Membership
Tour
Register
Log in
Michael C. Kutney
Follow
Person
Santa Clara, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Integrated substrate measurement system
Patent number
12,148,647
Issue date
Nov 19, 2024
Applied Materials, Inc.
Patricia Schulze
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated substrate measurement system to improve manufacturing pr...
Patent number
12,136,557
Issue date
Nov 5, 2024
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Adjustable achromatic collimator assembly for endpoint detection sy...
Patent number
12,066,639
Issue date
Aug 20, 2024
Applied Materials, Inc.
Pengyu Han
G02 - OPTICS
Information
Patent Grant
Multiple reflectometry for measuring etch parameters
Patent number
11,927,543
Issue date
Mar 12, 2024
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
Information
Patent Grant
Adjustable achromatic collimator assembly for endpoint detection sy...
Patent number
11,719,952
Issue date
Aug 8, 2023
Applied Materials, Inc.
Pengyu Han
G02 - OPTICS
Information
Patent Grant
Integrated substrate measurement system to improve manufacturing pr...
Patent number
11,688,616
Issue date
Jun 27, 2023
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spatial optical emission spectroscopy for etch uniformity
Patent number
11,668,602
Issue date
Jun 6, 2023
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
Information
Patent Grant
Multiple reflectometry for measuring etch parameters
Patent number
11,619,594
Issue date
Apr 4, 2023
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
Information
Patent Grant
Portion of a display panel with a graphical user interface
Patent number
D977504
Issue date
Feb 7, 2023
Applied Materials, Inc.
Upendra V. Ummethala
D14 - Recording, communication, or information retrieval equipment
Information
Patent Grant
Methods and apparatus for backside via reveal processing
Patent number
11,289,387
Issue date
Mar 29, 2022
Applied Materials, Inc.
Prayudi Lianto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low temperature thermal flow ratio controller
Patent number
11,150,120
Issue date
Oct 19, 2021
Applied Materials, Inc.
Michael Kutney
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for processing a substrate to remove moisture...
Patent number
11,054,184
Issue date
Jul 6, 2021
Applied Materials, Inc.
Michael C. Kutney
F26 - DRYING
Information
Patent Grant
Methods and apparatus for processing a substrate to remove moisture...
Patent number
10,247,473
Issue date
Apr 2, 2019
Applied Materials, Inc.
Michael C. Kutney
F26 - DRYING
Information
Patent Grant
Valve with adjustable hard stop
Patent number
9,982,786
Issue date
May 29, 2018
Applied Materials, Inc.
Michael C. Kutney
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Complex showerhead coating apparatus with electrospray for lithium...
Patent number
9,685,655
Issue date
Jun 20, 2017
Applied Materials, Inc.
Fei C. Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma reactor with minimal D.C. coils for cusp, solenoid and mirro...
Patent number
8,617,351
Issue date
Dec 31, 2013
Applied Materials, Inc.
Daniel J. Hoffman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Lower liner with integrated flow equalizer and improved conductance
Patent number
8,440,019
Issue date
May 14, 2013
Applied Materials, Inc.
James D. Carducci
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Plasma processing chamber with enhanced gas delivery
Patent number
8,382,939
Issue date
Feb 26, 2013
Applied Materials, Inc.
Michael Charles Kutney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Etching chamber having flow equalizer and lower liner
Patent number
8,313,578
Issue date
Nov 20, 2012
Applied Materials, Inc.
James D. Carducci
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Lower liner with integrated flow equalizer and improved conductance
Patent number
8,282,736
Issue date
Oct 9, 2012
Applied Materials, Inc.
James D. Carducci
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Lower liner with integrated flow equalizer and improved conductance
Patent number
8,118,938
Issue date
Feb 21, 2012
Applied Materials, Inc.
James D. Carducci
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Methods to avoid unstable plasma states during a process transition
Patent number
8,048,806
Issue date
Nov 1, 2011
Applied Materials, Inc.
Michael C. Kutney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Lower liner with integrated flow equalizer and improved conductance
Patent number
7,987,814
Issue date
Aug 2, 2011
Applied Materials, Inc.
James D. Carducci
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Method of plasma confinement for enhancing magnetic control of plas...
Patent number
7,780,866
Issue date
Aug 24, 2010
Applied Materials, Inc.
Matthew L. Miller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus to confine plasma and to enhance flow conductance
Patent number
7,674,353
Issue date
Mar 9, 2010
Applied Materials, Inc.
Kallol Bera
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus to confine plasma and to enhance flow conductance
Patent number
7,618,516
Issue date
Nov 17, 2009
Applied Materials, Inc.
Kallol Bera
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
VIBRATION DETERMINATION IN SUBSTRATE PROCESSING SYSTEMS
Publication number
20240393761
Publication date
Nov 28, 2024
Applied Materials, Inc.
Zhi Wang
G05 - CONTROLLING REGULATING
Information
Patent Application
INTEGRATED SUBSTRATE MEASUREMENT SYSTEM
Publication number
20240339347
Publication date
Oct 10, 2024
Applied Materials, Inc.
Patricia Schulze
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ON-THE-FLY MEASUREMENT OF SUBSTRATE STRUCTURES
Publication number
20240321649
Publication date
Sep 26, 2024
Applied Materials, Inc.
Amikam Sade
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS TO IMPROVE PRODUCTIVITY OF ADVANCED CVD W GAPFILL PROCESS
Publication number
20240222128
Publication date
Jul 4, 2024
Applied Materials, Inc.
Mingrui ZHAO
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
PROCESSING SYSTEM AND METHODS FOR FORMING VOID-FREE AND SEAM-FREE T...
