Nobuhito KUGE

Person

Mie-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer and method of manufacturing semiconductor appar...
- Patent number 12,131,966
- Issue date Oct 29, 2024
- Kabushiki Kaisha Toshiba
- Fuyuma Ito
- C30 - CRYSTAL GROWTH
Information Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
- Patent number 11,703,465
- Issue date Jul 18, 2023
- Kioxia Corporation
- Nobuhito Kuge
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor storage device and manufacturing method thereof
- Patent number 10,355,006
- Issue date Jul 16, 2019
- TOSHIBA MEMORY CORPORATION
- Ryota Fujitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method for manufacturing same
- Patent number 10,026,743
- Issue date Jul 17, 2018
- TOSHIBA MEMORY CORPORATION
- Nobuhito Kuge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of semiconductor memory device
- Patent number 9,269,718
- Issue date Feb 23, 2016
- Kabushiki Kaisha Toshiba
- Nobuhito Kuge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method for manufacturing the same
- Patent number 9,076,685
- Issue date Jul 7, 2015
- Kabushiki Kaisha Toshiba
- Nobuhito Kuge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device and method for manufacturin...
- Patent number 9,070,746
- Issue date Jun 30, 2015
- Kabushiki Kaisha Toshiba
- Nobuhito Kuge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 8,766,446
- Issue date Jul 1, 2014
- Kabushiki Kaisha Toshiba
- Nobuhito Kuge
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICE AND METHOD FOR INSPEC...
- Publication number 20220065802
- Publication date Mar 3, 2022
- KIOXIA Corporation
- Nobuhito KUGE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER AND METHOD OF MANUFACTURING SEMICONDUCTOR APPAR...
- Publication number 20210407867
- Publication date Dec 30, 2021
- Kabushiki Kaisha Toshiba
- Fuyuma ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20200066748
- Publication date Feb 27, 2020
- Toshiba Memory Corporation
- Daisuke MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20180269226
- Publication date Sep 20, 2018
- Toshiba Memory Corporation
- Takeshi Sonehara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20180047741
- Publication date Feb 15, 2018
- Toshiba Memory Corporation
- Nobuhito KUGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20170069534
- Publication date Mar 9, 2017
- KABUSHIKI KAISHA TOSHIBA
- Ryota FUJITSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR MEMORY DEVICE
- Publication number 20160071857
- Publication date Mar 10, 2016
- KABUSHIKI KAISHA TOSHIBA
- Nobuhito KUGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160043196
- Publication date Feb 11, 2016
- Kabushiki Kaisha Toshiba
- Takeshi MURATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURIN...
- Publication number 20150028409
- Publication date Jan 29, 2015
- Kabushiki Kaisha Toshiba
- Nobuhito KUGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20140346585
- Publication date Nov 27, 2014
- KABUSHIKI KAISHA TOSHIBA
- Nobuhito KUGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20130228928
- Publication date Sep 5, 2013
- Kabushiki Kaisha Toshiba
- Nobuhito KUGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
- Publication number 20120241836
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Nobuhito KUGE
- H01 - BASIC ELECTRIC ELEMENTS

Nobuhito KUGE

Person

Patents Grantslast 30 patents

Semiconductor wafer and method of manufacturing semiconductor appar...

Apparatus for inspecting semiconductor device and method for inspec...

Semiconductor storage device and manufacturing method thereof

Semiconductor memory device and method for manufacturing same

Manufacturing method of semiconductor memory device

Semiconductor memory device and method for manufacturing the same

Nonvolatile semiconductor memory device and method for manufacturin...

Semiconductor memory device

Patents Applicationslast 30 patents

APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICE AND METHOD FOR INSPEC...

SEMICONDUCTOR WAFER AND METHOD OF MANUFACTURING SEMICONDUCTOR APPAR...

SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME

SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURING METHOD THEREOF

MANUFACTURING METHOD OF SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR DEVICE

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURIN...

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME