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Nissim Savareigo
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Ashdol, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Reduction of false alarms in PCB inspection
Patent number
7,177,458
Issue date
Feb 13, 2007
Orbotech Ltd.
Nissim Savareigo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electrical circuit conductor inspection
Patent number
7,006,212
Issue date
Feb 28, 2006
Orbotech Ltd.
Nissim Savareigo
G01 - MEASURING TESTING
Information
Patent Grant
Electrical circuit conductor inspection
Patent number
6,870,611
Issue date
Mar 22, 2005
Orbotech Ltd.
Nissim Savareigo
G01 - MEASURING TESTING
Information
Patent Grant
Post etch inspection system
Patent number
6,656,374
Issue date
Dec 2, 2003
Orbotech Ltd.
Nissim Savareigo
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection of laser vias
Patent number
6,621,572
Issue date
Sep 16, 2003
Orbotech Ltd.
Nissim Savareigo
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection of laser vias
Patent number
6,556,293
Issue date
Apr 29, 2003
Orbotech Ltd.
Nissim Savareigo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
REDUCTION OF FALSE ALARMS IN PCB INSPECTION
Publication number
20070165939
Publication date
Jul 19, 2007
ORBOTECH LTD.
Nissim Savareigo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electrical circuit conductor inspection
Publication number
20050134842
Publication date
Jun 23, 2005
Orbotech, Ltd.
Nissim Savareigo
G01 - MEASURING TESTING
Information
Patent Application
Optical inspection of laser vias
Publication number
20030025907
Publication date
Feb 6, 2003
ORBOTECH LTD.
Nissim Savareigo
G01 - MEASURING TESTING
Information
Patent Application
Electrical circuit conductor inspection
Publication number
20030020905
Publication date
Jan 30, 2003
ORBOTECH LTD.
Nissim Savareigo
G01 - MEASURING TESTING
Information
Patent Application
Method for detecting line width defects in electrical circuit inspe...
Publication number
20020038510
Publication date
Apr 4, 2002
Orbotech, Ltd.
Nissim Savareigo
G01 - MEASURING TESTING
Information
Patent Application
Electrical circuit conductor inspection
Publication number
20020039182
Publication date
Apr 4, 2002
Orbotech, Ltd.
Nissim Savareigo
G01 - MEASURING TESTING
Information
Patent Application
Post etch inspection system
Publication number
20010035267
Publication date
Nov 1, 2001
ORBOTECH LTD.
Nissim Savareigo
G01 - MEASURING TESTING
Information
Patent Application
Optical inspection of laser vias
Publication number
20010028454
Publication date
Oct 11, 2001
ORBOTECH LTD.
Nissim Savareigo
G01 - MEASURING TESTING