Publication number
20240209500
Publication date
Jun 27, 2024
Applied Materials, Inc.
Xi CEN
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
METHODS AND SYSTEMS FOR A SPECTRAL LIBRARY AT A MANUFACTURING SYSTEM
Publication number
20240128100
Publication date
Apr 18, 2024
Applied Materials, Inc.
Hsinyi Tsai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ADJUSTABLE ACHROMATIC COLLIMATOR ASSEMBLY FOR ENDPOINT DETECTION SY...
Publication number
20230341699
Publication date
Oct 26, 2023
Applied Materials, Inc.
Pengyu Han
G02 - OPTICS
Information
Patent Application
INTEGRATED SUBSTRATE MEASUREMENT SYSTEM TO IMPROVE MANUFACTURING PR...
Publication number
20230326773
Publication date
Oct 12, 2023
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPATIAL OPTICAL EMISSION SPECTROSCOPY FOR ETCH UNIFORMITY
Publication number
20230258500
Publication date
Aug 17, 2023
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
Information
Patent Application
ESTIMATION OF CHAMBER COMPONENT CONDITIONS USING SUBSTRATE MEASUREM...
Publication number
20230236569
Publication date
Jul 27, 2023
Applied Materials, Inc.
Chunlei Zhang
G05 - CONTROLLING REGULATING
Information
Patent Application
CHAMBER COMPONENT CONDITION ESTIMATION USING SUBSTRATE MEASUREMENTS
Publication number
20230236583
Publication date
Jul 27, 2023
Applied Materials, Inc.
Chunlei Zhang
G05 - CONTROLLING REGULATING
Information
Patent Application
INTEGRATED SUBSTRATE MEASUREMENT SYSTEM
Publication number
20230238266
Publication date
Jul 27, 2023
Applied Materials, Inc.
Patricia Schulze
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE REFLECTOMETRY FOR MEASURING ETCH PARAMETERS
Publication number
20230168210
Publication date
Jun 1, 2023
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING SUBSTRATE PROFILE PROPERTIES USING MACHINE LEARNING
Publication number
20230062206
Publication date
Mar 2, 2023
Applied Materials, Inc.
Thomas Li
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MULTIPLE REFLECTOMETRY FOR MEASURING ETCH PARAMETERS
Publication number
20220349833
Publication date
Nov 3, 2022
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
Information
Patent Application
SPATIAL OPTICAL EMISSION SPECTROSCOPY FOR ETCH UNIFORMITY
Publication number
20220333989
Publication date
Oct 20, 2022
Applied Materials, Inc.
Blake Erickson
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR IN-SITU DEPOSITION MONITORING
Publication number
20220081758
Publication date
Mar 17, 2022
Applied Materials, Inc.
Xiaodong WANG
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
DETECTING AND CORRECTING SUBSTRATE PROCESS DRIFT USING MACHINE LEAR...
Publication number
20220066411
Publication date
Mar 3, 2022
Applied Materials, Inc.
Upendra V. Ummethala
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ADJUSTABLE ACHROMATIC COLLIMATOR ASSEMBLY FOR ENDPOINT DETECTION SY...
Publication number
20220050303
Publication date
Feb 17, 2022
Applied Materials, Inc.
Pengyu Han
G02 - OPTICS
Information
Patent Application
METHODS AND APPARATUS FOR BACKSIDE VIA REVEAL PROCESSING
Publication number
20220037216
Publication date
Feb 3, 2022
Applied Materials, Inc.
Prayudi LIANTO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETERMINING SUBSTRATE PROFILE PROPERTIES USING MACHINE LEARNING
Publication number
20220026817
Publication date
Jan 27, 2022
Applied Materials, Inc.
Upendra V. Ummethala
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SUBSTRATE MEASUREMENT SUBSYSTEM
Publication number
20220028716
Publication date
Jan 27, 2022
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED SUBSTRATE MEASUREMENT SYSTEM TO IMPROVE MANUFACTURING PR...
Publication number
20220028713
Publication date
Jan 27, 2022
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LOW TEMPERATURE THERMAL FLOW RATIO CONTROLLER
Publication number
20210088367
Publication date
Mar 25, 2021
Applied Materials, Inc.
Michael Kutney
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR PROCESSING A SUBSTRATE TO REMOVE MOISTURE...
Publication number
20190219330
Publication date
Jul 18, 2019
Applied Materials, Inc.
MICHAEL C. KUTNEY
F26 - DRYING
Information
Patent Application
COMPLEX SHOWERHEAD COATING APPARATUS WITH ELECTROSPRAY FOR LITHIUM...
Publication number
20160020454
Publication date
Jan 21, 2016
Applied Materials, Inc.
Fei C. WANG
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
VALVE WITH ADJUSTABLE HARD STOP
Publication number
20150345645
Publication date
Dec 3, 2015
MICHAEL C. KUTNEY
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
METHODS AND APPARATUS FOR PROCESSING A SUBSTRATE TO REMOVE MOISTURE...
Publication number
20150204606
Publication date
Jul 23, 2015
Applied Materials, Inc.
Michael C. Kutney
B08 - CLEANING
Information
Patent Application
LOWER LINER WITH INTEGRATED FLOW EQUALIZER AND IMPROVED CONDUCTANCE
Publication number
20120325406
Publication date
Dec 27, 2012
James D. Carducci
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LITHIUM ION CELL DESIGN APPARATUS AND METHOD
Publication number
20120219841
Publication date
Aug 30, 2012
Applied Materials, Inc.
Hooman Bolandi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...