TREA

Naoyoshi Watanabe

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Patents Grantslast 30 patents

  • Information Patent Grant

    Test apparatus
    • Patent number 12,241,926
    • Issue date Mar 4, 2025
    • Advantest Corporation
    • Naoyoshi Watanabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test apparatus
    • Patent number 11,828,798
    • Issue date Nov 28, 2023
    • Advantest Corporation
    • Naoyoshi Watanabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test apparatus and test method
    • Patent number 8,880,375
    • Issue date Nov 4, 2014
    • Advantest Corporation
    • Kuniyuki Kaneko
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    Testing device, testing method, computer program product, and recor...
    • Patent number 7,730,371
    • Issue date Jun 1, 2010
    • Advantest Corporation
    • Tasuku Fujibe
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    Semiconductor device tester
    • Patent number 6,903,566
    • Issue date Jun 7, 2005
    • Advantest Corporation
    • Satoshi Sudou
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Waveform generating device
    • Patent number 6,574,579
    • Issue date Jun 3, 2003
    • Advantest Corporation
    • Naoyoshi Watanabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Timing signal generating apparatus and method
    • Patent number 6,226,230
    • Issue date May 1, 2001
    • Advantest Corporation
    • Naoyoshi Watanabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Variable delay circuit
    • Patent number 5,764,093
    • Issue date Jun 9, 1998
    • Advantest Corporation
    • Yokichi Hayashi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Variable delay circuit
    • Patent number 5,495,197
    • Issue date Feb 27, 1996
    • Advantest Corporation
    • Yokichi Hayashi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Variable delay circuit
    • Patent number 5,440,260
    • Issue date Aug 8, 1995
    • Advantest Corporation
    • Yokichi Hayashi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Device for generating strobe pulses with a desired timing
    • Patent number 4,998,025
    • Issue date Mar 5, 1991
    • Advantest Corporation
    • Naoyoshi Watanabe
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    TEST APPARATUS
    • Publication number 20220050136
    • Publication date Feb 17, 2022
    • Advantest Corporation
    • Naoyoshi WATANABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST APPARATUS
    • Publication number 20220050138
    • Publication date Feb 17, 2022
    • Advantest Corporation
    • Naoyoshi WATANABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20110196640
    • Publication date Aug 11, 2011
    • Advantest Corporation
    • Kuniyuki KANEKO
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    TESTING DEVICE, TESTING METHOD, COMPUTER PROGRAM PRODUCT, AND RECOR...
    • Publication number 20090077435
    • Publication date Mar 19, 2009
    • Advantest Corporation
    • TASUKU FUJIBE
    • G11 - INFORMATION STORAGE