Masatoshi Kanamaru

Person

Inashiki-gun, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Physical quantity sensor
- Patent number 10,989,731
- Issue date Apr 27, 2021
- HITACHI AUTOMOTIVE SYSTEMS, LTD.
- Masatoshi Kanamaru
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Physical quantity sensor
- Patent number 9,890,037
- Issue date Feb 13, 2018
- Hitachi Automotive Systems, Ltd.
- Masatoshi Kanamaru
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Structure of physical sensor
- Patent number 9,651,408
- Issue date May 16, 2017
- Hitachi Automotive Systems, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Process for fabricating MEMS device
- Patent number 9,249,011
- Issue date Feb 2, 2016
- Hitachi, Ltd.
- Masatoshi Kanamaru
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical switch and optical switch array
- Patent number 7,505,646
- Issue date Mar 17, 2009
- Hitachi Metals, Ltd.
- Yukio Katou
- G02 - OPTICS
Information Patent Grant
Optical head, optical information storage apparatus, and their fabr...
- Patent number 7,457,206
- Issue date Nov 25, 2008
- Hitachi, Ltd.
- Takeshi Shimano
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of manufacturing semiconductor apparatus
- Patent number 7,119,362
- Issue date Oct 10, 2006
- Renesas Technology Corp.
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a semiconductor device including defect ins...
- Patent number 7,018,857
- Issue date Mar 28, 2006
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 6,955,870
- Issue date Oct 18, 2005
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for carrying out inspection of a semiconductor de...
- Patent number 6,952,110
- Issue date Oct 4, 2005
- Renesas Technology Corporation
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Packaging device for holding a plurality of semiconductor devices t...
- Patent number 6,864,568
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and semiconductor device man...
- Patent number 6,864,695
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and method for manufacturing...
- Patent number 6,828,810
- Issue date Dec 7, 2004
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
- Patent number 6,774,654
- Issue date Aug 10, 2004
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection apparatus
- Patent number 6,714,030
- Issue date Mar 30, 2004
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and a manufacturing method thereof
- Patent number 6,660,541
- Issue date Dec 9, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,573,112
- Issue date Jun 3, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing substrate for inspecting semiconductor device
- Patent number 6,566,149
- Issue date May 20, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Manufacture method for semiconductor inspection apparatus
- Patent number 6,548,315
- Issue date Apr 15, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device utilizing semiconduct...
- Patent number 6,531,327
- Issue date Mar 11, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Process for manufacturing semiconductor device
- Patent number 6,511,857
- Issue date Jan 28, 2003
- Hitachi, Ltd.
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing equipment with probe formed on a cantilever o...
- Patent number 6,507,204
- Issue date Jan 14, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
- Patent number 6,496,023
- Issue date Dec 17, 2002
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,479,305
- Issue date Nov 12, 2002
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing semiconductor device and apparatus usable therein
- Patent number 6,465,264
- Issue date Oct 15, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Water quality meter and water quality monitoring system
- Patent number 6,444,172
- Issue date Sep 3, 2002
- Hitachi, Ltd.
- Masao Fukunaga
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Grant
Water quality meter and water quality monitoring system
- Patent number 6,398,930
- Issue date Jun 4, 2002
- Hitachi, Ltd.
- Masao Fukunaga
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Grant
Manufacture method for semiconductor inspection apparatus
- Patent number 6,358,762
- Issue date Mar 19, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Water quality meter and water monitoring system
- Patent number 6,290,908
- Issue date Sep 18, 2001
- Hitachi, Ltd.
- Masao Fukunaga
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Grant
Slider unit controllably actuated at a surface of a moving informat...
- Patent number 5,276,573
- Issue date Jan 4, 1994
- Hitachi, Ltd.
- Takeshi Harada
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PRESSURE SENSOR MODULE AND DISPENSING DEVICE INCLUDING PRESSURE SEN...
- Publication number 20240408560
- Publication date Dec 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Masatoshi KANAMARU
- G01 - MEASURING TESTING
Information Patent Application
Pressure Sensor
- Publication number 20240353278
- Publication date Oct 24, 2024
- Hitachi High-Tech Corporation
- Tatsuya YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...
- Publication number 20240231064
- Publication date Jul 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro YOSHIMURA
- G02 - OPTICS
Information Patent Application
Pressure Sensor Module and Dispensing Device
- Publication number 20240230441
- Publication date Jul 11, 2024
- Hitachi High-Tech Corporation
- Masatoshi KANAMARU
- G01 - MEASURING TESTING
Information Patent Application
Pressure Sensor Module and Dispensing Device
- Publication number 20240133757
- Publication date Apr 25, 2024
- Hitachi High-Tech Corporation
- Masatoshi KANAMARU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...
- Publication number 20240134175
- Publication date Apr 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro YOSHIMURA
- G02 - OPTICS
Information Patent Application
PHYSICAL QUANTITY SENSOR
- Publication number 20180275159
- Publication date Sep 27, 2018
- Hitachi Automotive Systems, Ltd.
- Masatoshi KANAMARU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Physical Quantity Sensor
- Publication number 20170233246
- Publication date Aug 17, 2017
- Hitachi Automotive Systems, Ltd.
- Masatoshi KANAMARU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Structure of Physical Sensor
- Publication number 20160003650
- Publication date Jan 7, 2016
- Hitachi Automotive Systems, Ltd.
- Masatoshi KANAMARU
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE AND PROCESS FOR PRODUCING SAME
- Publication number 20150028438
- Publication date Jan 29, 2015
- Hitachi, Ltd
- Masatoshi Kanamaru
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
NON-CONTACT POWER TRANSMISSION DEVICE AND NEAR-FIELD ANTENNA FOR SAME
- Publication number 20130009488
- Publication date Jan 10, 2013
- Hitachi, Ltd
- Seong-Hun Choe
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Vehicle Headlight and Vehicle Operation Support Apparatus
- Publication number 20080043481
- Publication date Feb 21, 2008
- Hitachi, Ltd
- Shingo Yokoyama
- G02 - OPTICS
Information Patent Application
PROCESS OF FABRICATING MICROLENS MOLD
- Publication number 20070194472
- Publication date Aug 23, 2007
- Irizo Naniwa
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Optical head, optical information storage apparatus, and their fabr...
- Publication number 20070171557
- Publication date Jul 26, 2007
- Takeshi Shimano
- G11 - INFORMATION STORAGE
Information Patent Application
Process of microlens mold
- Publication number 20070102842
- Publication date May 10, 2007
- Irizo Naniwa
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Light switch and light switch array
- Publication number 20060219879
- Publication date Oct 5, 2006
- Yukio Katou
- G02 - OPTICS
Information Patent Application
Optical head, optical information storage apparatus, and their fabr...
- Publication number 20060193214
- Publication date Aug 31, 2006
- Takeshi Shimano
- G11 - INFORMATION STORAGE
Information Patent Application
Manufacturing method of semiconductor device
- Publication number 20050074910
- Publication date Apr 7, 2005
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus for carrying out inspection of a semiconductor de...
- Publication number 20050032252
- Publication date Feb 10, 2005
- Renesas Technology Corporation
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor inspection apparatus
- Publication number 20030189439
- Publication date Oct 9, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus and method for manufacturing...
- Publication number 20030122550
- Publication date Jul 3, 2003
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and a manufacturing method thereof
- Publication number 20030113944
- Publication date Jun 19, 2003
- Hitachi, Ltd
- Masatoshi Kanamaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a semicondutor device
- Publication number 20030104641
- Publication date Jun 5, 2003
- Hitachi, Ltd
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...
- Publication number 20030102880
- Publication date Jun 5, 2003
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing semiconductor apparatus
- Publication number 20030092206
- Publication date May 15, 2003
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device manufacturing method
- Publication number 20030027365
- Publication date Feb 6, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Packaging device for holding a plurality of semiconductor devices t...
- Publication number 20030015779
- Publication date Jan 23, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Manufacture method for semiconductor inspection apparatus
- Publication number 20020086451
- Publication date Jul 4, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing semiconductor device utilizing semiconduct...
- Publication number 20020072136
- Publication date Jun 13, 2002
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20020064893
- Publication date May 30, 2002
- RYUJI KONO
- H01 - BASIC ELECTRIC ELEMENTS

