Natsuki Tsuno

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Adjusting method of charged particle beam device and charged partic...
- Patent number 12,001,521
- Issue date Jun 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Heita Kimizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 11,869,745
- Issue date Jan 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for deriving electrical characteristics and non-transitory c...
- Patent number 11,776,103
- Issue date Oct 3, 2023
- HITACHI HIGH-TECH CORPORATION
- Heita Kimizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,749,494
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for deriving electrical characteristics and non-transitory c...
- Patent number 11,694,325
- Issue date Jul 4, 2023
- HITACHI HIGH-TECH CORPORATION
- Heita Kimizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,646,172
- Issue date May 9, 2023
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device defect detection method using a charged particle beam
- Patent number 11,631,568
- Issue date Apr 18, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,610,754
- Issue date Mar 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,398,367
- Issue date Jul 26, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,398,366
- Issue date Jul 26, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 11,393,657
- Issue date Jul 19, 2022
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,355,308
- Issue date Jun 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,335,535
- Issue date May 17, 2022
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,328,897
- Issue date May 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining irradiation conditions for charged particle...
- Patent number 11,232,929
- Issue date Jan 25, 2022
- HITACHI HIGH-TECH CORPORATION
- Heita Kimizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample observation method using...
- Patent number 11,183,362
- Issue date Nov 23, 2021
- HITACHI HIGH-TECH CORPORATION
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and charged particle beam inspectio...
- Patent number 11,043,359
- Issue date Jun 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring apparatus and method of setting observation condition
- Patent number 11,043,358
- Issue date Jun 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryoko Araki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and sample observation method using sc...
- Patent number 11,011,348
- Issue date May 18, 2021
- HITACHI HIGH-TECH CORPORATION
- Daisuke Bizen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,971,347
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Mitsuhiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device with distance setting between irradiat...
- Patent number 10,879,037
- Issue date Dec 29, 2020
- HITACHI HIGH-TECH CORPORATION
- Natsuki Tsuno
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle bean device and information-processing device
- Patent number 10,453,648
- Issue date Oct 22, 2019
- Hitachi High-Technologies Corporation
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,256,068
- Issue date Apr 9, 2019
- Hitachi, Ltd.
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,121,632
- Issue date Nov 6, 2018
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and charged particle beam measurement...
- Patent number 10,121,634
- Issue date Nov 6, 2018
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection device including a counter electrode with...
- Patent number 9,846,133
- Issue date Dec 19, 2017
- Hitachi, Ltd.
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and inspection method using the same
- Patent number 9,659,744
- Issue date May 23, 2017
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection method, semiconductor inspection device an...
- Patent number 9,508,611
- Issue date Nov 29, 2016
- Hitachi, Ltd.
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic microscope, setting method of observation condition of e...
- Patent number 9,236,220
- Issue date Jan 12, 2016
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation specimen for use in electron microscopy, electron micro...
- Patent number 9,202,668
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240363306
- Publication date Oct 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20240177964
- Publication date May 30, 2024
- Hitachi High-Tech Corporation
- Heita KIMIZUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240151665
- Publication date May 9, 2024
- Hitachi High-Tech Corporation
- Yohei NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Inspection System
- Publication number 20240029994
- Publication date Jan 25, 2024
- Hitachi High-Tech Corporation
- Natsuki TSUNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for Deriving Electrical Characteristics and Non-Transitory C...
- Publication number 20240020816
- Publication date Jan 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20230377837
- Publication date Nov 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Yohei NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20230369012
- Publication date Nov 16, 2023
- Hitachi High-Tech Corporation
- Naoko TAKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection Method
- Publication number 20230273254
- Publication date Aug 31, 2023
- Hitachi High-Tech Corporation
- Shota MITSUGI
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20230274909
- Publication date Aug 31, 2023
- Hitachi High-Tech Corporation
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for Deriving Electrical Characteristics and Non-Transitory C...
- Publication number 20230274417
- Publication date Aug 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE AND METHOD FOR INSPECTING SEMICONDU...
- Publication number 20230273253
- Publication date Aug 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro SHIRASAKI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20230253180
- Publication date Aug 10, 2023
- HITACHI HIGH-TECH CORPORATION
- Daisuke BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220216032
- Publication date Jul 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220139667
- Publication date May 5, 2022
- Hitachi High-Tech Corporation
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE DEFECT DETECTION METHOD USING A CHARGED PARTICLE BEAM
- Publication number 20220108866
- Publication date Apr 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220102108
- Publication date Mar 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220102109
- Publication date Mar 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM DEVICE
- Publication number 20220059317
- Publication date Feb 24, 2022
- HITACHI HIGH-TECH CORPORATION
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220013326
- Publication date Jan 13, 2022
- Hitachi High-Tech Corporation
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adjusting Method of Charged Particle Beam Device and Charged Partic...
- Publication number 20210327048
- Publication date Oct 21, 2021
- Hitachi High-Tech Corporation
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Microscope and Method of Imaging Sample
- Publication number 20210233740
- Publication date Jul 29, 2021
- Hitachi High-Technologies Corporation
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20210066028
- Publication date Mar 4, 2021
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20210066029
- Publication date Mar 4, 2021
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043412
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM INSPECTIO...
- Publication number 20210043419
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for Deriving Electrical Characteristics and Non-Transitory C...
- Publication number 20210042900
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043413
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043415
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- G01 - MEASURING TESTING
Information Patent Application
System for Deriving Electrical Characteristics and Non-Transitory C...
- Publication number 20210027455
- Publication date Jan 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Determining Irradiation Conditions for Charged Particle...
- Publication number 20210027981
- Publication date Jan 28, 2021
- Hitachi High-Tech Corporation
- Heita KIMIZUKA
- H01 - BASIC ELECTRIC ELEMENTS

Natsuki Tsuno

Person

Patents Grantslast 30 patents

Adjusting method of charged particle beam device and charged partic...

Charged particle beam device

System for deriving electrical characteristics and non-transitory c...

Charged particle beam apparatus

System for deriving electrical characteristics and non-transitory c...

Charged particle beam apparatus

Device defect detection method using a charged particle beam

Charged particle beam device

Charged particle beam apparatus

Charged particle beam apparatus

Electron beam device

Charged particle beam device

Charged particle beam apparatus

Charged particle beam device

Method for determining irradiation conditions for charged particle...

Charged particle beam apparatus and sample observation method using...

Charged particle beam apparatus and charged particle beam inspectio...

Measuring apparatus and method of setting observation condition

Scanning electron microscope and sample observation method using sc...

Charged particle beam apparatus

Charged particle beam device with distance setting between irradiat...

Charged particle bean device and information-processing device

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam device and charged particle beam measurement...

Semiconductor inspection device including a counter electrode with...

Charged particle beam apparatus and inspection method using the same

Semiconductor inspection method, semiconductor inspection device an...

Electronic microscope, setting method of observation condition of e...

Observation specimen for use in electron microscopy, electron micro...

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam System

INSPECTION SYSTEM

Inspection System

System for Deriving Electrical Characteristics and Non-Transitory C...

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Beam Apparatus

Inspection Method

Charged Particle Beam Device

System for Deriving Electrical Characteristics and Non-Transitory C...

SEMICONDUCTOR INSPECTION DEVICE AND METHOD FOR INSPECTING SEMICONDU...

CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

DEVICE DEFECT DETECTION METHOD USING A CHARGED PARTICLE BEAM

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

ELECTRON BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

Adjusting Method of Charged Particle Beam Device and Charged Partic...

Charged Particle Microscope and Method of Imaging Sample

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM INSPECTIO...

System for Deriving Electrical Characteristics and Non-Transitory C...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

System for Deriving Electrical Characteristics and Non-Transitory C...

Method for Determining Irradiation Conditions for Charged Particle...