Munetoshi Nagasaka

Person

Nirasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe device
- Patent number 9,759,762
- Issue date Sep 12, 2017
- Tokyo Electron Limited
- Eiichi Shinohara
- G01 - MEASURING TESTING
Information Patent Grant
Probe device having cleaning mechanism for cleaning connection cond...
- Patent number 9,638,719
- Issue date May 2, 2017
- Tokyo Electron Limited
- Eiichi Shinohara
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus and wafer mounting table for probe apparatus
- Patent number 9,523,711
- Issue date Dec 20, 2016
- Tokyo Electron Limited
- Kazuya Yano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe apparatus
- Patent number 9,261,553
- Issue date Feb 16, 2016
- Tokyo Electron Limited
- Eiichi Shinohara
- G01 - MEASURING TESTING
Information Patent Grant
Substrate attracting device and substrate transfer apparatus
- Patent number 8,196,983
- Issue date Jun 12, 2012
- Tokyo Electron Limited
- Munetoshi Nagasaka
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Ceramic mounting for wafer apparatus with thermal expansion feature
- Patent number 8,082,977
- Issue date Dec 27, 2011
- Tokyo Electron Limited
- Yutaka Akaike
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Semiconductor wafer inspection apparatus
- Patent number D612879
- Issue date Mar 30, 2010
- Tokyo Electron Limited
- Munetoshi Nagasaka
- D15 - Machines not elsewhere specified
Information Patent Grant
Wafer attracting plate
- Patent number D609652
- Issue date Feb 9, 2010
- Tokyo Electron Limited
- Munetoshi Nagasaka
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Probe card transfer assist apparatus, and inspection equipment and...
- Patent number 7,541,801
- Issue date Jun 2, 2009
- Tokyo Electron Limited
- Munetoshi Nagasaka
- G01 - MEASURING TESTING
Information Patent Grant
Probe card transfer assist apparatus and inspection equipment using...
- Patent number 7,528,620
- Issue date May 5, 2009
- Tokyo Electron Limited
- Chiaki Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Wafer holding member
- Patent number D589912
- Issue date Apr 7, 2009
- Tokyo Electron Limited
- Ikuo Ogasawara
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Wafer holding member
- Patent number D589474
- Issue date Mar 31, 2009
- Tokyo Electron Limited
- Ikuo Ogasawara
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Wafer prober
- Patent number D383683
- Issue date Sep 16, 1997
- Tokyo Electron Limited
- Osamu Kamata
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Probe test apparatus
- Patent number 5,604,443
- Issue date Feb 18, 1997
- Tokyo Electron Limited
- Yoshisuke Kitamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE DEVICE
- Publication number 20160061882
- Publication date Mar 3, 2016
- TOKYO ELECTRON LIMITED
- Eiichi SHINOHARA
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE
- Publication number 20160054357
- Publication date Feb 25, 2016
- TOKYO ELECTRON LIMITED
- Eiichi SHINOHARA
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS AND WAFER MOUNTING TABLE FOR PROBE APPARATUS
- Publication number 20150145547
- Publication date May 28, 2015
- TOKYO ELECTRON LIMITED
- Kazuya Yano
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS
- Publication number 20150028907
- Publication date Jan 29, 2015
- TOKYO ELECTRON LIMITED
- Eiichi Shinohara
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE ATTRACTING DEVICE AND SUBSTRATE TRANSFER APPARATUS
- Publication number 20080267741
- Publication date Oct 30, 2008
- TOKYO ELECTRON LIMITED
- Munetoshi NAGASAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOUNTING APPARATUS
- Publication number 20070221363
- Publication date Sep 27, 2007
- TOKYO ELECTRON LIMITED
- Yutaka AKAIKE
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
PROBE CARD TRANSFER ASSIST APPARATUS AND INSPECTION EQUIPMENT USING...
- Publication number 20070126441
- Publication date Jun 7, 2007
- TOKYO ELECTRON LIMITED
- Chiaki Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
Probe card transfer assist apparatus, and inspection equipment and...
- Publication number 20070063720
- Publication date Mar 22, 2007
- TOKYO ELECTRON LIMITED
- Munetoshi Nagasaka
- G01 - MEASURING TESTING

Munetoshi Nagasaka

Person

Patents Grantslast 30 patents

Probe device

Probe device having cleaning mechanism for cleaning connection cond...

Probe apparatus and wafer mounting table for probe apparatus

Probe apparatus

Substrate attracting device and substrate transfer apparatus

Ceramic mounting for wafer apparatus with thermal expansion feature

Semiconductor wafer inspection apparatus

Wafer attracting plate

Probe card transfer assist apparatus, and inspection equipment and...

Probe card transfer assist apparatus and inspection equipment using...

Wafer holding member

Wafer holding member

Wafer prober

Probe test apparatus

Patents Applicationslast 30 patents

PROBE DEVICE

PROBE DEVICE

PROBE APPARATUS AND WAFER MOUNTING TABLE FOR PROBE APPARATUS

PROBE APPARATUS

SUBSTRATE ATTRACTING DEVICE AND SUBSTRATE TRANSFER APPARATUS

MOUNTING APPARATUS

PROBE CARD TRANSFER ASSIST APPARATUS AND INSPECTION EQUIPMENT USING...

Probe card transfer assist apparatus, and inspection equipment and...