Martin Buehler

Person

La Canada, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electro-active sensor, method for constructing the same; apparatus...
- Patent number 7,578,912
- Issue date Aug 25, 2009
- California Institute of Technology
- Martin Buehler
- G01 - MEASURING TESTING
Information Patent Grant
Electronic tongue
- Patent number 6,730,201
- Issue date May 4, 2004
- California Institute of Technology
- Kimberly Kuhlman
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensor test chip
- Patent number 6,709,635
- Issue date Mar 23, 2004
- California Institute of Technology
- Martin Buehler
- G01 - MEASURING TESTING
Information Patent Grant
Multi-sensor electrometer
- Patent number 6,518,765
- Issue date Feb 11, 2003
- California Institute of Technology
- Raymond Gompf
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensor test chip sensing method
- Patent number 6,040,189
- Issue date Mar 21, 2000
- California Institute of Technology
- Martin Buehler
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensor test chip
- Patent number 5,945,069
- Issue date Aug 31, 1999
- California Institute of Technology
- Martin Buehler
- G01 - MEASURING TESTING
Information Patent Grant
Alpha-particle gas-pressure sensor
- Patent number 5,925,823
- Issue date Jul 20, 1999
- California Institute of Technology
- Martin G. Buehler
- G01 - MEASURING TESTING
Information Patent Grant
Integrated charge monitor
- Patent number 5,753,920
- Issue date May 19, 1998
- California Institute of Technology
- Martin G. Buehler
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing the upset response of CMOS circuits using...
- Patent number 5,396,169
- Issue date Mar 7, 1995
- Lynx Golf Inc.
- Martin G. Buehler
- G11 - INFORMATION STORAGE
Information Patent Grant
p-MOSFET total dose dosimeter
- Patent number 5,332,903
- Issue date Jul 26, 1994
- California Institute of Technology
- Martin G. Buehler
- G11 - INFORMATION STORAGE
Information Patent Grant
Particle sensor array
- Patent number 5,331,164
- Issue date Jul 19, 1994
- California Institute of Technology
- Martin G. Buehler
- G11 - INFORMATION STORAGE
Information Patent Grant
Asymmetric soft-error resistant memory
- Patent number 5,048,023
- Issue date Sep 10, 1991
- The United States of America as represented by the Administrator, National Ae...
- Martin G. Buehler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit reliability testing
- Patent number 4,918,377
- Issue date Apr 17, 1990
- The United States of America as represented by the administrator of the Natio...
- Martin G. Buehler
- G01 - MEASURING TESTING
Information Patent Grant
Addressable test matrix for measuring analog transfer characteristi...
- Patent number 4,719,411
- Issue date Jan 12, 1988
- California Institute of Technology
- Martin G. Buehler
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for characterizing propagation delays of integ...
- Patent number 4,688,947
- Issue date Aug 25, 1987
- California Institute of Technology
- Brent R. Blaes
- G01 - MEASURING TESTING
Information Patent Grant
Split-cross-bridge resistor for testing for proper fabrication of i...
- Patent number 4,516,071
- Issue date May 7, 1985
- The United States of America as represented by the Administration of the Unit...
- Martin G. Buehler
- G01 - MEASURING TESTING

Martin Buehler

Person

Patents Grantslast 30 patents

Electro-active sensor, method for constructing the same; apparatus...

Electronic tongue

Gas sensor test chip

Multi-sensor electrometer

Gas sensor test chip sensing method

Gas sensor test chip

Alpha-particle gas-pressure sensor

Integrated charge monitor

Method for characterizing the upset response of CMOS circuits using...

p-MOSFET total dose dosimeter

Particle sensor array

Asymmetric soft-error resistant memory

Integrated circuit reliability testing

Addressable test matrix for measuring analog transfer characteristi...

Method and apparatus for characterizing propagation delays of integ...

Split-cross-bridge resistor for testing for proper fabrication of i...