Ming-Chi Fan

Person

Hsinchu County, TW

People

Patents Grantslast 30 patents

Information Patent Grant
SIMO based DC-DC converters for thermoelectric energy harvesting
- Patent number 10,476,388
- Issue date Nov 12, 2019
- Leadtrend Technology Corporation
- Po-Hung Chen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Multi-zone temperature control for semiconductor wafer
- Patent number 10,113,233
- Issue date Oct 30, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Lin Chang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
CMOS image sensor white pixel performance
- Patent number 9,196,651
- Issue date Nov 24, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Chi Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-zone temperature control for semiconductor wafer
- Patent number 9,023,664
- Issue date May 5, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Lin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS image sensor white pixel performance
- Patent number 8,692,302
- Issue date Apr 8, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Chi Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-zone temperature control for semiconductor wafer
- Patent number 8,404,572
- Issue date Mar 26, 2013
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Lin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Advanced process control with novel sampling policy
- Patent number 8,392,009
- Issue date Mar 5, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wang Jo Fei
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for tuning advanced process control parameters
- Patent number 8,229,588
- Issue date Jul 24, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for implementing a wafer acceptance test (“WAT”)...
- Patent number 8,108,060
- Issue date Jan 31, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system of monitoring E-beam overlay and providing advanc...
- Patent number 7,977,655
- Issue date Jul 12, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jo Fei Wang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Complementary metal-oxide-semiconductor device and fabricating meth...
- Patent number 7,402,496
- Issue date Jul 22, 2008
- United Microelectronics Corp.
- Che-Hung Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reticle position detection system
- Patent number 6,998,629
- Issue date Feb 14, 2006
- Taiwan Semiconductor Manufacturing Co. Ltd
- Ming-Yu Fan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT WITH STACKED TRANSISTORS HAVING INDUCTORS AT BOT...
- Publication number 20240290779
- Publication date Aug 29, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Xiang YOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY APPARATUS
- Publication number 20240219763
- Publication date Jul 4, 2024
- CORETRONIC CORPORATION
- Ming-Hsiung Fan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLAY APPARATUS
- Publication number 20240192538
- Publication date Jun 13, 2024
- CORETRONIC CORPORATION
- Chih-Hsuan Kuo
- G02 - OPTICS
Information Patent Application
ANTI-PEEP LIGHT SOURCE MODULE AND DISPLAY DEVICE
- Publication number 20240085614
- Publication date Mar 14, 2024
- CORETRONIC CORPORATION
- Yi-Cheng Lin
- G02 - OPTICS
Information Patent Application
ELECTRONIC CIRCUIT SIMULATION BASED ON RANDOM TELEGRAPH SIGNAL NOISE
- Publication number 20220357390
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Chien-Ming HUNG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER
- Publication number 20170022611
- Publication date Jan 26, 2017
- Taiwan Semiconductor Manufacturing Co., LTD
- Chun-Lin CHANG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SIMO based DC-DC converters for thermoelectric energy harvesting
- Publication number 20160218620
- Publication date Jul 28, 2016
- LEADTREND TECHNOLOGY CORPORATION
- Po-Hung Chen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER
- Publication number 20150211122
- Publication date Jul 30, 2015
- Taiwan Semiconductor Manufacturing Co., LTD
- Chun-Lin CHANG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CMOS Image Sensor White Pixel Performance
- Publication number 20140206127
- Publication date Jul 24, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Chi Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER
- Publication number 20130171746
- Publication date Jul 4, 2013
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Chun-Lin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF MONITORING E-BEAM OVERLAY AND PROVIDING ADVANC...
- Publication number 20100294955
- Publication date Nov 25, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jo Fei Wang
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR IMPLEMENTING A WAFER ACCEPTANCE TEST ("WAT")...
- Publication number 20100292824
- Publication date Nov 18, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Application
ADVANCED PROCESS CONTROL WITH NOVEL SAMPLING POLICY
- Publication number 20100249974
- Publication date Sep 30, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wang Jo Fei
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR TUNING ADVANCED PROCESS CONTROL PARAMETERS
- Publication number 20100228370
- Publication date Sep 9, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Application
MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER
- Publication number 20100210041
- Publication date Aug 19, 2010
- Taiwan Semiconductor Manufacturing Co., LTD
- Chun-Lin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING SILICON-GERMANIUM EPITAXIAL LAYER
- Publication number 20080293222
- Publication date Nov 27, 2008
- United Microelectronics Corp.
- Jih-Shun Chiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS Image Sensor White Pixel Performance
- Publication number 20080227249
- Publication date Sep 18, 2008
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Chi Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR DEVICE
- Publication number 20080116525
- Publication date May 22, 2008
- United Microelectronics Corp.
- Che-Hung Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING SILICON-GERMANIUM EPITAXIAL LAYER
- Publication number 20080076236
- Publication date Mar 27, 2008
- Jih-Shun Chiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR DEVICE AND FABRICATING METH...
- Publication number 20080061366
- Publication date Mar 13, 2008
- United Microelectronics Corp.
- Che-Hung Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reticle position detection system
- Publication number 20040164256
- Publication date Aug 26, 2004
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ming-Yu Fan
- G01 - MEASURING TESTING

Ming-Chi Fan

Person

Patents Grantslast 30 patents

SIMO based DC-DC converters for thermoelectric energy harvesting

Multi-zone temperature control for semiconductor wafer

CMOS image sensor white pixel performance

Multi-zone temperature control for semiconductor wafer

CMOS image sensor white pixel performance

Multi-zone temperature control for semiconductor wafer

Advanced process control with novel sampling policy

Method and system for tuning advanced process control parameters

System and method for implementing a wafer acceptance test (“WAT”)...

Method and system of monitoring E-beam overlay and providing advanc...

Complementary metal-oxide-semiconductor device and fabricating meth...

Reticle position detection system

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT WITH STACKED TRANSISTORS HAVING INDUCTORS AT BOT...

DISPLAY APPARATUS

DISPLAY APPARATUS

ANTI-PEEP LIGHT SOURCE MODULE AND DISPLAY DEVICE

ELECTRONIC CIRCUIT SIMULATION BASED ON RANDOM TELEGRAPH SIGNAL NOISE

MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER

SIMO based DC-DC converters for thermoelectric energy harvesting

MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER

CMOS Image Sensor White Pixel Performance

MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER

METHOD AND SYSTEM OF MONITORING E-BEAM OVERLAY AND PROVIDING ADVANC...

SYSTEM AND METHOD FOR IMPLEMENTING A WAFER ACCEPTANCE TEST ("WAT")...

ADVANCED PROCESS CONTROL WITH NOVEL SAMPLING POLICY

METHOD AND SYSTEM FOR TUNING ADVANCED PROCESS CONTROL PARAMETERS

MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER

METHOD FOR FORMING SILICON-GERMANIUM EPITAXIAL LAYER

CMOS Image Sensor White Pixel Performance

COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR DEVICE

METHOD FOR FORMING SILICON-GERMANIUM EPITAXIAL LAYER

COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR DEVICE AND FABRICATING METH...

Reticle position detection system