Masayuki Ikeda

Person

Kobe-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Specimen analyzing apparatus and specimen analyzing method
- Patent number 9,068,956
- Issue date Jun 30, 2015
- Sysmex Corporation
- Kazuya Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analyzing apparatus and specimen analyzing method
- Patent number 8,234,941
- Issue date Aug 7, 2012
- Sysmex Corporation
- Kazuya Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analysis apparatus and specimen analysis method
- Patent number 8,119,081
- Issue date Feb 21, 2012
- Sysmex Corporation
- Yousuke Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer
- Patent number 7,955,556
- Issue date Jun 7, 2011
- Sysmex Corporation
- Hiroki Koike
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzers, bacteria analyzers, and solutions for diluting an...
- Patent number 7,662,631
- Issue date Feb 16, 2010
- Sysmex Corporation
- Yasuyuki Kawashima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD
- Publication number 20120294763
- Publication date Nov 22, 2012
- SYSMEX CORPORATION
- Kazuya FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD
- Publication number 20100107744
- Publication date May 6, 2010
- SYSMEX CORPORATION
- Kazuya FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYZER AND LIQUID SUCTION ASSEMBLY
- Publication number 20090071269
- Publication date Mar 19, 2009
- SYSMEX CORPORATION
- Masayasu Sento
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYZER AND LIQUID SUCTION ASSEMBLY
- Publication number 20090074616
- Publication date Mar 19, 2009
- SYSMEX CORPORATION
- Masayasu SENTO
- G01 - MEASURING TESTING
Information Patent Application
Specimen analysis apparatus and specimen analysis method
- Publication number 20070231208
- Publication date Oct 4, 2007
- Sysmex Corporation
- Yousuke Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Analyzer
- Publication number 20050186113
- Publication date Aug 25, 2005
- Sysmex Corporation
- Hiroki Koike
- G01 - MEASURING TESTING
Information Patent Application
Sample analyzers, bacteria analyzers, and solutions for diluting an...
- Publication number 20040096931
- Publication date May 20, 2004
- Sysmex Corporation
- Yasuyuki Kawashima
- G01 - MEASURING TESTING

Masayuki Ikeda

Person

Patents Grantslast 30 patents

Specimen analyzing apparatus and specimen analyzing method

Specimen analyzing apparatus and specimen analyzing method

Specimen analysis apparatus and specimen analysis method

Analyzer

Sample analyzers, bacteria analyzers, and solutions for diluting an...

Patents Applicationslast 30 patents

SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD

SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD

SPECIMEN ANALYZER AND LIQUID SUCTION ASSEMBLY

SPECIMEN ANALYZER AND LIQUID SUCTION ASSEMBLY

Specimen analysis apparatus and specimen analysis method

Analyzer

Sample analyzers, bacteria analyzers, and solutions for diluting an...