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N. William Parker
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Charged particle optics with azimuthally-varying third-order aberra...
Patent number
8,242,457
Issue date
Aug 14, 2012
Multibeam Corporation
N. William Parker
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Wafer processing system with dual wafer robots capable of asynchron...
Patent number
8,137,048
Issue date
Mar 20, 2012
VSERV Technologies
Mahendran Chidambaram
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Flat panel display substrate testing system
Patent number
7,941,237
Issue date
May 10, 2011
Multibeam Corporation
N. William Parker
G01 - MEASURING TESTING
Information
Patent Grant
Variable-ratio double-deflection beam blanker
Patent number
7,928,404
Issue date
Apr 19, 2011
Multibeam Corporation
N. William Parker
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Optics for generation of high current density patterned charged par...
Patent number
7,786,454
Issue date
Aug 31, 2010
Tokyo Electron Limited
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optics for generation of high current density patterned charged par...
Patent number
7,462,848
Issue date
Dec 9, 2008
Multibeam Systems, Inc.
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detector optics for multiple electron beam test system
Patent number
7,456,402
Issue date
Nov 25, 2008
Multibeam Systems, Inc.
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for inspection and testing of flat panel displ...
Patent number
7,435,956
Issue date
Oct 14, 2008
Multibeam Systems, Inc.
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dual detector optics for simultaneous collection of secondary and b...
Patent number
7,227,142
Issue date
Jun 5, 2007
Multibeam Systems, Inc.
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detector optics for charged particle beam inspection system
Patent number
7,122,795
Issue date
Oct 17, 2006
Multibeam Systems, Inc.
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-beam multi-column electron beam inspection system
Patent number
6,977,375
Issue date
Dec 20, 2005
Multibeam Systems, Inc.
Edward M. Yin
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Multi-column charged particle optics assembly
Patent number
6,943,351
Issue date
Sep 13, 2005
Multibeam Systems, Inc.
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Platform positioning system
Patent number
6,872,958
Issue date
Mar 29, 2005
Multibeam Systems, Inc.
Gerry B. Andeen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-beam multi-column electron beam inspection system
Patent number
6,844,550
Issue date
Jan 18, 2005
Multibeam Systems, Inc.
Edward M. Yin
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Detector optics for electron beam inspection system
Patent number
6,777,675
Issue date
Aug 17, 2004
Multibeam
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Image processing system for multi-beam inspection
Patent number
6,738,506
Issue date
May 18, 2004
Multibeam Systems, Inc.
S. Daniel Miller
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-beam multi-column electron beam inspection system
Patent number
6,734,428
Issue date
May 11, 2004
Multibeam Systems, Inc.
N. William Parker
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Electron optics for multi-beam electron beam lithography tool
Patent number
6,617,587
Issue date
Sep 9, 2003
Multibeam Systems, Inc.
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Proximity effect correction method through uniform removal of fract...
Patent number
6,316,164
Issue date
Nov 13, 2001
N. William Parker
B82 - NANO-TECHNOLOGY
Information
Patent Grant
High density plasma deposition and etching apparatus
Patent number
5,429,070
Issue date
Jul 4, 1995
Plasma & Materials Technologies, Inc.
Gregor A. Campbell
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
High density plasma deposition and etching apparatus
Patent number
5,421,891
Issue date
Jun 6, 1995
Plasma & Materials Technologies, Inc.
Gregor A. Campbell
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Patents Applications
last 30 patents
Information
Patent Application
Charged Particle Optics with Azimuthally-Varying Third-Order Aberra...
Publication number
20140034845
Publication date
Feb 6, 2014
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VARIABLE-RATIO DOUBLE-DEFLECTION BEAM BLANKER
Publication number
20090206272
Publication date
Aug 20, 2009
N. William Parker
B82 - NANO-TECHNOLOGY
Information
Patent Application
OPTICS FOR GENERATION OF HIGH CURRENT DENSITY PATTERNED CHARGED PAR...
Publication number
20090057577
Publication date
Mar 5, 2009
TOKYO ELECTRON LIMITED
N. William Parker
B82 - NANO-TECHNOLOGY
Information
Patent Application
ELECTRON BEAM LITHOGRAPHY APPARATUS AND DESIGN METHOD OF PATTERNED...
Publication number
20090008579
Publication date
Jan 8, 2009
TOKYO ELECTRON LIMITED
Koji TAKEYA
B82 - NANO-TECHNOLOGY
Information
Patent Application
Flat Panel Display Substrate Testing System
Publication number
20080232939
Publication date
Sep 25, 2008
N. William Parker
G02 - OPTICS
Information
Patent Application
CHARGED PARTICLE OPTICS WITH AZIMUTHALLY-VARYING THIRD-ORDER ABERRA...
Publication number
20080224063
Publication date
Sep 18, 2008
N. William Parker
B82 - NANO-TECHNOLOGY
Information
Patent Application
WAFER PROCESSING SYSTEM WITH DUAL WAFER ROBOTS CAPABLE OF ASYNCHRON...
Publication number
20080152463
Publication date
Jun 26, 2008
Mahendran Chidambaram
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
Multiple loadlocks and processing chamber
Publication number
20060177288
Publication date
Aug 10, 2006
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detector optics for multiple electron beam test system
Publication number
20060169899
Publication date
Aug 3, 2006
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for inspection and testing of flat panel displ...
Publication number
20060145087
Publication date
Jul 6, 2006
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Optics for generation of high current density patterned charged par...
Publication number
20060145097
Publication date
Jul 6, 2006
N. William Parker
B82 - NANO-TECHNOLOGY
Information
Patent Application
Dual detector optics for simultaneous collection of secondary and b...
Publication number
20060054817
Publication date
Mar 16, 2006
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multi-column charged particle optics assembly
Publication number
20050001178
Publication date
Jan 6, 2005
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detector optics for charged particle beam inspection system
Publication number
20050001165
Publication date
Jan 6, 2005
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron optics for multi-beam electron beam lithography tool
Publication number
20040119021
Publication date
Jun 24, 2004
Ion Diagnostics
N. William Parker
B82 - NANO-TECHNOLOGY
Information
Patent Application
ELECTRON OPTICS FOR MULTI-BEAM ELECTRON BEAM LITHOGRAPHY TOOL
Publication number
20030085360
Publication date
May 8, 2003
Multibeam Systems, Inc.
N. William Parker
B82 - NANO-TECHNOLOGY
Information
Patent Application
Multi-beam multi-column electron beam inspection system
Publication number
20030066963
Publication date
Apr 10, 2003
N. William Parker
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
Image processing system for multi-beam inspection
Publication number
20020167487
Publication date
Nov 14, 2002
S. Daniel Miller
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Detector optics for electron beam inspection system
Publication number
20020153483
Publication date
Oct 24, 2002
N. William Parker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Platform positioning system
Publication number
20020127050
Publication date
Sep 12, 2002
Gerry B. Andeen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multi-beam multi-column electron beam inspection system
Publication number
20020015143
Publication date
Feb 7, 2002
Edward M. Yin
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING