Mark W. Nightingale

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for probing
- Patent number 8,067,718
- Issue date Nov 29, 2011
- Tektronix, Inc.
- Robert A. Nordstrom
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition probe having a retractable double cushioned prob...
- Patent number 7,362,112
- Issue date Apr 22, 2008
- Tektronix, Inc.
- Kei-Wean C. Yang
- G01 - MEASURING TESTING
Information Patent Grant
Inverted strain relief
- Patent number 6,989,492
- Issue date Jan 24, 2006
- Tektronix, Inc.
- Mark W. Nightingale
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Surface mount probe point socket and system
- Patent number 6,659,812
- Issue date Dec 9, 2003
- Tektronix, Inc.
- Marc A. Gessford
- G01 - MEASURING TESTING
Information Patent Grant
Deskew fixture
- Patent number 6,614,221
- Issue date Sep 2, 2003
- Tektronix, Inc.
- Kelly F. Cushing
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip adapter for a measurement probe
- Patent number 6,603,297
- Issue date Aug 5, 2003
- Tektronix, Inc.
- Marc A. Gessford
- G01 - MEASURING TESTING
Information Patent Grant
Probe head holder
- Patent number 6,600,330
- Issue date Jul 29, 2003
- Tektronix, Inc.
- Mark W. Nightingale
- G01 - MEASURING TESTING
Information Patent Grant
Replaceable probe tip holder and measurement probe head
- Patent number 6,466,000
- Issue date Oct 15, 2002
- Tektronix, Inc.
- Mark W. Nightingale
- G01 - MEASURING TESTING
Information Patent Grant
Attachable/detachable probing point
- Patent number 6,459,287
- Issue date Oct 1, 2002
- Tektronix, Inc.
- Mark W. Nightingale
- G01 - MEASURING TESTING
Information Patent Grant
Variable spacing probe tip adapter for a measurement probe
- Patent number 6,404,215
- Issue date Jun 11, 2002
- Tektronix, Inc.
- Mark W. Nightingale
- G01 - MEASURING TESTING
Information Patent Grant
Electronic interconnect device for high speed signal and data trans...
- Patent number 6,402,565
- Issue date Jun 11, 2002
- Tektronix, Inc.
- William R. Pooley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe tip adapter for a measurement probe
- Patent number 6,400,167
- Issue date Jun 4, 2002
- Tektronix, Inc.
- Marc A. Gessford
- G01 - MEASURING TESTING
Information Patent Grant
Measurement probe having an internal alignment fixture
- Patent number 6,218,826
- Issue date Apr 17, 2001
- Tektronix, Inc.
- Mark W. Nightingale
- G01 - MEASURING TESTING
Information Patent Grant
Adapter for a measurement test probe
- Patent number 6,191,594
- Issue date Feb 20, 2001
- Tektronix, Inc.
- Mark W. Nightingale
- G01 - MEASURING TESTING
Information Patent Grant
Strain relief, pull-strength termination with controlled impedance...
- Patent number 6,175,080
- Issue date Jan 16, 2001
- Tektronix, Inc.
- Mark W. Nightingale
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Positioning aid for a hand-held electrical test probe
- Patent number 5,387,872
- Issue date Feb 7, 1995
- Tektronix, Inc.
- Mark W. Nightingale
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probe
- Patent number D346338
- Issue date Apr 26, 1994
- Tektronix, Inc.
- Mark W. Nightingale
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Probing head for an electrical test probe
- Patent number D346122
- Issue date Apr 19, 1994
- Tektronix, Inc.
- Mark W. Nightingale
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Head assembly for a switchable electrical test probe
- Patent number D344681
- Issue date Mar 1, 1994
- Tektronix, Inc.
- Mark W. Nightingale
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Surface mounted electrical switch and probe structure
- Patent number 5,220,274
- Issue date Jun 15, 1993
- Tektronix, Inc.
- Mark W. Nightingale
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probe
- Patent number D334147
- Issue date Mar 23, 1993
- Tektronix, Inc.
- Glen Aukstikalnis
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Electrical test probe having integral strain relief and ground conn...
- Patent number 5,061,892
- Issue date Oct 29, 1991
- Tektronix, Inc.
- Steve O'Hara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Differential Measurement Probe Having a Ground Clip System for the...
- Publication number 20080309356
- Publication date Dec 18, 2008
- Tektronix, Inc.
- Kei-Wean C. Yang
- G01 - MEASURING TESTING
Information Patent Application
Differential Measurement Probe Having a Ground Clip System for the...
- Publication number 20080309357
- Publication date Dec 18, 2008
- Tektronix, Inc.
- Kei-Wean C. Yang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for probing
- Publication number 20070257025
- Publication date Nov 8, 2007
- Robert A. Nordstrom
- G01 - MEASURING TESTING
Information Patent Application
Differential Measurement Probe Having a Ground Clip System for the...
- Publication number 20070159195
- Publication date Jul 12, 2007
- Tektronix, Inc.
- Kei-Wean C. Yang
- G01 - MEASURING TESTING
Information Patent Application
Signal acquisition probe having a retractable double cushioned prob...
- Publication number 20060267602
- Publication date Nov 30, 2006
- Kei-Wean C. Yang
- G01 - MEASURING TESTING
Information Patent Application
Differential measurement probe having a ground clip system for the...
- Publication number 20060267605
- Publication date Nov 30, 2006
- Kei-Wean C. Yang
- G01 - MEASURING TESTING
Information Patent Application
INVERTED STRAIN RELIEF
- Publication number 20050263317
- Publication date Dec 1, 2005
- Mark W. Nightingale
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE MOUNT PROBE POINT SOCKET AND SYSTEM
- Publication number 20030199208
- Publication date Oct 23, 2003
- Marc A. Gessford
- G01 - MEASURING TESTING
Information Patent Application
Probe head holder
- Publication number 20030132744
- Publication date Jul 17, 2003
- Mark W. Nightingale
- G01 - MEASURING TESTING
Information Patent Application
Deskew fixture
- Publication number 20030128023
- Publication date Jul 10, 2003
- Kelly F. Cushing
- G01 - MEASURING TESTING

Mark W. Nightingale

Person

Patents Grantslast 30 patents

Method and apparatus for probing

Signal acquisition probe having a retractable double cushioned prob...

Inverted strain relief

Surface mount probe point socket and system

Deskew fixture

Probe tip adapter for a measurement probe

Probe head holder

Replaceable probe tip holder and measurement probe head

Attachable/detachable probing point

Variable spacing probe tip adapter for a measurement probe

Electronic interconnect device for high speed signal and data trans...

Probe tip adapter for a measurement probe

Measurement probe having an internal alignment fixture

Adapter for a measurement test probe

Strain relief, pull-strength termination with controlled impedance...

Positioning aid for a hand-held electrical test probe

Electrical test probe

Probing head for an electrical test probe

Head assembly for a switchable electrical test probe

Surface mounted electrical switch and probe structure

Electrical test probe

Electrical test probe having integral strain relief and ground conn...

Patents Applicationslast 30 patents

Differential Measurement Probe Having a Ground Clip System for the...

Differential Measurement Probe Having a Ground Clip System for the...

Method and apparatus for probing

Differential Measurement Probe Having a Ground Clip System for the...

Signal acquisition probe having a retractable double cushioned prob...

Differential measurement probe having a ground clip system for the...

INVERTED STRAIN RELIEF

SURFACE MOUNT PROBE POINT SOCKET AND SYSTEM

Probe head holder

Deskew fixture