lyndon R. Logan
G01 - MEASURING TESTING
Information
Patent Grant
Measuring current and resistance using combined diodes/resistor str...
Patent number
8,709,833
Issue date
Apr 29, 2014
International Business Machines Corporation
Lyndon R. Logan
G01 - MEASURING TESTING
Information
Patent Grant
Diagnostic method for root-cause analysis of FET performance variation
Patent number
8,000,935
Issue date
Aug 16, 2011
International Business Machines Corporation
Lyndon R. Logan
G01 - MEASURING TESTING
Information
Patent Grant
Diagnostic method for root-cause analysis of FET performance variation
Patent number
7,587,298
Issue date
Sep 8, 2009
International Business Machines Corporation
Lyndon R. Logan
G01 - MEASURING TESTING
Information
Patent Grant
Method and structure to reduce CMOS inter-well leakage
Patent number
6,946,710
Issue date
Sep 20, 2005
International Business Machines Corporation
Lyndon R. Logan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of controlling floating body effects in an asymmetrical SOI...
Patent number
6,756,637
Issue date
Jun 29, 2004
International Business Machines Corporation
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and structure to reduce CMOS inter-well leakage
Patent number
6,686,252
Issue date
Feb 3, 2004
International Business Machines Corporation
Lyndon R. Logan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to suppress subthreshold leakage due to sharp isolation corn...
Patent number
6,144,081
Issue date
Nov 7, 2000
International Business Machines Corporation
Louis Lu-Chen Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to suppress subthreshold leakage due to sharp isolation corn...
Patent number
5,567,553
Issue date
Oct 22, 1996
International Business Machines Corporation
Louis L. Hsu
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SOURCE/DRAIN EPITAXIAL ELECTRICAL MONITOR
Publication number
20170098585
Publication date
Apr 6, 2017
GLOBALFOUNDRIES Inc.
Edward J. NOWAK
G01 - MEASURING TESTING
Information
Patent Application
HIGH VOLTAGE FINFET STRUCTURE WITH SHAPED DRIFT REGION
Publication number
20170062609
Publication date
Mar 2, 2017
GLOBALFOUNDRIES INC.
Lyndon R. Logan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH VOLTAGE FINFET STRUCTURE WITH SHAPED DRIFT REGION
Publication number
20160380095
Publication date
Dec 29, 2016
International Business Machines Corporation
Lyndon R. Logan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CAPACITIVE MEASUREMENTS OF DIVOTS IN SEMICONDUCTOR DEVICES
Publication number
20160370311
Publication date
Dec 22, 2016
International Business Machines Corporation
Lyndon R. LOGAN
G01 - MEASURING TESTING
Information
Patent Application
EXTRACTION OF RESISTANCE ASSOCIATED WITH LATERALLY DIFFUSED DOPANT...
Publication number
20160225680
Publication date
Aug 4, 2016
GLOBALFOUNDRIES INC.
Lyndon Ronald Logan
G01 - MEASURING TESTING
Information
Patent Application
ZRAM HETEROCHANNEL MEMORY
Publication number
20150028397
Publication date
Jan 29, 2015
International Business Machines Corporation
Andres BRYANT
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEASURING CURRENT AND RESISTANCE USING COMBINED DIODES/RESISTOR STR...
Publication number
20140191235
Publication date
Jul 10, 2014
International Business Machines Corporation
Lyndon R. Logan
G01 - MEASURING TESTING
Information
Patent Application
MEASURING CURRENT AND RESISTANCE USING COMBINED DIODES/RESISTOR STR...
Publication number
20130161615
Publication date
Jun 27, 2013
International Business Machines Corporation
Lyndon R. Logan
G01 - MEASURING TESTING
Information
Patent Application
DIAGNOSTIC METHOD FOR ROOT-CAUSE ANALYSIS OF FET PERFORMANCE VARIATION
Publication number
20090234617
Publication date
Sep 17, 2009
International Business Machines Corporation
Lyndon R. Logan
G01 - MEASURING TESTING
Information
Patent Application
DIAGNOSTIC METHOD FOR ROOT-CAUSE ANALYSIS OF FET PERFORMANCE VARIATION
Publication number
20090099819
Publication date
Apr 16, 2009
International Business Machines Corporation
Lyndon R. Logan
G01 - MEASURING TESTING
Information
Patent Application
Method of controlling floating body effects in an asymmetrical SOI...
Publication number
20040173847
Publication date
Sep 9, 2004
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and structure to reduce CMOS inter-well leakage
Publication number
20040166620
Publication date
Aug 26, 2004
Lyndon R. Logan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of controlling floating body effects in an asymmetrical SOI...
Publication number
20030006459
Publication date
Jan 9, 2003
International Business Machines Corporation
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and structure to reduce CMOS inter-well leakage
Publication number
20020135024
Publication date
Sep 26, 2002
International Business Machines Corporation
Lyndon R. Logan
H01 - BASIC ELECTRIC ELEMENTS