Mary C. Adams

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DeSoto, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for reducing gate oxide damage caused by charging
- Patent number 6,222,228
- Issue date Apr 24, 2001
- Texas Instruments Incorporated
- Farris D. Malone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing gate oxide damage caused by charging
- Patent number 6,218,218
- Issue date Apr 17, 2001
- Texas Instruments Incorporated
- Farris D. Malone
- H01 - BASIC ELECTRIC ELEMENTS