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Minami SHOUJI

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  • Tokyo, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20240363306
    • Publication date Oct 31, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Minami SHOUJI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20230274909
    • Publication date Aug 31, 2023
    • Hitachi High-Tech Corporation
    • Minami SHOUJI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR INSPECTION DEVICE AND METHOD FOR INSPECTING SEMICONDU...
    • Publication number 20230273253
    • Publication date Aug 31, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yasuhiro SHIRASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20220216032
    • Publication date Jul 7, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Minami SHOUJI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20220139667
    • Publication date May 5, 2022
    • Hitachi High-Tech Corporation
    • Minami Shouji
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    DEVICE DEFECT DETECTION METHOD USING A CHARGED PARTICLE BEAM
    • Publication number 20220108866
    • Publication date Apr 7, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yasuhiro Shirasaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON BEAM DEVICE
    • Publication number 20220059317
    • Publication date Feb 24, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Minami SHOUJI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Microscope and Method of Imaging Sample
    • Publication number 20210233740
    • Publication date Jul 29, 2021
    • Hitachi High-Technologies Corporation
    • Minami SHOUJI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20210066028
    • Publication date Mar 4, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yasuhiro Shirasaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20210066029
    • Publication date Mar 4, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Minami Shouji
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20170330724
    • Publication date Nov 16, 2017
    • Hitachi High-Technologies Corporation
    • Taiga OKUMURA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SAMPLE HOLDER, OBSERVATION SYSTEM, AND IMAGE GENERATION METHOD
    • Publication number 20170069458
    • Publication date Mar 9, 2017
    • Hitachi High-Technologies Corporation
    • Minami SHOUJI
    • H01 - BASIC ELECTRIC ELEMENTS