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Charged particle beam device
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Patent number 9,263,232
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Issue date Feb 16, 2016
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Hitachi High-Technologies Corporation
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Yusuke Ominami
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H01 - BASIC ELECTRIC ELEMENTS
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Scanning electron microscope
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Patent number 8,809,782
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Issue date Aug 19, 2014
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Hitachi High-Technologies Corporation
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Tomohisa Ohtaki
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F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
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Portion of an electron microscope
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Patent number D635167
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Issue date Mar 29, 2011
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Hitachi High-Technologies Corporation
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Mitsuru Oonuma
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D16 - Photography and optical equipment
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Portion of an electron microscope
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Patent number D635168
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Issue date Mar 29, 2011
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Hitachi High-Technologies Corporation
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Mitsuru Oonuma
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D16 - Photography and optical equipment
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Electron microscope
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Patent number D633537
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Issue date Mar 1, 2011
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Hitachi High-Technologies Corporation
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Mitsuru Oonuma
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D16 - Photography and optical equipment
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Electron microscope
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Patent number D633538
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Issue date Mar 1, 2011
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Hitachi High-Technologies Corporation
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Mitsuru Oonuma
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D16 - Photography and optical equipment
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Electron microscope
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Patent number D632323
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Issue date Feb 8, 2011
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Hitachi High-Technologies Corporation
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Mitsuru Oonuma
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D16 - Photography and optical equipment
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Electron microscope
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Patent number D626579
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Issue date Nov 2, 2010
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Hitachi High-Technologies Corporation
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Mitsuru Oonuma
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D16 - Photography and optical equipment
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Electron microscope
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Patent number D625749
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Issue date Oct 19, 2010
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Hitachi High-Technologies Corporation
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Mitsuru Oonuma
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D16 - Photography and optical equipment
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Electron microscope
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Patent number D623211
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Issue date Sep 7, 2010
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Hitachi High-Technologies Corporation
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Mitsuru Oonuma
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D16 - Photography and optical equipment