Naohiko Fujino

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Surface analyzing apparatus
- Patent number 6,388,249
- Issue date May 14, 2002
- Seiko Instruments Inc.
- Shigeru Wakiyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for analyzing minute foreign substance, and pr...
- Patent number 6,355,495
- Issue date Mar 12, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Naohiko Fujino
- G01 - MEASURING TESTING
Information Patent Grant
Surface analyzing apparatus
- Patent number 6,259,093
- Issue date Jul 10, 2001
- Seiko Instruments Inc.
- Shigeru Wakiyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Analyzing method and apparatus for minute foreign substances, and m...
- Patent number 6,255,127
- Issue date Jul 3, 2001
- Seiko Instruments Inc.
- Naohiko Fujino
- G01 - MEASURING TESTING
Information Patent Grant
Surface analyzing apparatus with anti-vibration table
- Patent number 6,184,519
- Issue date Feb 6, 2001
- Seiko Instruments Inc.
- Shigeru Wakiyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for recovering impurities from a silicon wafer
- Patent number 6,182,675
- Issue date Feb 6, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Jiro Naka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing minute foreign substance elements
- Patent number 6,124,142
- Issue date Sep 26, 2000
- Seiko Instruments, Inc.
- Naohiko Fujino
- G01 - MEASURING TESTING
Information Patent Grant
Thin film forming apparatus using laser
- Patent number 6,110,291
- Issue date Aug 29, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Kenyu Haruta
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Particle detecting method and system for detecting minute particles...
- Patent number 5,907,398
- Issue date May 25, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Naohiko Fujino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzing method and apparatus for minute foreign substances, and m...
- Patent number 5,877,035
- Issue date Mar 2, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Naohiko Fujino
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting the position and the content of fine foreign ma...
- Patent number 5,715,052
- Issue date Feb 3, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Naohiko Fujino
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanning system utilizing an atomic force microscope and an...
- Patent number 5,650,614
- Issue date Jul 22, 1997
- Mitsubishi Electric Corporation
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor cleaning apparatus and wafer cassette
- Patent number 5,590,672
- Issue date Jan 7, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Masashi Ohmori
- B08 - CLEANING
Information Patent Grant
Semiconductor cleaning apparatus and wafer cassette
- Patent number 5,568,821
- Issue date Oct 29, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Masashi Ohmori
- B08 - CLEANING
Information Patent Grant
Semiconductor cleaning apparatus and wafer cassette
- Patent number 5,551,459
- Issue date Sep 3, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Masashi Ohmori
- B08 - CLEANING
Information Patent Grant
Method for detecting and examining slightly irregular surface state...
- Patent number 5,517,027
- Issue date May 14, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitsugu Nakagawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor cleaning apparatus and wafer cassette
- Patent number 5,445,171
- Issue date Aug 29, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Masashi Ohmori
- B08 - CLEANING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF AND DEVICE FOR CLEANING SILICON WAFER, CLEANED SILICON WA...
- Publication number 20020026952
- Publication date Mar 7, 2002
- NAOHIKO FUJINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface analyzing apparatus
- Publication number 20010048076
- Publication date Dec 6, 2001
- Seiko Instruments Inc.
- Shigeru Wakiyama
- B82 - NANO-TECHNOLOGY

Naohiko Fujino

Person

Patents Grantslast 30 patents

Surface analyzing apparatus

Method and apparatus for analyzing minute foreign substance, and pr...

Surface analyzing apparatus

Analyzing method and apparatus for minute foreign substances, and m...

Surface analyzing apparatus with anti-vibration table

Apparatus for recovering impurities from a silicon wafer

Method for analyzing minute foreign substance elements

Thin film forming apparatus using laser

Particle detecting method and system for detecting minute particles...

Analyzing method and apparatus for minute foreign substances, and m...

Method of detecting the position and the content of fine foreign ma...

Optical scanning system utilizing an atomic force microscope and an...

Semiconductor cleaning apparatus and wafer cassette

Semiconductor cleaning apparatus and wafer cassette

Semiconductor cleaning apparatus and wafer cassette

Method for detecting and examining slightly irregular surface state...

Semiconductor cleaning apparatus and wafer cassette

Patents Applicationslast 30 patents

METHOD OF AND DEVICE FOR CLEANING SILICON WAFER, CLEANED SILICON WA...

Surface analyzing apparatus