Masatoshi Kanamaru

Person

Patents Grantslast 30 patents

Physical quantity sensor

Physical quantity sensor

Structure of physical sensor

Process for fabricating MEMS device

Optical switch and optical switch array

Optical head, optical information storage apparatus, and their fabr...

Method of manufacturing semiconductor apparatus

Method of manufacturing a semiconductor device including defect ins...

Method of manufacturing a semiconductor device

Testing apparatus for carrying out inspection of a semiconductor de...

Packaging device for holding a plurality of semiconductor devices t...

Semiconductor device testing apparatus and semiconductor device man...

Semiconductor device testing apparatus and method for manufacturing...

Semiconductor-device inspecting apparatus and a method for manufact...

Semiconductor inspection apparatus

Semiconductor device and a manufacturing method thereof

Semiconductor device manufacturing method

Method for manufacturing substrate for inspecting semiconductor device

Manufacture method for semiconductor inspection apparatus

Method for manufacturing semiconductor device utilizing semiconduct...

Process for manufacturing semiconductor device

Semiconductor testing equipment with probe formed on a cantilever o...

Semiconductor-device inspecting apparatus and a method for manufact...

Semiconductor device manufacturing method

Method for producing semiconductor device and apparatus usable therein

Water quality meter and water quality monitoring system

Water quality meter and water quality monitoring system

Manufacture method for semiconductor inspection apparatus

Water quality meter and water monitoring system

Slider unit controllably actuated at a surface of a moving informat...

Patents Applicationslast 30 patents

PRESSURE SENSOR MODULE AND DISPENSING DEVICE INCLUDING PRESSURE SEN...

Pressure Sensor

OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...

Pressure Sensor Module and Dispensing Device

Pressure Sensor Module and Dispensing Device

OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...

PHYSICAL QUANTITY SENSOR

Physical Quantity Sensor

Structure of Physical Sensor

MEMS DEVICE AND PROCESS FOR PRODUCING SAME

NON-CONTACT POWER TRANSMISSION DEVICE AND NEAR-FIELD ANTENNA FOR SAME

Vehicle Headlight and Vehicle Operation Support Apparatus

PROCESS OF FABRICATING MICROLENS MOLD

Optical head, optical information storage apparatus, and their fabr...

Process of microlens mold

Light switch and light switch array

Optical head, optical information storage apparatus, and their fabr...

Manufacturing method of semiconductor device

Testing apparatus for carrying out inspection of a semiconductor de...

Semiconductor inspection apparatus

Semiconductor device testing apparatus and method for manufacturing...

Semiconductor device and a manufacturing method thereof

Method of manufacturing a semicondutor device

SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...

Method of manufacturing semiconductor apparatus

Semiconductor device manufacturing method

Packaging device for holding a plurality of semiconductor devices t...

Manufacture method for semiconductor inspection apparatus

Method for manufacturing semiconductor device utilizing semiconduct...

SEMICONDUCTOR DEVICE MANUFACTURING METHOD