Mitsuru Konno

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 9,040,911
- Issue date May 26, 2015
- Hitachi High-Technologies Corporation
- Takeshi Ogashiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam system and a method of sample preparation and obse...
- Patent number 7,612,337
- Issue date Nov 3, 2009
- Hitachi High-Technologies Corporation
- Yuya Suzuki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Scanning Electron Microscope
- Publication number 20150108351
- Publication date Apr 23, 2015
- Hitachi High-Technologies Corporation
- Takeshi Ogashiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused ion beam system and a method of sample preparation and obse...
- Publication number 20070187597
- Publication date Aug 16, 2007
- Hitachi High-Technologies Corporation
- Yuya Suzuki
- H01 - BASIC ELECTRIC ELEMENTS